{"id":"https://openalex.org/W2572792030","doi":"https://doi.org/10.1109/apccas.2016.7803976","title":"Mixed error correction scheme and its design optimization for soft-error tolerant datapaths","display_name":"Mixed error correction scheme and its design optimization for soft-error tolerant datapaths","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2572792030","doi":"https://doi.org/10.1109/apccas.2016.7803976","mag":"2572792030"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2016.7803976","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2016.7803976","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045781110","display_name":"Junghoon Oh","orcid":"https://orcid.org/0000-0002-6194-8044"},"institutions":[{"id":"https://openalex.org/I177738480","display_name":"Japan Advanced Institute of Science and Technology","ror":"https://ror.org/03frj4r98","country_code":"JP","type":"education","lineage":["https://openalex.org/I177738480"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Junghoon Oh","raw_affiliation_strings":["School of Information Science, Japan Advanced Institute of Science and Technology, Ishikawa, Japan"],"affiliations":[{"raw_affiliation_string":"School of Information Science, Japan Advanced Institute of Science and Technology, Ishikawa, Japan","institution_ids":["https://openalex.org/I177738480"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112420841","display_name":"Mineo Kaneko","orcid":null},"institutions":[{"id":"https://openalex.org/I177738480","display_name":"Japan Advanced Institute of Science and Technology","ror":"https://ror.org/03frj4r98","country_code":"JP","type":"education","lineage":["https://openalex.org/I177738480"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mineo Kaneko","raw_affiliation_strings":["School of Information Science, Japan Advanced Institute of Science and Technology, Ishikawa, Japan"],"affiliations":[{"raw_affiliation_string":"School of Information Science, Japan Advanced Institute of Science and Technology, Ishikawa, Japan","institution_ids":["https://openalex.org/I177738480"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5045781110"],"corresponding_institution_ids":["https://openalex.org/I177738480"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15517304,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2016","issue":null,"first_page":"362","last_page":"365"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/datapath","display_name":"Datapath","score":0.9571442604064941},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8631196022033691},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7587182521820068},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6714638471603394},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.6401050090789795},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5898970365524292},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4982304573059082},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.47085708379745483},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4357856810092926},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3902341425418854},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.357729434967041},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3250278830528259},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.27076053619384766},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1852996051311493},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10538053512573242},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09258061647415161}],"concepts":[{"id":"https://openalex.org/C2781198647","wikidata":"https://www.wikidata.org/wiki/Q1633673","display_name":"Datapath","level":2,"score":0.9571442604064941},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8631196022033691},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7587182521820068},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6714638471603394},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.6401050090789795},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5898970365524292},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4982304573059082},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.47085708379745483},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4357856810092926},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3902341425418854},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.357729434967041},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3250278830528259},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.27076053619384766},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1852996051311493},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10538053512573242},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09258061647415161},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/apccas.2016.7803976","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2016.7803976","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},{"id":"mag:2751920058","is_oa":false,"landing_page_url":"http://jglobal.jst.go.jp/en/public/20090422/201702218354585584","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1967513295","https://openalex.org/W1972994536","https://openalex.org/W1981279817","https://openalex.org/W2055795812","https://openalex.org/W2071324390","https://openalex.org/W2092402931","https://openalex.org/W2134706312","https://openalex.org/W2138815251","https://openalex.org/W2153079001","https://openalex.org/W2474527864","https://openalex.org/W2518357287"],"related_works":["https://openalex.org/W2534955606","https://openalex.org/W1547739295","https://openalex.org/W2572792030","https://openalex.org/W2518357287","https://openalex.org/W2158463942","https://openalex.org/W1906576859","https://openalex.org/W2110991008","https://openalex.org/W2000201823","https://openalex.org/W2042832476","https://openalex.org/W2116314988"],"abstract_inverted_index":{"Due":[0],"to":[1,21,59,75],"the":[2,54,63,81,89,92],"downsizing":[3],"of":[4,44,53,62,65,80,91,95],"VLSI,":[5],"reliability":[6],"issues":[7],"caused":[8],"by":[9],"soft-errors":[10],"have":[11,23],"become":[12],"more":[13],"explicit.":[14],"Several":[15],"studies":[16],"in":[17,101],"system":[18],"level":[19],"approach":[20],"date":[22],"proposed":[24],"transient":[25],"fault-tolerant":[26],"datapaths":[27],"with":[28],"comparison-retry":[29],"based":[30,33],"or":[31],"majority-voting":[32],"error":[34,56,96],"correction":[35,57,97],"schemes.":[36,83],"In":[37,68],"this":[38],"paper,":[39],"considering":[40],"both":[41],"efficient":[42],"use":[43],"resources":[45],"and":[46],"latency":[47],"reduction,":[48],"we":[49,70],"introduce":[50],"a":[51,72,77],"combination":[52,90],"two":[55,82,93],"schemes":[58],"take":[60],"advantage":[61],"strengths":[64],"each":[66],"scheme.":[67],"addition,":[69],"propose":[71],"heuristic":[73],"algorithm":[74],"find":[76],"latency-optimized":[78],"integration":[79],"Datapath":[84],"synthesis":[85],"experiments":[86],"reveal":[87],"that":[88],"types":[94],"methods":[98],"achieves":[99],"improvements":[100],"latency.":[102]},"counts_by_year":[],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}