{"id":"https://openalex.org/W2815002920","doi":"https://doi.org/10.1109/aqtr.2018.8402708","title":"Combined pseudo-exhaustive and deterministic testing of array multipliers","display_name":"Combined pseudo-exhaustive and deterministic testing of array multipliers","publication_year":2018,"publication_date":"2018-05-01","ids":{"openalex":"https://openalex.org/W2815002920","doi":"https://doi.org/10.1109/aqtr.2018.8402708","mag":"2815002920"},"language":"en","primary_location":{"id":"doi:10.1109/aqtr.2018.8402708","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aqtr.2018.8402708","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065172476","display_name":"Adeboye Stephen Oyeniran","orcid":"https://orcid.org/0000-0002-6344-3875"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Adeboye Stephen Oyeniran","raw_affiliation_strings":["Tallinn University of Technology, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070895334","display_name":"Siavoosh Payandeh Azad","orcid":"https://orcid.org/0000-0001-9177-7779"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Siavoosh Payandeh Azad","raw_affiliation_strings":["Tallinn University of Technology, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010536057","display_name":"Raimund Ubar","orcid":"https://orcid.org/0000-0001-8186-4385"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Raimund Ubar","raw_affiliation_strings":["Tallinn University of Technology, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology, Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7133579254150391},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5268232822418213},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5150911211967468},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.47162604331970215},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4534372091293335},{"id":"https://openalex.org/keywords/orthogonal-array-testing","display_name":"Orthogonal array testing","score":0.4467422068119049},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4373076260089874},{"id":"https://openalex.org/keywords/white-box-testing","display_name":"White-box testing","score":0.42084062099456787},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.417843222618103},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.41427624225616455},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40357881784439087},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3756601810455322},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.24392056465148926},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18378478288650513},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13451334834098816},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.11175507307052612},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.10156089067459106},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.09383860230445862}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7133579254150391},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5268232822418213},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5150911211967468},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.47162604331970215},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4534372091293335},{"id":"https://openalex.org/C158324730","wikidata":"https://www.wikidata.org/wiki/Q54862604","display_name":"Orthogonal array testing","level":5,"score":0.4467422068119049},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4373076260089874},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.42084062099456787},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.417843222618103},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.41427624225616455},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40357881784439087},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3756601810455322},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.24392056465148926},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18378478288650513},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13451334834098816},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.11175507307052612},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.10156089067459106},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.09383860230445862},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aqtr.2018.8402708","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aqtr.2018.8402708","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1956017427","https://openalex.org/W1970313909","https://openalex.org/W2007904745","https://openalex.org/W2008990681","https://openalex.org/W2026445983","https://openalex.org/W2043949919","https://openalex.org/W2049369245","https://openalex.org/W2097569377","https://openalex.org/W2103450206","https://openalex.org/W2106197724","https://openalex.org/W2108836985","https://openalex.org/W2111907998","https://openalex.org/W2115795793","https://openalex.org/W2120281345","https://openalex.org/W2124267028","https://openalex.org/W2125837930","https://openalex.org/W2127346720","https://openalex.org/W2127826474","https://openalex.org/W2130323087","https://openalex.org/W2140839599","https://openalex.org/W2150032667","https://openalex.org/W4251758069","https://openalex.org/W6662973772","https://openalex.org/W6677361912","https://openalex.org/W6678941976","https://openalex.org/W6680725406"],"related_works":["https://openalex.org/W2767512594","https://openalex.org/W2186644673","https://openalex.org/W2974027607","https://openalex.org/W1501213200","https://openalex.org/W2376226556","https://openalex.org/W2387992358","https://openalex.org/W2886756146","https://openalex.org/W2376559135","https://openalex.org/W4387395044","https://openalex.org/W2552220181"],"abstract_inverted_index":{"The":[0,57],"paper":[1],"presents":[2],"a":[3,13,35,51,66],"new":[4,78],"method":[5],"for":[6],"bit-parallel":[7],"testing":[8,27,34,43],"of":[9,16,19,26,33,37,50,54,76],"array":[10],"multipliers":[11],"using":[12],"novel":[14],"approach":[15,79],"data-controlled":[17],"segmentation":[18],"the":[20,24,31,74,77],"circuit":[21],"to":[22,30,46],"transform":[23],"task":[25,32],"2-dimensional":[28],"arrays":[29],"set":[36],"1-dimensional":[38],"arrays.":[39],"Pseudo-exhaustive":[40],"and":[41],"deterministic":[42],"are":[44],"combined":[45],"achieve":[47],"high":[48],"coverage":[49],"broad":[52],"class":[53],"gate-level":[55],"faults.":[56],"well-structured":[58],"test":[59],"sequences":[60],"can":[61],"be":[62],"implemented":[63],"both,":[64],"as":[65],"software":[67],"or":[68],"hardware":[69],"based":[70],"BIST.":[71],"Experiments":[72],"demonstrate":[73],"advantages":[75],"compared":[80],"with":[81],"state-of-the-art":[82],"methods.":[83]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}