{"id":"https://openalex.org/W2908862236","doi":"https://doi.org/10.1109/apccas.2018.8605571","title":"Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments","display_name":"Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2908862236","doi":"https://doi.org/10.1109/apccas.2018.8605571","mag":"2908862236"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2018.8605571","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2018.8605571","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036815612","display_name":"Jerrin Pathrose","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Jerrin Pathrose","raw_affiliation_strings":["Testable Design and Test of Integrated Systems Group (TDT) Centre of Telematics and Information Technology (CTIT), University of Twente, Enschede, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Testable Design and Test of Integrated Systems Group (TDT) Centre of Telematics and Information Technology (CTIT), University of Twente, Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035049481","display_name":"Ghazanfar Ali","orcid":"https://orcid.org/0000-0001-5158-8236"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Ghazanfar Ali","raw_affiliation_strings":["Testable Design and Test of Integrated Systems Group (TDT) Centre of Telematics and Information Technology (CTIT), University of Twente, Enschede, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Testable Design and Test of Integrated Systems Group (TDT) Centre of Telematics and Information Technology (CTIT), University of Twente, Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063280452","display_name":"Hans G. Kerkhoff","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Hans G. Kerkhoff","raw_affiliation_strings":["Testable Design and Test of Integrated Systems Group (TDT) Centre of Telematics and Information Technology (CTIT), University of Twente, Enschede, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Testable Design and Test of Integrated Systems Group (TDT) Centre of Telematics and Information Technology (CTIT), University of Twente, Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5036815612"],"corresponding_institution_ids":["https://openalex.org/I94624287"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18474498,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"370","last_page":"373"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9886000156402588,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9840999841690063,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.8791213631629944},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.853463351726532},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.8038589954376221},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6695809364318848},{"id":"https://openalex.org/keywords/hardware-security-module","display_name":"Hardware security module","score":0.6694868206977844},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6686212420463562},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6536355018615723},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6349989771842957},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.5965348482131958},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.5921984314918518},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.46375375986099243},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.42951348423957825},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39064496755599976},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36458003520965576},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.3638596534729004},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3607274293899536},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2491065263748169},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.103199303150177}],"concepts":[{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.8791213631629944},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.853463351726532},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.8038589954376221},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6695809364318848},{"id":"https://openalex.org/C39217717","wikidata":"https://www.wikidata.org/wiki/Q1432354","display_name":"Hardware security module","level":3,"score":0.6694868206977844},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6686212420463562},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6536355018615723},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6349989771842957},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.5965348482131958},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.5921984314918518},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.46375375986099243},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.42951348423957825},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39064496755599976},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36458003520965576},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.3638596534729004},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3607274293899536},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2491065263748169},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.103199303150177},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/apccas.2018.8605571","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2018.8605571","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/5feaaa3d-7fd5-4a64-a8d9-2a2d17fcd209","is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/5feaaa3d-7fd5-4a64-a8d9-2a2d17fcd209","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pathrose Vareed, J, Ali, G & Kerkhoff, H G 2019, Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments. in 2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)., 8605571, IEEE, pp. 370-373, 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018, Chengdu, China, 26/10/18. https://doi.org/10.1109/APCCAS.2018.8605571","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:ris.utwente.nl:publications/5feaaa3d-7fd5-4a64-a8d9-2a2d17fcd209","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7827910608","display_name":null,"funder_award_id":"unknown","funder_id":"https://openalex.org/F4320314237","funder_display_name":"Rijksdienst voor Ondernemend Nederland"}],"funders":[{"id":"https://openalex.org/F4320314237","display_name":"Rijksdienst voor Ondernemend Nederland","ror":null},{"id":"https://openalex.org/F4320327207","display_name":"Electronic Components and Systems for European Leadership","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1959150230","https://openalex.org/W2060104127","https://openalex.org/W2116374153","https://openalex.org/W2119816121","https://openalex.org/W2129830285","https://openalex.org/W2151759197","https://openalex.org/W2168174386","https://openalex.org/W2170333286","https://openalex.org/W2174648984","https://openalex.org/W2799265834","https://openalex.org/W4234056771","https://openalex.org/W4243047118"],"related_works":["https://openalex.org/W4292862360","https://openalex.org/W2896245892","https://openalex.org/W3083074270","https://openalex.org/W3094096662","https://openalex.org/W2910831494","https://openalex.org/W3081452067","https://openalex.org/W3201860997","https://openalex.org/W2367771963","https://openalex.org/W4280529582","https://openalex.org/W4382936885"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3],"methodology":[4,26],"to":[5,16,70],"improve":[6],"the":[7,23,28,59],"robustness":[8],"of":[9,30,58],"CMOS":[10,64],"physical":[11],"unclonable":[12],"functions":[13],"with":[14],"regard":[15],"environmental":[17],"parameter":[18],"variations":[19],"and":[20,44,72],"thus":[21],"enhancing":[22],"security.":[24],"The":[25,40],"exploits":[27],"reuse":[29],"embedded":[31,60],"instruments":[32,61],"which":[33,47],"are":[34],"being":[35],"deployed":[36],"for":[37,51],"dependability":[38],"purposes.":[39],"approach":[41],"is":[42,48,66],"hardware":[43],"power":[45],"efficient":[46],"especially":[49],"important":[50],"applications":[52],"such":[53],"as":[54],"IoT.":[55],"Chip":[56],"implementation":[57],"in":[62,68],"40nm":[63],"technology":[65],"presented":[67],"addition":[69],"simulations":[71],"experimental":[73],"validation":[74],"on":[75],"an":[76],"FPGA.":[77]},"counts_by_year":[],"updated_date":"2026-04-10T15:06:20.359241","created_date":"2019-01-25T00:00:00"}