{"id":"https://openalex.org/W2910402570","doi":"https://doi.org/10.1109/apccas.2018.8605641","title":"Inductance of Different Profiles of Through Glass Vias based on magnetic flux density","display_name":"Inductance of Different Profiles of Through Glass Vias based on magnetic flux density","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2910402570","doi":"https://doi.org/10.1109/apccas.2018.8605641","mag":"2910402570"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2018.8605641","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2018.8605641","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100355682","display_name":"Yang Liu","orcid":"https://orcid.org/0000-0001-6981-0974"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yang Liu","raw_affiliation_strings":["Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039575274","display_name":"Zhangming Zhu","orcid":"https://orcid.org/0000-0002-7764-1928"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhangming Zhu","raw_affiliation_strings":["Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029968632","display_name":"Ruixue Ding","orcid":"https://orcid.org/0000-0001-9296-535X"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruixue Ding","raw_affiliation_strings":["Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078781709","display_name":"Xiaoxian Liu","orcid":"https://orcid.org/0000-0002-1798-7572"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoxian Liu","raw_affiliation_strings":["Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089111829","display_name":"Qijun Lu","orcid":"https://orcid.org/0000-0001-6784-525X"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qijun Lu","raw_affiliation_strings":["Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029610013","display_name":"Xiangkun Yin","orcid":"https://orcid.org/0000-0003-2318-1257"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangkun Yin","raw_affiliation_strings":["Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100402361","display_name":"Yintang Yang","orcid":"https://orcid.org/0000-0001-9745-5404"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yintang Yang","raw_affiliation_strings":["Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi\u2019an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Shaanxi Key Lab. of Integrated Circuits and Systems School of Microelectronics, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100355682"],"corresponding_institution_ids":["https://openalex.org/I149594827"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15915389,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"11","issue":null,"first_page":"439","last_page":"442"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9495999813079834,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hfss","display_name":"HFSS","score":0.9199024438858032},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.879508376121521},{"id":"https://openalex.org/keywords/solver","display_name":"Solver","score":0.6084175109863281},{"id":"https://openalex.org/keywords/magnetic-flux","display_name":"Magnetic flux","score":0.5876172780990601},{"id":"https://openalex.org/keywords/equivalent-series-inductance","display_name":"Equivalent series inductance","score":0.5262961387634277},{"id":"https://openalex.org/keywords/flux","display_name":"Flux (metallurgy)","score":0.46245789527893066},{"id":"https://openalex.org/keywords/skin-effect","display_name":"Skin effect","score":0.4304697513580322},{"id":"https://openalex.org/keywords/electrical-reactance","display_name":"Electrical reactance","score":0.42172741889953613},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41736191511154175},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.35122957825660706},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3310593366622925},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26713305711746216},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2646641433238983},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.23039144277572632},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19807174801826477},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.194935142993927},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.07790526747703552}],"concepts":[{"id":"https://openalex.org/C2776844852","wikidata":"https://www.wikidata.org/wiki/Q106872782","display_name":"HFSS","level":4,"score":0.9199024438858032},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.879508376121521},{"id":"https://openalex.org/C2778770139","wikidata":"https://www.wikidata.org/wiki/Q1966904","display_name":"Solver","level":2,"score":0.6084175109863281},{"id":"https://openalex.org/C157479481","wikidata":"https://www.wikidata.org/wiki/Q177831","display_name":"Magnetic flux","level":3,"score":0.5876172780990601},{"id":"https://openalex.org/C141490761","wikidata":"https://www.wikidata.org/wiki/Q5384728","display_name":"Equivalent series inductance","level":4,"score":0.5262961387634277},{"id":"https://openalex.org/C68709404","wikidata":"https://www.wikidata.org/wiki/Q1134475","display_name":"Flux (metallurgy)","level":2,"score":0.46245789527893066},{"id":"https://openalex.org/C151482245","wikidata":"https://www.wikidata.org/wiki/Q664150","display_name":"Skin effect","level":2,"score":0.4304697513580322},{"id":"https://openalex.org/C87652615","wikidata":"https://www.wikidata.org/wiki/Q193972","display_name":"Electrical reactance","level":4,"score":0.42172741889953613},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41736191511154175},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.35122957825660706},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3310593366622925},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26713305711746216},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2646641433238983},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.23039144277572632},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19807174801826477},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.194935142993927},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.07790526747703552},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C170349913","wikidata":"https://www.wikidata.org/wiki/Q13402882","display_name":"Microstrip antenna","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2018.8605641","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2018.8605641","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W264431213","https://openalex.org/W1479837591","https://openalex.org/W1546496452","https://openalex.org/W1554715168","https://openalex.org/W2293070709","https://openalex.org/W2341844004","https://openalex.org/W2346894659","https://openalex.org/W2431674099","https://openalex.org/W2509592266","https://openalex.org/W2528036254","https://openalex.org/W2539236807","https://openalex.org/W2570343601","https://openalex.org/W2593384470","https://openalex.org/W2601102666","https://openalex.org/W2624875104","https://openalex.org/W2626721325","https://openalex.org/W3122078086","https://openalex.org/W6727697382","https://openalex.org/W6739589094"],"related_works":["https://openalex.org/W2316956837","https://openalex.org/W2100170713","https://openalex.org/W2124737752","https://openalex.org/W2113715247","https://openalex.org/W2158934320","https://openalex.org/W2076256803","https://openalex.org/W2169789339","https://openalex.org/W2096091201","https://openalex.org/W3157797545","https://openalex.org/W2084764973"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,11,47],"new":[4],"model":[5,65,85],"of":[6,31,73],"the":[7,19,23,28,37,40,57,71],"parasitic":[8],"inductance":[9,59,64],"using":[10],"glass":[12],"core":[13],"substrate":[14],"is":[15,44,66],"proposed.":[16],"Based":[17],"on":[18],"magnetic":[20,41],"flux":[21,42],"equation,":[22],"expressions":[24],"are":[25],"derived":[26],"considering":[27],"different":[29],"profiles":[30],"Through":[32],"Glass":[33],"Vias(TGVs).":[34],"According":[35],"to":[36,55,95],"skin":[38],"effect,":[39],"density":[43],"solved":[45],"as":[46],"frequency-varying":[48],"parameter.":[49],"The":[50,63,83],"formulas":[51],"can":[52],"be":[53],"used":[54],"calculate":[56],"self-partial":[58],"and":[60,86],"mutual-partial":[61],"inductance.":[62],"verified":[67],"by":[68],"comparing":[69],"with":[70,91],"results":[72,88],"3-D":[74],"full-wave":[75],"electromagnetic":[76],"solver":[77],"High":[78],"Frequency":[79],"Simulator":[80],"Structure":[81],"(HFSS).":[82],"proposed":[84],"HFSS":[87],"show":[89],"accordance":[90],"each":[92],"other":[93],"up":[94],"100":[96],"GHz.":[97]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}