{"id":"https://openalex.org/W1984480206","doi":"https://doi.org/10.1109/apccas.2014.7032877","title":"Comparative study of power-gating architectures for nonvolatile SRAM cells based on spintronics technology","display_name":"Comparative study of power-gating architectures for nonvolatile SRAM cells based on spintronics technology","publication_year":2014,"publication_date":"2014-11-01","ids":{"openalex":"https://openalex.org/W1984480206","doi":"https://doi.org/10.1109/apccas.2014.7032877","mag":"1984480206"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2014.7032877","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2014.7032877","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039319356","display_name":"Yusuke Shuto","orcid":"https://orcid.org/0000-0001-9904-6372"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]},{"id":"https://openalex.org/I4210154135","display_name":"Kanagawa Academy of Science and Technology","ror":"https://ror.org/04yvd9h56","country_code":"JP","type":"nonprofit","lineage":["https://openalex.org/I4210154135"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yusuke Shuto","raw_affiliation_strings":["Imaging Science and Engineering Laboratory, Japan Kanagawa Academy of Science and Technology, Kawasaki, Japan","Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama, Japan., Kanagawa Academy of Science and Technology, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imaging Science and Engineering Laboratory, Japan Kanagawa Academy of Science and Technology, Kawasaki, Japan","institution_ids":["https://openalex.org/I4210154135"]},{"raw_affiliation_string":"Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama, Japan., Kanagawa Academy of Science and Technology, Kawasaki, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100828005","display_name":"Shuu\u2019ichirou Yamamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]},{"id":"https://openalex.org/I4210154135","display_name":"Kanagawa Academy of Science and Technology","ror":"https://ror.org/04yvd9h56","country_code":"JP","type":"nonprofit","lineage":["https://openalex.org/I4210154135"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shuu'ichirou Yamamoto","raw_affiliation_strings":["Imaging Science and Engineering Laboratory, Japan Kanagawa Academy of Science and Technology, Kawasaki, Japan","Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama, Japan., Kanagawa Academy of Science and Technology, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imaging Science and Engineering Laboratory, Japan Kanagawa Academy of Science and Technology, Kawasaki, Japan","institution_ids":["https://openalex.org/I4210154135"]},{"raw_affiliation_string":"Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama, Japan., Kanagawa Academy of Science and Technology, Kawasaki, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102876507","display_name":"Satoshi Sugahara","orcid":"https://orcid.org/0000-0002-6918-3218"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]},{"id":"https://openalex.org/I4210154135","display_name":"Kanagawa Academy of Science and Technology","ror":"https://ror.org/04yvd9h56","country_code":"JP","type":"nonprofit","lineage":["https://openalex.org/I4210154135"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Sugahara","raw_affiliation_strings":["Imaging Science and Engineering Laboratory, Japan Kanagawa Academy of Science and Technology, Kawasaki, Japan","Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama, Japan., Kanagawa Academy of Science and Technology, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imaging Science and Engineering Laboratory, Japan Kanagawa Academy of Science and Technology, Kawasaki, Japan","institution_ids":["https://openalex.org/I4210154135"]},{"raw_affiliation_string":"Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama, Japan., Kanagawa Academy of Science and Technology, Kawasaki, Japan","institution_ids":["https://openalex.org/I114531698"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0647,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.79743776,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"699","last_page":"702"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spintronics","display_name":"Spintronics","score":0.8512534499168396},{"id":"https://openalex.org/keywords/power-gating","display_name":"Power gating","score":0.7469969987869263},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.5295903086662292},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5225452780723572},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4778009057044983},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.46961408853530884},{"id":"https://openalex.org/keywords/gating","display_name":"Gating","score":0.46771520376205444},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43379899859428406},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3789002299308777},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3335551619529724},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3274574279785156},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24597859382629395},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.17321047186851501},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.16742569208145142},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1326303780078888},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09836778044700623},{"id":"https://openalex.org/keywords/ferromagnetism","display_name":"Ferromagnetism","score":0.06789276003837585}],"concepts":[{"id":"https://openalex.org/C207999682","wikidata":"https://www.wikidata.org/wiki/Q258659","display_name":"Spintronics","level":3,"score":0.8512534499168396},{"id":"https://openalex.org/C2780700455","wikidata":"https://www.wikidata.org/wiki/Q7236515","display_name":"Power