{"id":"https://openalex.org/W4405845057","doi":"https://doi.org/10.1109/apccas62602.2024.10808933","title":"A Second-Order Noise Shaping SAR ADC with Fully Passive Integrators and Pole Optimization","display_name":"A Second-Order Noise Shaping SAR ADC with Fully Passive Integrators and Pole Optimization","publication_year":2024,"publication_date":"2024-11-07","ids":{"openalex":"https://openalex.org/W4405845057","doi":"https://doi.org/10.1109/apccas62602.2024.10808933"},"language":"en","primary_location":{"id":"doi:10.1109/apccas62602.2024.10808933","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas62602.2024.10808933","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101886983","display_name":"Chia\u2010Wei Liu","orcid":"https://orcid.org/0009-0008-8585-2718"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chia-Wei Liu","raw_affiliation_strings":["National Cheng-Kung University,Department of Electrical Engineering,Tainan,Taiwan,701"],"affiliations":[{"raw_affiliation_string":"National Cheng-Kung University,Department of Electrical Engineering,Tainan,Taiwan,701","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105520619","display_name":"Yi\u2010Ting Hsieh","orcid":"https://orcid.org/0009-0009-9577-6189"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Ting Hsieh","raw_affiliation_strings":["National Cheng-Kung University,Department of Electrical Engineering,Tainan,Taiwan,701"],"affiliations":[{"raw_affiliation_string":"National Cheng-Kung University,Department of Electrical Engineering,Tainan,Taiwan,701","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015308343","display_name":"Shuenn-Yuh Lee","orcid":"https://orcid.org/0000-0002-9757-1410"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shuenn-Yuh Lee","raw_affiliation_strings":["National Cheng-Kung University,Department of Electrical Engineering,Tainan,Taiwan,701"],"affiliations":[{"raw_affiliation_string":"National Cheng-Kung University,Department of Electrical Engineering,Tainan,Taiwan,701","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072457956","display_name":"Ju\u2010Yi Chen","orcid":"https://orcid.org/0000-0003-2760-9978"},"institutions":[{"id":"https://openalex.org/I4210158999","display_name":"National Cheng Kung University Hospital","ror":"https://ror.org/04zx3rq17","country_code":"TW","type":"healthcare","lineage":["https://openalex.org/I4210158999"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ju-Yi Chen","raw_affiliation_strings":["National Cheng-Kung University Hospital,Department of Internal Medicine,Tainan,Taiwan"],"affiliations":[{"raw_affiliation_string":"National Cheng-Kung University Hospital,Department of Internal Medicine,Tainan,Taiwan","institution_ids":["https://openalex.org/I4210158999"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101886983"],"corresponding_institution_ids":["https://openalex.org/I91807558"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.23033907,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"406","last_page":"409"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.8010357618331909},{"id":"https://openalex.org/keywords/noise-shaping","display_name":"Noise shaping","score":0.7004427313804626},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5452353358268738},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5393260717391968},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5391029119491577},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.43672433495521545},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4154531955718994},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23209506273269653},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22949305176734924},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21344539523124695},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.1686750054359436},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.16612184047698975},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08104336261749268},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07436183094978333}],"concepts":[{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.8010357618331909},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.7004427313804626},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5452353358268738},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5393260717391968},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5391029119491577},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.43672433495521545},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4154531955718994},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23209506273269653},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22949305176734924},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21344539523124695},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.1686750054359436},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.16612184047698975},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08104336261749268},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07436183094978333},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas62602.2024.10808933","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas62602.2024.10808933","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320331164","display_name":"National Science and Technology Council","ror":"https://ror.org/00wnb9798"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2125521827","https://openalex.org/W2594198266","https://openalex.org/W2766124299","https://openalex.org/W2901171969","https://openalex.org/W2921260700","https://openalex.org/W3102310302","https://openalex.org/W3133975637","https://openalex.org/W3174559553","https://openalex.org/W3205151931","https://openalex.org/W4205594724","https://openalex.org/W4311413069","https://openalex.org/W4312580016"],"related_works":["https://openalex.org/W2036735748","https://openalex.org/W3011208887","https://openalex.org/W3048332254","https://openalex.org/W3216832710","https://openalex.org/W2943504207","https://openalex.org/W2914701507","https://openalex.org/W2115133053","https://openalex.org/W2487410127","https://openalex.org/W3184887885","https://openalex.org/W3144658446"],"abstract_inverted_index":{"This":[0,94],"article":[1],"proposes":[2],"a":[3,18,25,43,72,82,116],"new":[4],"second-order":[5,61,92],"noise-shaping":[6,111],"architecture":[7],"for":[8],"successive":[9],"approximation":[10],"register":[11],"(SAR)":[12],"analog-to-digital":[13],"converters":[14],"(ADCs),":[15],"which":[16,52],"is":[17,47,77,96],"hybrid":[19],"scheme":[20],"with":[21,66],"capacitor":[22],"stacking":[23],"and":[24,40,57,71,103,118,146,152],"multi-input":[26,45],"comparator":[27,46],"to":[28,87],"achieve":[29,115],"enough":[30],"gain":[31],"in":[32,49,81,98,129],"the":[33,54,88,104,109,130],"transfer":[34,63],"function.":[35],"Instead":[36],"of":[37,91,122,132,143],"high-gain":[38],"comparators":[39],"three-path":[41],"comparators,":[42],"two-path":[44],"used":[48],"this":[50],"architecture,":[51],"reduces":[53],"noise":[55,62],"contribution":[56],"power":[58],"consumption.":[59],"A":[60],"function":[64],"(NTF)":[65],"two":[67],"zeros":[68],"at":[69,75],"$(0.8,0)$":[70],"negative":[73],"pole":[74],"$(-0.8,0)$":[76],"also":[78],"implemented,":[79],"resulting":[80],"better":[83],"noiseshaping":[84],"ability":[85],"compared":[86],"traditional":[89],"NTF":[90],"noise-shaping.":[93],"design":[95],"fabricated":[97],"TSMC":[99],"180":[100],"nm":[101],"technology,":[102],"simulation":[105],"results":[106],"reveal":[107],"that":[108],"proposed":[110],"SAR":[112],"ADC":[113],"can":[114],"signal-to-noise":[117],"distortion":[119],"ratio":[120],"(SNDR)":[121],"$\\mathbf{7":[123],"4.":[124],"1":[125],"5}":[126,135],"\\mathbf{d":[127],"B}$":[128],"bandwidth":[131],"$\\mathbf{1":[133],"2":[134],"\\mathbf{~":[136],"k":[137],"H":[138],"z}$.":[139],"The":[140],"Schreier":[141],"figure":[142],"merit":[144],"(FoM)":[145],"Walden":[147],"FoM":[148],"are":[149],"161":[150],"dB":[151],"248":[153],"fJ/conv.-step.":[154]},"counts_by_year":[],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}