{"id":"https://openalex.org/W4364857893","doi":"https://doi.org/10.1109/apccas55924.2022.10090262","title":"A Reliable and Economical Test Method for Semiconductor Device Aging","display_name":"A Reliable and Economical Test Method for Semiconductor Device Aging","publication_year":2022,"publication_date":"2022-11-11","ids":{"openalex":"https://openalex.org/W4364857893","doi":"https://doi.org/10.1109/apccas55924.2022.10090262"},"language":"en","primary_location":{"id":"doi:10.1109/apccas55924.2022.10090262","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/apccas55924.2022.10090262","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068580459","display_name":"Xinhuan Yang","orcid":"https://orcid.org/0000-0002-0203-1359"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinhuan Yang","raw_affiliation_strings":["School of Electronic Information, Hangzhou Dianzi University,Hangzhou,China","School of Electronic Information, Hangzhou Dianzi University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information, Hangzhou Dianzi University,Hangzhou,China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"School of Electronic Information, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083186510","display_name":"Qianqian Sang","orcid":"https://orcid.org/0000-0001-9101-6531"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qianqian Sang","raw_affiliation_strings":["School of Electronic Information, Hangzhou Dianzi University,Hangzhou,China","School of Electronic Information, Hangzhou Dianzi University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information, Hangzhou Dianzi University,Hangzhou,China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"School of Electronic Information, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027965421","display_name":"Chuanzheng Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuanzheng Wang","raw_affiliation_strings":["School of Electronic Information, Hangzhou Dianzi University,Hangzhou,China","School of Electronic Information, Hangzhou Dianzi University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information, Hangzhou Dianzi University,Hangzhou,China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"School of Electronic Information, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101750084","display_name":"Shuo Wang","orcid":"https://orcid.org/0009-0001-0768-7920"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuo Wang","raw_affiliation_strings":["Beijing Microelectronics Technology Institute,Beijing,China","Beijing Microelectronics Technology Institute, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute,Beijing,China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100712623","display_name":"Liang Wang","orcid":"https://orcid.org/0000-0002-0061-5502"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Wang","raw_affiliation_strings":["Beijing Microelectronics Technology Institute,Beijing,China","Beijing Microelectronics Technology Institute, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute,Beijing,China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073260246","display_name":"Yuanfu Zhao","orcid":"https://orcid.org/0000-0002-2097-7172"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanfu Zhao","raw_affiliation_strings":["School of Electronic Information, Hangzhou Dianzi University,Hangzhou,China","School of Electronic Information, Hangzhou Dianzi University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information, Hangzhou Dianzi University,Hangzhou,China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"School of Electronic Information, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14435839,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"520","last_page":"523"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6592410802841187},{"id":"https://openalex.org/keywords/accelerated-aging","display_name":"Accelerated aging","score":0.6295773386955261},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.6207924485206604},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.559795618057251},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.5461153388023376},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5197674632072449},{"id":"https://openalex.org/keywords/burn-in","display_name":"Burn-in","score":0.4902089238166809},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.43727242946624756},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.41951557993888855},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34337615966796875},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19283339381217957},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.152317076921463},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.10885769128799438}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6592410802841187},{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.6295773386955261},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.6207924485206604},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.559795618057251},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.5461153388023376},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5197674632072449},{"id":"https://openalex.org/C179707776","wikidata":"https://www.wikidata.org/wiki/Q662895","display_name":"Burn-in","level":2,"score":0.4902089238166809},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43727242946624756},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.41951557993888855},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34337615966796875},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19283339381217957},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.152317076921463},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.10885769128799438},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas55924.2022.10090262","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/apccas55924.2022.10090262","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8899999856948853,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1991343524","https://openalex.org/W1996401929","https://openalex.org/W2038805871","https://openalex.org/W2043272542","https://openalex.org/W2343169104","https://openalex.org/W2346998736","https://openalex.org/W2769075706","https://openalex.org/W2894935531","https://openalex.org/W2920836843","https://openalex.org/W2945942712","https://openalex.org/W2970796140","https://openalex.org/W2985373303"],"related_works":["https://openalex.org/W2217098757","https://openalex.org/W2088771128","https://openalex.org/W4247906258","https://openalex.org/W2566070238","https://openalex.org/W2170365398","https://openalex.org/W4233031093","https://openalex.org/W2354567518","https://openalex.org/W2475020399","https://openalex.org/W4236395861","https://openalex.org/W2005741104"],"abstract_inverted_index":{"The":[0],"introduction":[1],"of":[2,25,33,71,97,112,122],"new":[3],"energy":[4],"vehicles":[5],"has":[6],"increased":[7],"the":[8,56,68,76,79,85,95,103,110,120],"demand":[9],"for":[10,59],"highly":[11],"reliable":[12],"chips,":[13],"which":[14,36],"makes":[15],"chip":[16],"aging":[17,26,46,61,80,105,123],"analysis":[18],"more":[19,21],"and":[20,40,62,92,115],"important.":[22],"Yet":[23],"characterization":[24],"effects":[27],"usually":[28],"requires":[29],"a":[30,44],"large":[31],"amount":[32],"test":[34,41,47,64,88,99],"data,":[35],"consumes":[37],"both":[38],"device":[39,72,87],"time.":[42,106],"Therefore,":[43],"dependable":[45],"method":[48,100,114],"is":[49,90],"proposed":[50],"in":[51,75],"this":[52,113],"paper.":[53],"By":[54],"determining":[55],"stress":[57],"voltage":[58],"accelerated":[60],"corresponding":[63],"time":[65],"according":[66],"to":[67],"median":[69],"degradation":[70],"electrical":[73],"indicators":[74],"pretest.":[77],"Conclusively,":[78],"model":[81],"obtained":[82],"by":[83],"fitting":[84],"NMOS":[86],"data":[89],"simulated":[91],"compared":[93],"with":[94],"results":[96],"traditional":[98],"based":[101],"on":[102],"same":[104],"It":[107],"proves":[108],"that":[109],"accuracy":[111],"its":[116],"practicality":[117],"while":[118],"reducing":[119],"cost":[121],"test.":[124]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}