{"id":"https://openalex.org/W4364860109","doi":"https://doi.org/10.1109/apccas55924.2022.10090320","title":"Total Dose and Single Event Effects on 16 Mbit Standalone Spin-Transfer Torque MRAM with 45 nm CMOS Technology","display_name":"Total Dose and Single Event Effects on 16 Mbit Standalone Spin-Transfer Torque MRAM with 45 nm CMOS Technology","publication_year":2022,"publication_date":"2022-11-11","ids":{"openalex":"https://openalex.org/W4364860109","doi":"https://doi.org/10.1109/apccas55924.2022.10090320"},"language":"en","primary_location":{"id":"doi:10.1109/apccas55924.2022.10090320","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/apccas55924.2022.10090320","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101852248","display_name":"Anni Cao","orcid":"https://orcid.org/0000-0002-0391-1905"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]},{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Anni Cao","raw_affiliation_strings":["School of Integrated Circuits, Peking University Beijing Microelectronics Technology Institute,Beijing,China","School of Integrated Circuits, Peking University Beijing Microelectronics Technology Institute, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University Beijing Microelectronics Technology Institute,Beijing,China","institution_ids":["https://openalex.org/I4210089056","https://openalex.org/I20231570"]},{"raw_affiliation_string":"School of Integrated Circuits, Peking University Beijing Microelectronics Technology Institute, Beijing, China","institution_ids":["https://openalex.org/I4210089056","https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100353857","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-3811-2062"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["School of Integrated Circuits, Peking University Beijing Microelectronics Technology Institute,Beijing,China","School of Integrated Circuits, Peking University Beijing Microelectronics Technology Institute, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University Beijing Microelectronics Technology Institute,Beijing,China","institution_ids":["https://openalex.org/I4210089056","https://openalex.org/I20231570"]},{"raw_affiliation_string":"School of Integrated Circuits, Peking University Beijing Microelectronics Technology Institute, Beijing, China","institution_ids":["https://openalex.org/I4210089056","https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100712623","display_name":"Liang Wang","orcid":"https://orcid.org/0000-0002-0061-5502"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Wang","raw_affiliation_strings":["Beijing Microelectronics Technology Institute,Beijing,China","Beijing Microelectronics Technology Institute, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute,Beijing,China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100658357","display_name":"Jianpeng Zhang","orcid":"https://orcid.org/0009-0005-3069-5493"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianpeng Zhang","raw_affiliation_strings":["Beijing Microelectronics Technology Institute,Beijing,China","Beijing Microelectronics Technology Institute, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute,Beijing,China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071415076","display_name":"Chunliang Gou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunliang Gou","raw_affiliation_strings":["Beijing Microelectronics Technology Institute,Beijing,China","Beijing Microelectronics Technology Institute, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute,Beijing,China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035181054","display_name":"Liquan Liu","orcid":"https://orcid.org/0000-0001-8671-5098"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liquan Liu","raw_affiliation_strings":["Beijing Microelectronics Technology Institute,Beijing,China","Beijing Microelectronics Technology Institute, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute,Beijing,China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071375151","display_name":"Wang Bi","orcid":"https://orcid.org/0000-0002-3591-4764"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bi Wang","raw_affiliation_strings":["School of Integrated Circuit Science and Engineering, Beihang University,Beijing,China","School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuit Science and Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100399117","display_name":"Xing Zhang","orcid":"https://orcid.org/0009-0001-2800-8448"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Zhang","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China","School of Integrated Circuits, Peking University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030647669","display_name":"Yuanfu Zhao","orcid":"https://orcid.org/0000-0002-6786-6293"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanfu Zhao","raw_affiliation_strings":["Beijing Microelectronics Technology Institute,Beijing,China","Beijing Microelectronics Technology Institute, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute,Beijing,China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5101852248"],"corresponding_institution_ids":["https://openalex.org/I20231570","https://openalex.org/I4210089056"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1420659,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"528","last_page":"531"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.9444383978843689},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.725580632686615},{"id":"https://openalex.org/keywords/spin-transfer-torque","display_name":"Spin-transfer torque","score":0.6583713889122009},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.650661289691925},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6326432824134827},{"id":"https://openalex.org/keywords/megabit","display_name":"Megabit","score":0.6088693141937256},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.46938011050224304},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.45549046993255615},{"id":"https://openalex.org/keywords/tunnel-magnetoresistance","display_name":"Tunnel