{"id":"https://openalex.org/W2005370703","doi":"https://doi.org/10.1109/asicon.2011.6157226","title":"A sample-and-hold circuit for 10-bit 100MS/s pipelined ADC","display_name":"A sample-and-hold circuit for 10-bit 100MS/s pipelined ADC","publication_year":2011,"publication_date":"2011-10-01","ids":{"openalex":"https://openalex.org/W2005370703","doi":"https://doi.org/10.1109/asicon.2011.6157226","mag":"2005370703"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2011.6157226","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157226","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009805226","display_name":"Haitao Wang","orcid":"https://orcid.org/0000-0003-2017-7893"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haitao Wang","raw_affiliation_strings":["Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou, China","Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, 310037, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, 310037, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100956890","display_name":"Hui Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Hong","raw_affiliation_strings":["Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou, China","Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, 310037, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, 310037, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043933067","display_name":"Lingling Sun","orcid":"https://orcid.org/0000-0001-7033-1698"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lingling Sun","raw_affiliation_strings":["Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou, China","Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, 310037, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, 310037, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100433433","display_name":"Zhiping Yu","orcid":"https://orcid.org/0000-0001-8701-8438"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiping Yu","raw_affiliation_strings":["Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou, China","Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, 310037, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, 310037, China","institution_ids":["https://openalex.org/I50760025"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5009805226"],"corresponding_institution_ids":["https://openalex.org/I50760025"],"apc_list":null,"apc_paid":null,"fwci":0.6295,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.69166407,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"480","last_page":"483"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.8506348133087158},{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.8091789484024048},{"id":"https://openalex.org/keywords/sample-and-hold","display_name":"Sample and hold","score":0.7287181615829468},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.6558177471160889},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5501145720481873},{"id":"https://openalex.org/keywords/integral-nonlinearity","display_name":"Integral nonlinearity","score":0.5338730812072754},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5327833890914917},{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.516414225101471},{"id":"https://openalex.org/keywords/cascode","display_name":"Cascode","score":0.5153831243515015},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.505699872970581},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5022408962249756},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.4560331106185913},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.43370482325553894},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.413127064704895},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40897136926651},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.3138028383255005},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.21725836396217346},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21056905388832092},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17785590887069702},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.16747182607650757},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.15889927744865417}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.8506348133087158},{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.8091789484024048},{"id":"https://openalex.org/C206565188","wikidata":"https://www.wikidata.org/wiki/Q836482","display_name":"Sample and hold","level":3,"score":0.7287181615829468},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.6558177471160889},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5501145720481873},{"id":"https://openalex.org/C130829357","wikidata":"https://www.wikidata.org/wiki/Q1665386","display_name":"Integral nonlinearity","level":4,"score":0.5338730812072754},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5327833890914917},{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.516414225101471},{"id":"https://openalex.org/C2775946640","wikidata":"https://www.wikidata.org/wiki/Q1735017","display_name":"Cascode","level":4,"score":0.5153831243515015},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.505699872970581},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5022408962249756},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.4560331106185913},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.43370482325553894},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.413127064704895},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40897136926651},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.3138028383255005},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.21725836396217346},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21056905388832092},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17785590887069702},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.16747182607650757},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.15889927744865417}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2011.6157226","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157226","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7300000190734863,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1528893569","https://openalex.org/W1536704551","https://openalex.org/W1549316948","https://openalex.org/W1566916904","https://openalex.org/W2058420246","https://openalex.org/W2095847485","https://openalex.org/W2099432139","https://openalex.org/W2134404631","https://openalex.org/W2158925492","https://openalex.org/W2601348765","https://openalex.org/W2788418273","https://openalex.org/W6632158718","https://openalex.org/W6674540953","https://openalex.org/W6683348322"],"related_works":["https://openalex.org/W2021405064","https://openalex.org/W2135048255","https://openalex.org/W2035972461","https://openalex.org/W2240623354","https://openalex.org/W2004162305","https://openalex.org/W2207354743","https://openalex.org/W2904640696","https://openalex.org/W2490203154","https://openalex.org/W2025217054","https://openalex.org/W2221147977"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"a":[3,102],"fully":[4],"differential":[5,29],"sample-and-hold":[6],"(S/H)":[7],"circuit":[8,19,62,77],"for":[9,101],"the":[10,56,75,93],"pipelined":[11,105],"analog-to-digital":[12],"converter":[13],"(ADC)":[14],"was":[15,63],"presented.":[16],"The":[17,59],"S/H":[18,25,61,76],"is":[20,99],"based":[21],"on":[22],"capacitor":[23],"flip-around":[24],"architecture":[26],"with":[27],"gain-boosted":[28],"folded":[30],"cascode":[31],"operational":[32],"transconductance":[33],"amplifier":[34],"(OTA),":[35],"which":[36,98],"can":[37],"achieve":[38],"high":[39],"DC":[40],"gain":[41],"and":[42,47,88],"large":[43],"bandwidth.":[44],"Bootstrapped":[45],"switch":[46],"bottom":[48],"plate":[49],"sampling":[50],"techniques":[51],"are":[52],"used":[53],"to":[54],"reduce":[55],"nonlinear":[57],"distortion.":[58],"entire":[60],"designed":[64],"in":[65],"CSMC":[66],"1.8V/3.3V":[67],"0.18\u03bcm":[68],"1P6M":[69],"CMOS":[70],"technology.":[71],"Simulation":[72],"results":[73],"show":[74],"achieves":[78],"SNDR":[79],"of":[80,83,86,90],"84dB,":[81],"ENOB":[82],"13.7,":[84],"THD":[85],"-85dB,":[87],"SFDR":[89],"85.4dB":[91],"at":[92],"input":[94],"frequency":[95],"9.86328125M":[96],"Hz,":[97],"suitable":[100],"10bit":[103],"100MS/s":[104],"ADC.":[106]},"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}