{"id":"https://openalex.org/W4364860135","doi":"https://doi.org/10.1109/apccas55924.2022.10090371","title":"The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology","display_name":"The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology","publication_year":2022,"publication_date":"2022-11-11","ids":{"openalex":"https://openalex.org/W4364860135","doi":"https://doi.org/10.1109/apccas55924.2022.10090371"},"language":"en","primary_location":{"id":"doi:10.1109/apccas55924.2022.10090371","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas55924.2022.10090371","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100437262","display_name":"Xu Zhang","orcid":"https://orcid.org/0000-0002-8098-8893"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xu Zhang","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China","University of Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049933827","display_name":"Fanyu Liu","orcid":"https://orcid.org/0000-0002-6154-4971"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fanyu Liu","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023885825","display_name":"Bo Li","orcid":"https://orcid.org/0000-0003-4905-2744"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Li","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100429247","display_name":"Siyuan Chen","orcid":"https://orcid.org/0000-0003-3402-6236"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siyuan Chen","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101325859","display_name":"Yang Huang","orcid":"https://orcid.org/0009-0001-0525-2122"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Huang","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","University of Chinese Academy of Sciences, Beijing, China","Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043760395","display_name":"Jiangjiang Li","orcid":"https://orcid.org/0000-0002-4138-0973"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangjiang Li","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101646000","display_name":"Jian Jiao","orcid":"https://orcid.org/0000-0001-6002-7297"},"institutions":[{"id":"https://openalex.org/I4210086028","display_name":"Technology and Engineering Center for Space Utilization","ror":"https://ror.org/00cn03n83","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210086028"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Jiao","raw_affiliation_strings":["Chinese Academy of Sciences,Technology and Engineering Center for Space Utilization,Beijing,China,100094"],"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences,Technology and Engineering Center for Space Utilization,Beijing,China,100094","institution_ids":["https://openalex.org/I4210086028","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008918891","display_name":"Tianchun Ye","orcid":"https://orcid.org/0000-0002-2384-9037"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianchun Ye","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100749903","display_name":"Jun Luo","orcid":"https://orcid.org/0000-0002-5122-6806"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiajun Luo","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","University of Chinese Academy of Sciences, Beijing, China","Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences,Beijing,China,100029","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Key Laboratory of Science and Technology on Silicon Devices, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5100437262"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392","https://openalex.org/I4210165038"],"apc_list":null,"apc_paid":null,"fwci":0.2744,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.54623375,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"532","last_page":"535"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ionizing-radiation","display_name":"Ionizing radiation","score":0.6468374133110046},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.557101845741272},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.46037134528160095},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4457832872867584},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.43887466192245483},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.4124414324760437},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36797887086868286},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35485565662384033},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3477088510990143},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.33998191356658936},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.3304872512817383},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2934768795967102},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.17040634155273438},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.13797879219055176},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10275998711585999},{"id":"https://openalex.org/keywords/organic-chemistry","display_name":"Organic chemistry","score":0.09374749660491943}],"concepts":[{"id":"https://openalex.org/C18231593","wikidata":"https://www.wikidata.org/wiki/Q186161","display_name":"Ionizing radiation","level":3,"score":0.6468374133110046},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.557101845741272},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.46037134528160095},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4457832872867584},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.43887466192245483},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.4124414324760437},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36797887086868286},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35485565662384033},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3477088510990143},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33998191356658936},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3304872512817383},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2934768795967102},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.17040634155273438},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.13797879219055176},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10275998711585999},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.09374749660491943}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas55924.2022.10090371","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas55924.2022.10090371","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4602266894","display_name":null,"funder_award_id":"11905287,61874135","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1966513457","https://openalex.org/W1980426581","https://openalex.org/W2027381561","https://openalex.org/W2034645648","https://openalex.org/W2079512317","https://openalex.org/W2096652287","https://openalex.org/W2100258398","https://openalex.org/W2116275715","https://openalex.org/W2155911091","https://openalex.org/W2159675689","https://openalex.org/W2331606701","https://openalex.org/W2542766088","https://openalex.org/W2553836930","https://openalex.org/W2796586539","https://openalex.org/W2801781964","https://openalex.org/W2894651834","https://openalex.org/W2895350835","https://openalex.org/W2916222146","https://openalex.org/W2951786666","https://openalex.org/W3005732983","https://openalex.org/W3162106203","https://openalex.org/W3214927632","https://openalex.org/W4205734666"],"related_works":["https://openalex.org/W2798735802","https://openalex.org/W2911908587","https://openalex.org/W4206616768","https://openalex.org/W2501493637","https://openalex.org/W4206147900","https://openalex.org/W4248584036","https://openalex.org/W2393727419","https://openalex.org/W2410053714","https://openalex.org/W2517584471","https://openalex.org/W2044997699"],"abstract_inverted_index":{"The":[0,21,48],"synergetic":[1,30,52,113],"effects":[2,10,31,53,114],"of":[3,11,145],"high":[4,142],"temperature":[5,92,110],"and":[6,35,86,111],"total":[7],"ionizing":[8],"dose":[9],"H-gate":[12],"DSOI":[13,146],"are":[14,25,46],"investigated":[15],"under":[16,108],"the":[17,29,39,63,75,84,88,96,102,112,122,133,141],"TG-state":[18],"bias":[19],"condition.":[20],"comparative":[22],"irradiation":[23],"experiments":[24],"subjected":[26],"to":[27,81,121],"identify":[28],"by":[32,127],"separating":[33],"pure-temperature":[34],"pure-irradiation":[36],"effects.":[37],"Furthermore,":[38],"mitigated":[40],"TID":[41,104,143],"responses":[42],"with/without":[43],"back-gate":[44],"compensation":[45],"discussed.":[47],"results":[49],"show":[50],"that":[51,74],"make":[54],"threshold":[55],"voltage":[56],"degradation":[57],"weaken":[58],"for":[59],"our":[60],"devices":[61],"with":[62,91,95],"<tex":[64,97],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[65,98],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\boldsymbol{V}_{\\text{SO12}}=0\\":[66],"\\mathbf{V}$</tex>":[67],"during":[68],"testing.":[69],"It":[70,137],"can":[71,115,147],"be":[72,78,117,148],"explained":[73],"electrons":[76],"will":[77],"more":[79],"likely":[80],"tunnel":[82],"into":[83,132],"oxides":[85],"compensate":[87],"trapped":[89,129],"charges":[90,130],"rising.":[93],"Besides,":[94],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\boldsymbol{V}_{\\text{SO}12}=-\\boldsymbol{10}\\":[99],"\\mathrm{V}$</tex>":[100],",":[101],"common":[103],"mitigation":[105],"was":[106],"observed":[107],"room":[109],"still":[116],"greatly":[118],"compensated":[119],"due":[120],"electric":[123],"field":[124],"lines":[125],"induced":[126],"positive":[128],"terminating":[131],"negatively":[134],"biased":[135],"electrode.":[136],"may":[138],"enlighten":[139],"us":[140],"tolerance":[144],"achieved":[149],"in":[150],"very":[151],"harsh":[152],"environments.":[153]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}