magnetoresistance","score":0.4362075626850128},{"id":"https://openalex.org/keywords/magnetometer","display_name":"Magnetometer","score":0.43502023816108704},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.4301263093948364},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4199889600276947},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3881160318851471},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3602839708328247},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33764636516571045},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28462591767311096},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2746252417564392},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.2740401327610016},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.24556174874305725},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2076493501663208},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.18676012754440308},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.16746994853019714},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.13689959049224854},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.13241523504257202},{"id":"https://openalex.org/keywords/magnetization","display_name":"Magnetization","score":0.09994617104530334}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.9444383978843689},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.725580632686615},{"id":"https://openalex.org/C609986","wikidata":"https://www.wikidata.org/wiki/Q844840","display_name":"Spin-transfer torque","level":4,"score":0.6583713889122009},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.650661289691925},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6326432824134827},{"id":"https://openalex.org/C185177783","wikidata":"https://www.wikidata.org/wiki/Q3332814","display_name":"Megabit","level":2,"score":0.6088693141937256},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.46938011050224304},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.45549046993255615},{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.4362075626850128},{"id":"https://openalex.org/C153946474","wikidata":"https://www.wikidata.org/wiki/Q333921","display_name":"Magnetometer","level":3,"score":0.43502023816108704},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.4301263093948364},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4199889600276947},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3881160318851471},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3602839708328247},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33764636516571045},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28462591767311096},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2746252417564392},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.2740401327610016},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.24556174874305725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2076493501663208},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.18676012754440308},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.16746994853019714},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.13689959049224854},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.13241523504257202},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.09994617104530334},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas55924.2022.10090320","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/apccas55924.2022.10090320","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1996171855","https://openalex.org/W2109257217","https://openalex.org/W2137871973","https://openalex.org/W2157964406","https://openalex.org/W2895583640","https://openalex.org/W2977046634","https://openalex.org/W2990800025","https://openalex.org/W3102625203","https://openalex.org/W3113755556","https://openalex.org/W3149326353","https://openalex.org/W3159674372","https://openalex.org/W4206901801"],"related_works":["https://openalex.org/W1588514174","https://openalex.org/W4388285079","https://openalex.org/W2151658931","https://openalex.org/W2546997659","https://openalex.org/W1517543257","https://openalex.org/W2733919783","https://openalex.org/W2425808153","https://openalex.org/W2622269177","https://openalex.org/W4281561022","https://openalex.org/W2404332818"],"abstract_inverted_index":{"Magnetic":[0],"Random":[1],"Access":[2],"Memory":[3],"(MRAM)":[4],"is":[5,31,67],"regarded":[6],"as":[7,27],"one":[8],"of":[9,22,41,53,110],"the":[10,19,28,35,39,45,72,84,92,97,104,111],"most":[11],"promising":[12],"memory":[13,29],"solutions":[14],"for":[15],"space":[16],"missions":[17],"since":[18],"storage":[20],"mechanism":[21],"magnetic":[23],"tunnel":[24],"junction":[25],"(MTJ)":[26],"unit":[30],"naturally":[32],"insensitive":[33],"to":[34],"radiation":[36,51,69],"effects.":[37],"For":[38],"application":[40],"highly":[42],"reliable":[43],"MRAM.,":[44],"total":[46],"dose":[47],"and":[48,89],"ion":[49,79],"beam":[50,80],"responses":[52],"a":[54],"commercial":[55],"STT-MRAM":[56,106],"are":[57,114],"evaluated":[58],"in":[59],"this":[60],"work.":[61],"The":[62],"results":[63],"indicate":[64],"that":[65],"MTJ":[66],"inherently":[68],"tolerant,":[70],"while":[71],"peripheral":[73],"circuit":[74],"exhibits":[75],"soft":[76,93],"errors":[77,94],"during":[78],"irradiation.":[81],"We":[82],"analyze":[83],"single":[85,98],"event":[86,99],"effect":[87],"(SEE)":[88],"look":[90],"into":[91],"caused":[95],"by":[96],"upset":[100],"(SEU).":[101],"Finally,":[102],"considering":[103],"special":[105],"architecture,":[107],"possible":[108],"inducements":[109],"experimental":[112],"phenomena":[113],"discussed.":[115]},"counts_by_year":[],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}