{"id":"https://openalex.org/W4405845122","doi":"https://doi.org/10.1109/apccas62602.2024.10808650","title":"Live Demonstration: Defect Detection in Material Extrusion with Multimodal Large Language Model","display_name":"Live Demonstration: Defect Detection in Material Extrusion with Multimodal Large Language Model","publication_year":2024,"publication_date":"2024-11-07","ids":{"openalex":"https://openalex.org/W4405845122","doi":"https://doi.org/10.1109/apccas62602.2024.10808650"},"language":"en","primary_location":{"id":"doi:10.1109/apccas62602.2024.10808650","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas62602.2024.10808650","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101681922","display_name":"George Wu","orcid":"https://orcid.org/0009-0006-5586-8976"},"institutions":[{"id":"https://openalex.org/I82951845","display_name":"RMIT University","ror":"https://ror.org/04ttjf776","country_code":"AU","type":"education","lineage":["https://openalex.org/I82951845"]}],"countries":["AU"],"is_corresponding":true,"raw_author_name":"George Wu","raw_affiliation_strings":["RMIT University,Electrical and Electronic Engineering,Melbourne,Australia"],"affiliations":[{"raw_affiliation_string":"RMIT University,Electrical and Electronic Engineering,Melbourne,Australia","institution_ids":["https://openalex.org/I82951845"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049007224","display_name":"Chi\u2010Tsun Cheng","orcid":"https://orcid.org/0000-0003-3306-6148"},"institutions":[{"id":"https://openalex.org/I82951845","display_name":"RMIT University","ror":"https://ror.org/04ttjf776","country_code":"AU","type":"education","lineage":["https://openalex.org/I82951845"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Chi-Tsun Cheng","raw_affiliation_strings":["RMIT University,Mechanical, Manufacturing and Mechatronic Engineering,Melbourne,Australia"],"affiliations":[{"raw_affiliation_string":"RMIT University,Mechanical, Manufacturing and Mechatronic Engineering,Melbourne,Australia","institution_ids":["https://openalex.org/I82951845"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061441789","display_name":"Toh Yen Pang","orcid":"https://orcid.org/0000-0002-4766-3042"},"institutions":[{"id":"https://openalex.org/I82951845","display_name":"RMIT University","ror":"https://ror.org/04ttjf776","country_code":"AU","type":"education","lineage":["https://openalex.org/I82951845"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Toh Yen Pang","raw_affiliation_strings":["RMIT University,Biomedical Engineering,Melbourne,Australia"],"affiliations":[{"raw_affiliation_string":"RMIT University,Biomedical Engineering,Melbourne,Australia","institution_ids":["https://openalex.org/I82951845"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101681922"],"corresponding_institution_ids":["https://openalex.org/I82951845"],"apc_list":null,"apc_paid":null,"fwci":0.3814,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.68582834,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9611999988555908,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9611999988555908,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9592000246047974,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/extrusion","display_name":"Extrusion","score":0.6895679831504822},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5798472762107849},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.27568238973617554},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.11974748969078064}],"concepts":[{"id":"https://openalex.org/C2778958987","wikidata":"https://www.wikidata.org/wiki/Q139143","display_name":"Extrusion","level":2,"score":0.6895679831504822},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5798472762107849},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.27568238973617554},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.11974748969078064}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas62602.2024.10808650","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas62602.2024.10808650","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W4205626641","https://openalex.org/W4389545408"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2353373575","https://openalex.org/W2362061090","https://openalex.org/W1659936574","https://openalex.org/W3102567326","https://openalex.org/W1603813287","https://openalex.org/W2351799775","https://openalex.org/W2383118468"],"abstract_inverted_index":{"Defect":[0,21],"detection":[1,22,93],"in":[2,94],"material":[3],"extrusion":[4],"(MEX)":[5],"is":[6],"crucial":[7],"because":[8],"defects":[9,63],"can":[10],"significantly":[11],"impact":[12],"the":[13,41,51,55,80],"functionality":[14],"and":[15,35,54,76,85],"mechanical":[16],"properties":[17],"of":[18,62],"3D-printed":[19,52],"parts.":[20],"methods":[23,44],"based":[24],"on":[25,47],"convolutional":[26],"neural":[27],"networks":[28],"(CNNs)":[29],"often":[30],"involve":[31],"extensive":[32],"labelled":[33],"datasets":[34,84],"substantial":[36],"computational":[37],"resources":[38],"[1].":[39],"On":[40],"other":[42],"hand,":[43],"that":[45],"focus":[46],"identifying":[48],"discrepancies":[49],"between":[50],"part":[53],"intended":[56],"design":[57],"cannot":[58],"classify":[59],"specific":[60],"types":[61],"[2].":[64],"This":[65],"demonstration":[66],"introduces":[67],"Multimodal":[68],"Large":[69],"Language":[70],"Models":[71],"(MLLMs),":[72],"which":[73],"integrate":[74],"textual":[75],"visual":[77],"data,":[78],"minimizing":[79],"need":[81],"for":[82],"large":[83],"providing":[86],"a":[87],"more":[88],"efficient":[89],"approach":[90],"to":[91],"defect":[92],"MEX.":[95]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}