gating","level":4,"score":0.7469969987869263},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.5295903086662292},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5225452780723572},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4778009057044983},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.46961408853530884},{"id":"https://openalex.org/C194544171","wikidata":"https://www.wikidata.org/wiki/Q21105679","display_name":"Gating","level":2,"score":0.46771520376205444},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43379899859428406},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3789002299308777},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3335551619529724},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3274574279785156},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24597859382629395},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.17321047186851501},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.16742569208145142},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1326303780078888},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09836778044700623},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.06789276003837585},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C42407357","wikidata":"https://www.wikidata.org/wiki/Q521","display_name":"Physiology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2014.7032877","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2014.7032877","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8999999761581421}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1510118898","https://openalex.org/W1986671205","https://openalex.org/W1994065394","https://openalex.org/W2005699311","https://openalex.org/W2012923077","https://openalex.org/W2048592125","https://openalex.org/W2050565026","https://openalex.org/W2051723232","https://openalex.org/W2073801038","https://openalex.org/W2084192944","https://openalex.org/W2099231065","https://openalex.org/W2114621701","https://openalex.org/W2145212071","https://openalex.org/W2150049803","https://openalex.org/W2473895362","https://openalex.org/W3098517937","https://openalex.org/W3169681048","https://openalex.org/W4249082054","https://openalex.org/W6630436817"],"related_works":["https://openalex.org/W2186918296","https://openalex.org/W2259094912","https://openalex.org/W2783549708","https://openalex.org/W3092470009","https://openalex.org/W2942190539","https://openalex.org/W3126087940","https://openalex.org/W2371329481","https://openalex.org/W2399345582","https://openalex.org/W4237548795","https://openalex.org/W1984480206"],"abstract_inverted_index":{"Power-gating":[0],"(PG)":[1],"architectures":[2,27,135],"employing":[3,136],"nonvolatile":[4,29,39,43,48,52,57,92,138],"state/data":[5],"retention":[6,30,58,93,139],"are":[7,140],"expected":[8],"to":[9],"be":[10,109],"a":[11,112,146],"highly":[12,147],"efficient":[13],"energy":[14,158,169],"reduction":[15,156,170],"technique":[16],"for":[17],"advanced":[18],"CMOS":[19],"logic":[20],"systems.":[21],"Recently,":[22],"two":[23,133],"types":[24],"of":[25,119,157],"PG":[26,40,134],"using":[28,42,143],"have":[31],"been":[32],"proposed:":[33],"One":[34],"architecture":[35,90,120,153,166],"is":[36,59,70,121],"our":[37],"proposed":[38],"(NVPG)":[41],"bistable":[44],"circuits":[45],"such":[46],"as":[47],"SRAM":[49],"(NV-SRAM)":[50],"and":[51,68,115,172],"flip-flop":[53],"(NV-FF),":[54],"in":[55],"which":[56],"not":[60],"utilized":[61],"during":[62,94],"the":[63,88,95,164],"normal":[64,96],"SRAM/FF":[65,97],"operation":[66,98],"mode":[67],"it":[69],"used":[71],"only":[72],"when":[73],"there":[74],"exist":[75],"an":[76,103],"energetically":[77],"meaningful":[78],"shutdown":[79,113],"periods":[80],"given":[81],"by":[82,111],"break-even":[83],"time":[84],"(BET).":[85],"In":[86,100,129],"contrast,":[87],"other":[89],"employs":[91],"mode.":[99],"this":[101,117,130],"architecture,":[102],"even":[104],"short":[105],"standby":[106],"period":[107],"can":[108],"replaced":[110],"period,":[114],"thus":[116],"type":[118],"also":[122],"called":[123],"normally-off":[124],"(NOF)":[125],"rather":[126],"than":[127],"PG.":[128],"paper,":[131],"these":[132],"spintronics-based":[137],"systematically":[141],"analyzed":[142],"HSPICE":[144],"with":[145],"accurate":[148],"magnetoresistive-device":[149],"macromodel.":[150],"The":[151],"NVPG":[152],"shows":[154],"effective":[155],"dissipation":[159],"without":[160],"performance":[161,175],"degradation,":[162],"while":[163],"NOF":[165],"has":[167],"no":[168],"effect":[171],"causes":[173],"severe":[174],"degradation.":[176]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}