{"id":"https://openalex.org/W4405845321","doi":"https://doi.org/10.1109/apccas62602.2024.10808422","title":"A 14b Calibration-Free Pipelined SAR ADC Using a Single-Stage Gain Boost FIA","display_name":"A 14b Calibration-Free Pipelined SAR ADC Using a Single-Stage Gain Boost FIA","publication_year":2024,"publication_date":"2024-11-07","ids":{"openalex":"https://openalex.org/W4405845321","doi":"https://doi.org/10.1109/apccas62602.2024.10808422"},"language":"en","primary_location":{"id":"doi:10.1109/apccas62602.2024.10808422","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas62602.2024.10808422","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100604210","display_name":"Hui Tian","orcid":"https://orcid.org/0000-0002-8932-3003"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"HaoYu Tian","raw_affiliation_strings":["Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104233797","display_name":"Guolong Fu","orcid":null},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guolong Fu","raw_affiliation_strings":["Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101483510","display_name":"Yi Xiong","orcid":"https://orcid.org/0000-0002-5573-9449"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"YuZhou Xiong","raw_affiliation_strings":["Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100732248","display_name":"Yanbo Zhang","orcid":"https://orcid.org/0000-0002-7627-488X"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanbo Zhang","raw_affiliation_strings":["Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077084617","display_name":"Lianxi Liu","orcid":"https://orcid.org/0000-0002-9897-5361"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shubin Liu","raw_affiliation_strings":["Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039575274","display_name":"Zhangming Zhu","orcid":"https://orcid.org/0000-0002-7764-1928"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhangming Zhu","raw_affiliation_strings":["Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Xidian University,Key Laboratory of Analog Integrated Circuits,Xi’an,China","institution_ids":["https://openalex.org/I149594827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100604210"],"corresponding_institution_ids":["https://openalex.org/I149594827"],"apc_list":null,"apc_paid":null,"fwci":0.4316,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.65120805,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"717","last_page":"721"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6436585187911987},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.5834226012229919},{"id":"https://openalex.org/keywords/stage","display_name":"Stage (stratigraphy)","score":0.49008095264434814},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47132232785224915},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2060743272304535},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17496812343597412},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17228850722312927},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.13071781396865845},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.10724902153015137},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1038522720336914}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6436585187911987},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.5834226012229919},{"id":"https://openalex.org/C146357865","wikidata":"https://www.wikidata.org/wiki/Q1123245","display_name":"Stage (stratigraphy)","level":2,"score":0.49008095264434814},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47132232785224915},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2060743272304535},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17496812343597412},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17228850722312927},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.13071781396865845},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10724902153015137},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1038522720336914},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas62602.2024.10808422","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas62602.2024.10808422","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2135751681","https://openalex.org/W2593720627","https://openalex.org/W4285290407","https://openalex.org/W4375801804","https://openalex.org/W4394674306"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2759986866"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,14,36,95,100],"calibration-free":[4],"pipelined":[5],"successive":[6],"approximation":[7],"register":[8],"(SAR)":[9],"analog-to-digital":[10],"converter":[11],"(ADC)":[12],"with":[13],"single-stage":[15],"gain":[16,25,37],"boost":[17,38],"cascoded":[18,28,49],"floating":[19],"inverting":[20],"amplifier":[21,51,89],"(FIA).":[22],"The":[23,47,60,87],"open-loop":[24],"of":[26,74,84,103],"the":[27],"FIA":[29],"is":[30,63],"increased":[31],"by":[32],"28":[33],"dB":[34,76],"through":[35],"bias":[39],"technique,":[40],"achieving":[41],"an":[42,72],"accurate":[43],"32-fold":[44],"inter-stage":[45,85],"gain.":[46,86],"proposed":[48,88],"dynamic":[50],"also":[52],"offers":[53],"stable":[54],"linear":[55],"amplification":[56],"and":[57,70],"low":[58],"noise.":[59],"prototype":[61],"ADC":[62],"fabricated":[64],"using":[65],"65":[66],"nm":[67],"process":[68],"technology":[69],"achieves":[71],"SNDR":[73],"83.73":[75],"at":[77],"$10":[78],"\\mathrm{MS}":[79],"/":[80],"\\mathrm{s}$":[81],"without":[82],"calibration":[83],"consumes":[90],"only":[91],"83.89":[92],"uA":[93],"from":[94],"$1.2-\\mathrm{V}$":[96],"supply,":[97],"leading":[98],"to":[99],"Schreier":[101],"figure-of-merit(FoM)":[102],"$\\mathrm{1":[104],"8":[105],"4":[106],".":[107],"2":[108],"1":[109],"~":[110],"d":[111],"B}$.":[112]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-17T09:09:15.849793","created_date":"2025-10-10T00:00:00"}