{"id":"https://openalex.org/W2578906795","doi":"https://doi.org/10.1109/apccas.2016.7804013","title":"Dark current analysis of P-type and N-type pixels under total ionizing dose radiation effects","display_name":"Dark current analysis of P-type and N-type pixels under total ionizing dose radiation effects","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2578906795","doi":"https://doi.org/10.1109/apccas.2016.7804013","mag":"2578906795"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2016.7804013","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2016.7804013","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084497656","display_name":"Ran Zheng","orcid":"https://orcid.org/0000-0002-6510-6709"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ran Zheng","raw_affiliation_strings":["School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100404667","display_name":"Jia Wang","orcid":"https://orcid.org/0000-0002-9035-4747"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia Wang","raw_affiliation_strings":["School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China","institution_ids":["https://openalex.org/I17145004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5084497656"],"corresponding_institution_ids":["https://openalex.org/I17145004"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.15923659,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"499","last_page":"501"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ionizing-radiation","display_name":"Ionizing radiation","score":0.8347081542015076},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.823353111743927},{"id":"https://openalex.org/keywords/dark-current","display_name":"Dark current","score":0.6869611740112305},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.6575242280960083},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5266038179397583},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.4978296756744385},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.47292572259902954},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4647248387336731},{"id":"https://openalex.org/keywords/type","display_name":"Type (biology)","score":0.4607165455818176},{"id":"https://openalex.org/keywords/absorbed-dose","display_name":"Absorbed dose","score":0.4414176344871521},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34700965881347656},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.29475390911102295},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18515914678573608},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10990121960639954},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.09148755669593811},{"id":"https://openalex.org/keywords/photodetector","display_name":"Photodetector","score":0.0691281259059906},{"id":"https://openalex.org/keywords/biology","display_name":"Biology","score":0.0690414309501648}],"concepts":[{"id":"https://openalex.org/C18231593","wikidata":"https://www.wikidata.org/wiki/Q186161","display_name":"Ionizing radiation","level":3,"score":0.8347081542015076},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.823353111743927},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.6869611740112305},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.6575242280960083},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5266038179397583},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.4978296756744385},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.47292572259902954},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4647248387336731},{"id":"https://openalex.org/C2777299769","wikidata":"https://www.wikidata.org/wiki/Q3707858","display_name":"Type (biology)","level":2,"score":0.4607165455818176},{"id":"https://openalex.org/C151337348","wikidata":"https://www.wikidata.org/wiki/Q215313","display_name":"Absorbed dose","level":3,"score":0.4414176344871521},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34700965881347656},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.29475390911102295},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18515914678573608},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10990121960639954},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.09148755669593811},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.0691281259059906},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0690414309501648},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2016.7804013","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2016.7804013","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2035885601","https://openalex.org/W2037431565","https://openalex.org/W2080433909","https://openalex.org/W2101451984","https://openalex.org/W2157888528","https://openalex.org/W2744769585"],"related_works":["https://openalex.org/W2798735802","https://openalex.org/W4206616768","https://openalex.org/W4206147900","https://openalex.org/W4302768515","https://openalex.org/W2911908587","https://openalex.org/W2984363285","https://openalex.org/W4312636437","https://openalex.org/W2059549055","https://openalex.org/W2070522760","https://openalex.org/W2033441674"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3],"custom-designed":[4],"CMOS":[5],"image":[6],"sensor":[7],"(CIS)":[8],"is":[9,24,64],"proposed":[10,28],"with":[11,46,53],"N-type":[12,54,71],"and":[13],"P-type":[14,36,62],"pixels":[15,37,63],"fabricated":[16],"on":[17,26],"one":[18],"chip.":[19,30],"A":[20],"Co":[21],"radiation":[22,44,48,75],"experiment":[23],"implemented":[25],"the":[27,35,57],"CIS":[29],"Measurement":[31],"results":[32],"shows":[33],"that":[34],"have":[38],"good":[39],"total":[40],"ionizing":[41],"dose":[42],"(TID)":[43],"tolerance":[45],"less":[47],"induced":[49],"dark":[50,58],"current":[51,59],"compared":[52],"pixels.":[55],"But":[56],"nonuniformity":[60],"of":[61],"observed":[65],"to":[66],"be":[67],"enhanced":[68],"more":[69],"than":[70],"ones":[72],"by":[73],"TID":[74],"effect.":[76]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-01-13T01:12:25.745995","created_date":"2025-10-10T00:00:00"}