{"id":"https://openalex.org/W2031752673","doi":"https://doi.org/10.1109/ascc.2013.6606319","title":"A sub-principal component of fault detection (PCFD) modeling method and its application to online fault diagnosis","display_name":"A sub-principal component of fault detection (PCFD) modeling method and its application to online fault diagnosis","publication_year":2013,"publication_date":"2013-06-01","ids":{"openalex":"https://openalex.org/W2031752673","doi":"https://doi.org/10.1109/ascc.2013.6606319","mag":"2031752673"},"language":"en","primary_location":{"id":"doi:10.1109/ascc.2013.6606319","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ascc.2013.6606319","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 9th Asian Control Conference (ASCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038929132","display_name":"Chunhui Zhao","orcid":"https://orcid.org/0000-0002-0254-5763"},"institutions":[{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunhui Zhao","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","Department of Control Science & Engineering, Zhejiang University, Hangzhou, CHINA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4391767838"]},{"raw_affiliation_string":"Department of Control Science & Engineering, Zhejiang University, Hangzhou, CHINA","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027023288","display_name":"Wenqing Li","orcid":"https://orcid.org/0000-0001-5612-9899"},"institutions":[{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenqing Li","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","Department of Control Science & Engineering, Zhejiang University, Hangzhou, CHINA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4391767838"]},{"raw_affiliation_string":"Department of Control Science & Engineering, Zhejiang University, Hangzhou, CHINA","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100677869","display_name":"Youxian Sun","orcid":"https://orcid.org/0000-0002-1176-1142"},"institutions":[{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Youxian Sun","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","Department of Control Science & Engineering, Zhejiang University, Hangzhou, CHINA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4391767838"]},{"raw_affiliation_string":"Department of Control Science & Engineering, Zhejiang University, Hangzhou, CHINA","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"19","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.9688000082969666,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7814887762069702},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.624698281288147},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5712350606918335},{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.5708991289138794},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4961636960506439},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4897751808166504},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4814664423465729},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4634957015514374},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4632023870944977},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.45728936791419983},{"id":"https://openalex.org/keywords/a-priori-and-a-posteriori","display_name":"A priori and a posteriori","score":0.4315100312232971},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.32684001326560974},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2890257239341736},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21262165904045105},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.09857681393623352}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7814887762069702},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.624698281288147},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5712350606918335},{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.5708991289138794},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4961636960506439},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4897751808166504},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4814664423465729},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4634957015514374},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4632023870944977},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.45728936791419983},{"id":"https://openalex.org/C75553542","wikidata":"https://www.wikidata.org/wiki/Q178161","display_name":"A priori and a posteriori","level":2,"score":0.4315100312232971},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.32684001326560974},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2890257239341736},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21262165904045105},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.09857681393623352},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ascc.2013.6606319","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ascc.2013.6606319","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 9th Asian Control Conference (ASCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1978677160","https://openalex.org/W1989295284","https://openalex.org/W1991519797","https://openalex.org/W2000858991","https://openalex.org/W2002268936","https://openalex.org/W2037195491","https://openalex.org/W2046915666","https://openalex.org/W2060966665","https://openalex.org/W2066551872","https://openalex.org/W2069546111","https://openalex.org/W2086324137","https://openalex.org/W2089468765","https://openalex.org/W2103110513","https://openalex.org/W2107357525","https://openalex.org/W2116492734","https://openalex.org/W2155844971","https://openalex.org/W2321410814","https://openalex.org/W4232421753"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W3148663848","https://openalex.org/W2024194466","https://openalex.org/W2566529656","https://openalex.org/W2163103195","https://openalex.org/W1978303825","https://openalex.org/W4210447066","https://openalex.org/W1974225921","https://openalex.org/W2358847582","https://openalex.org/W2390533148"],"abstract_inverted_index":{"A":[0],"sub-principal":[1],"component":[2],"of":[3,22,46,151],"fault":[4,13,47,54,64,79,88,97,111,123,132,137,169,181,189],"detection":[5],"(PCFD)":[6],"modeling":[7],"method":[8],"is":[9,31,73,91,140],"proposed":[10,32,153,166],"for":[11,15,188],"online":[12,122,136],"diagnosis":[14,89,133,138,170,190],"multiphase":[16,104,158],"batch":[17,37,159],"processes.":[18],"Without":[19],"the":[20,35,44,50,59,78,95,100,127,144,152,165],"requirement":[21],"priori":[23],"process":[24,38,182],"knowledge,":[25],"an":[26,135],"automatic":[27],"phase":[28,61,102,129],"division":[29],"algorithm":[30,72],"to":[33,76,82,93,121,142,155,179],"separate":[34],"abnormal":[36],"into":[39,58,68],"multiple":[40],"phases":[41,112],"by":[42],"capturing":[43],"changes":[45],"deviations":[48,80],"throughout":[49],"batch.":[51],"The":[52,149],"similar":[53,96],"characteristics":[55,65,98],"are":[56,66,113,171,176],"grouped":[57],"same":[60,101],"while":[62],"different":[63,69,85,108],"classified":[67],"phases.":[70,86,109],"PCFD":[71],"then":[74],"used":[75],"decompose":[77],"relative":[81],"normal":[83],"in":[84,191],"Phase-representative":[87],"model":[90],"developed":[92,141],"capture":[94],"within":[99],"and":[103,115,131,168,184],"sub-phase":[105],"models":[106],"across":[107],"Critical-to-diagnosis":[110],"defined":[114],"identified":[116,128],"which":[117],"have":[118],"significant":[119],"contributions":[120],"diagnosis.":[124],"Based":[125],"on":[126],"nature":[130],"relationships,":[134],"strategy":[139],"isolate":[143],"possible":[145],"abnormality":[146],"cause":[147],"realtime.":[148],"applications":[150],"scheme":[154],"a":[156],"typical":[157],"process,":[160],"injection":[161],"molding,":[162],"show":[163],"that":[164],"analysis":[167],"not":[172],"only":[173],"effective":[174],"but":[175],"also":[177],"able":[178],"enhance":[180],"understanding":[183],"identify":[185],"specific":[186],"periods":[187],"time.":[192]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}