{"id":"https://openalex.org/W2802418410","doi":"https://doi.org/10.1109/asianhost.2017.8353991","title":"The impact of discharge inversion effect on learning SRAM power-up statistics","display_name":"The impact of discharge inversion effect on learning SRAM power-up statistics","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2802418410","doi":"https://doi.org/10.1109/asianhost.2017.8353991","mag":"2802418410"},"language":"en","primary_location":{"id":"doi:10.1109/asianhost.2017.8353991","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asianhost.2017.8353991","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 Asian Hardware Oriented Security and Trust Symposium (AsianHOST)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012464997","display_name":"Zhonghao Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Zhonghao Liao","raw_affiliation_strings":["\u201cIowa State University, Ames, Iowa","\"Iowa State University, Ames, Iowa"],"affiliations":[{"raw_affiliation_string":"\u201cIowa State University, Ames, Iowa","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"\"Iowa State University, Ames, Iowa","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018956193","display_name":"George T. Amariucai","orcid":"https://orcid.org/0000-0003-4471-6425"},"institutions":[{"id":"https://openalex.org/I189590672","display_name":"Kansas State University","ror":"https://ror.org/05p1j8758","country_code":"US","type":"education","lineage":["https://openalex.org/I189590672"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"George T. Amariucai","raw_affiliation_strings":["Kansas State University Manhattan, Kansas"],"affiliations":[{"raw_affiliation_string":"Kansas State University Manhattan, Kansas","institution_ids":["https://openalex.org/I189590672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087194784","display_name":"Raymond K. W. Wong","orcid":"https://orcid.org/0000-0001-9342-3755"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Raymond K. W. Wong","raw_affiliation_strings":["\u201cIowa State University, Ames, Iowa","\"Iowa State University, Ames, Iowa"],"affiliations":[{"raw_affiliation_string":"\u201cIowa State University, Ames, Iowa","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"\"Iowa State University, Ames, Iowa","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100719924","display_name":"Yong Guan","orcid":"https://orcid.org/0000-0003-0445-1848"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yong Guan","raw_affiliation_strings":["\u201cIowa State University, Ames, Iowa","\"Iowa State University, Ames, Iowa"],"affiliations":[{"raw_affiliation_string":"\u201cIowa State University, Ames, Iowa","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"\"Iowa State University, Ames, Iowa","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5012464997"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":0.4506,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.6522205,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"7","issue":null,"first_page":"31","last_page":"36"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9501405954360962},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6012780666351318},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.5825209617614746},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4723464250564575},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.4347204864025116},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39040231704711914},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.337640643119812},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32888656854629517},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.27803146839141846},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.2577205300331116},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13500571250915527}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9501405954360962},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6012780666351318},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.5825209617614746},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4723464250564575},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.4347204864025116},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39040231704711914},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.337640643119812},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32888656854629517},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.27803146839141846},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.2577205300331116},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13500571250915527}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asianhost.2017.8353991","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asianhost.2017.8353991","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 Asian Hardware Oriented Security and Trust Symposium (AsianHOST)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W42545666","https://openalex.org/W115326044","https://openalex.org/W161240679","https://openalex.org/W609951012","https://openalex.org/W1517403092","https://openalex.org/W1608762865","https://openalex.org/W1995871244","https://openalex.org/W2000171858","https://openalex.org/W2017827600","https://openalex.org/W2022461859","https://openalex.org/W2113322447","https://openalex.org/W2130351941","https://openalex.org/W2151759197","https://openalex.org/W2163294786","https://openalex.org/W2253780829","https://openalex.org/W2570008916","https://openalex.org/W6636146224","https://openalex.org/W6679357471"],"related_works":["https://openalex.org/W2775062502","https://openalex.org/W2302863414","https://openalex.org/W2089002058","https://openalex.org/W1909296377","https://openalex.org/W3185029353","https://openalex.org/W3116379964","https://openalex.org/W2766443086","https://openalex.org/W2915176329","https://openalex.org/W2793465010","https://openalex.org/W2967161359"],"abstract_inverted_index":{"The":[0,24,71],"authentication":[1,41],"and":[2,8,40,50,63,66,118,125,135,153,169],"verification":[3],"of":[4,15,17,27,73,78,86,100,106,122,137],"devices":[5],"require":[6],"lightweight":[7],"cost-effective":[9],"solutions":[10],"such":[11,43],"as":[12,44,129],"the":[13,18,22,83,98,104,142],"use":[14,170],"fingerprints":[16],"components":[19],"contained":[20],"in":[21,93],"device.":[23],"power-up":[25,84,120,160],"state":[26,85,121],"Static":[28],"Random":[29,51],"Access":[30],"Memory":[31],"(SRAMs)":[32],"has":[33],"a":[34,58,116,130],"significant":[35],"effect":[36],"on":[37,75],"some":[38],"security":[39],"applications,":[42],"SRAM":[45,79,87,123,148,159],"Physical":[46],"Unclonable":[47],"Function":[48],"(PUFs)":[49],"Number":[52],"Generation":[53],"(RNG).":[54],"In":[55],"this":[56,113],"paper,":[57],"detailed":[59],"data":[60,133,167],"collection":[61,168],"scheme":[62],"corresponding":[64],"statistical":[65],"physical":[67],"analysis":[68,136],"are":[69,171],"presented.":[70],"results":[72],"tests":[74],"different":[76,151],"models":[77],"chips":[80,124,149],"show":[81],"that":[82],"need":[88],"to":[89,95,108],"be":[90,127],"carefully":[91],"collected":[92],"order":[94],"avoid":[96],"increasing":[97],"volume":[99],"enrollment":[101],"data.":[102],"Otherwise,":[103],"probability":[105],"failure":[107],"verify":[109],"will":[110],"increase.":[111],"Furthermore,":[112],"method":[114],"provides":[115],"stable":[117],"reliable":[119],"can":[126],"used":[128],"guidance":[131],"for":[132,147,165],"acquisition":[134],"similar":[138],"applications.":[139],"We":[140],"illustrate":[141],"Discharge":[143],"Inversion":[144],"Effect":[145],"(DIE)":[146],"from":[150],"manufacturers,":[152],"demonstrate":[154],"how":[155],"it":[156],"may":[157],"impact":[158],"applications":[161],"unless":[162],"our":[163],"guidelines":[164],"proper":[166],"followed.":[172]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}