{"id":"https://openalex.org/W2859507254","doi":"https://doi.org/10.1109/aqtr.2018.8402793","title":"Trojan circuits masking and debugging of combinational circuits with LUT insertion","display_name":"Trojan circuits masking and debugging of combinational circuits with LUT insertion","publication_year":2018,"publication_date":"2018-05-01","ids":{"openalex":"https://openalex.org/W2859507254","doi":"https://doi.org/10.1109/aqtr.2018.8402793","mag":"2859507254"},"language":"en","primary_location":{"id":"doi:10.1109/aqtr.2018.8402793","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aqtr.2018.8402793","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059600435","display_name":"A. Matrosova","orcid":"https://orcid.org/0000-0002-8662-4740"},"institutions":[{"id":"https://openalex.org/I196355604","display_name":"National Research Tomsk State University","ror":"https://ror.org/02he2nc27","country_code":"RU","type":"education","lineage":["https://openalex.org/I196355604"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"A. Matrosova","raw_affiliation_strings":["Tomsk State University (TSU), Tomsk, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tomsk State University (TSU), Tomsk, Russia","institution_ids":["https://openalex.org/I196355604"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066991394","display_name":"S. Ostanin","orcid":"https://orcid.org/0000-0002-4204-4808"},"institutions":[{"id":"https://openalex.org/I196355604","display_name":"National Research Tomsk State University","ror":"https://ror.org/02he2nc27","country_code":"RU","type":"education","lineage":["https://openalex.org/I196355604"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"S. Ostanin","raw_affiliation_strings":["Tomsk State University (TSU), Tomsk, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tomsk State University (TSU), Tomsk, Russia","institution_ids":["https://openalex.org/I196355604"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I196355604"],"apc_list":null,"apc_paid":null,"fwci":0.9501,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.75504788,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"6174","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7103359699249268},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6802157759666443},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.62518310546875},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.44174662232398987},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.42946723103523254},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.42263588309288025},{"id":"https://openalex.org/keywords/boolean-function","display_name":"Boolean function","score":0.4204173982143402},{"id":"https://openalex.org/keywords/boolean-circuit","display_name":"Boolean circuit","score":0.4149155020713806},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32685577869415283},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1829160451889038},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17473113536834717}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7103359699249268},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6802157759666443},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.62518310546875},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.44174662232398987},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.42946723103523254},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.42263588309288025},{"id":"https://openalex.org/C187455244","wikidata":"https://www.wikidata.org/wiki/Q942353","display_name":"Boolean function","level":2,"score":0.4204173982143402},{"id":"https://openalex.org/C141796577","wikidata":"https://www.wikidata.org/wiki/Q837479","display_name":"Boolean circuit","level":3,"score":0.4149155020713806},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32685577869415283},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1829160451889038},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17473113536834717}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aqtr.2018.8402793","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aqtr.2018.8402793","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320324099","display_name":"Russian Science Foundation","ror":"https://ror.org/03y2gwe85"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1528837436","https://openalex.org/W1601994063","https://openalex.org/W1985685974","https://openalex.org/W2038188135","https://openalex.org/W2051401459","https://openalex.org/W2119913792","https://openalex.org/W2142726962","https://openalex.org/W2495485985","https://openalex.org/W2546946922","https://openalex.org/W2559853455","https://openalex.org/W2914069437","https://openalex.org/W7047819290"],"related_works":["https://openalex.org/W2611822924","https://openalex.org/W2486254595","https://openalex.org/W1494292626","https://openalex.org/W2728195892","https://openalex.org/W2018822765","https://openalex.org/W2126951255","https://openalex.org/W3217430545","https://openalex.org/W2083793411","https://openalex.org/W2150974517","https://openalex.org/W4248162147"],"abstract_inverted_index":{"It":[0],"is":[1,30,42,102,106,172,224],"extremely":[2],"difficult":[3],"to":[4,32,90,142,181,186],"provide":[5],"100%":[6],"correctness":[7],"of":[8,36,85,87,112,135,166,199,221],"fabricated":[9],"high":[10],"performance":[11],"circuits.":[12],"Manufactured":[13],"circuits":[14,55,63],"may":[15,49,212,217],"have":[16,75],"logical":[17,204],"and":[18,25,79],"electrical":[19],"bugs,":[20],"Trojan":[21],"Circuits":[22],"(TCs)":[23],"inclusions":[24],"so":[26],"on.":[27],"Sometimes":[28],"it":[29],"necessary":[31],"execute":[33],"slight":[34],"correction":[35],"the":[37,46,118,125,136,143,147,188,196,200],"circuit":[38,100,114,158,162,189,201],"specification.":[39],"If":[40],"there":[41],"in-field":[43],"programmability":[44],"in":[45,132],"circuits,":[47],"they":[48],"be":[50,213,218],"rectified.":[51],"Here":[52],"partially":[53],"programmable":[54],"are":[56,59,154,193,208,229],"considered.":[57],"They":[58],"derived":[60,155],"from":[61,156,170],"gate":[62,99,157],"by":[64,68,178],"covering":[65],"some":[66,226],"sub-circuits":[67,88,177],"look":[69],"up":[70],"tables":[71],"(LUTs).":[72],"Some":[73],"LUTs":[74,179,223],"one":[76],"free":[77],"input":[78],"use":[80],"reserved":[81],"line.":[82,144],"The":[83,104],"way":[84],"selection":[86,105],"oriented":[89],"masking":[91,94],"TCs":[92,183,216],"or":[93,185],"arbitrary":[95],"logic":[96],"faults":[97,192,205],"on":[98,108,151,195,206],"lines":[101,207,211],"suggested.":[103],"based":[107],"using":[109],"observability":[110,121],"estimations":[111,148],"internal":[113,119],"lines.":[115],"Note":[116],"that":[117],"line":[120],"estimation":[122],"represents":[123],"at":[124],"same":[126],"time":[127],"determined":[128],"area":[129],"(its":[130],"portion":[131],"Boolean":[133,139],"space)":[134],"incompletely":[137],"specified":[138],"function":[140],"corresponding":[141],"We":[145,174],"get":[146],"applying":[149],"operations":[150],"ROBDDs.":[152],"ROBDDs":[153],"fragments.":[159],"A":[160],"combinational":[161,164],"(the":[163],"part":[165],"a":[167],"sequential":[168],"circuit)":[169],"gates":[171],"given.":[173,230],"cover":[175],"its":[176],"either":[180],"mask":[182],"actions":[184],"recover":[187],"specification":[190],"if":[191],"detected":[194],"last":[197],"stages":[198],"fabrication.":[202],"Arbitrary":[203],"possible,":[209],"several":[210,215],"fault,":[214],"injected.":[219],"Algorithm":[220],"reprogramming":[222],"developed,":[225],"experimental":[227],"results":[228]},"counts_by_year":[{"year":2020,"cited_by_count":3},{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}