{"id":"https://openalex.org/W2010452589","doi":"https://doi.org/10.1109/apccas.2012.6419108","title":"State dependent scan flip-flop with key-based configuration against scan-based side channel attack on RSA circuit","display_name":"State dependent scan flip-flop with key-based configuration against scan-based side channel attack on RSA circuit","publication_year":2012,"publication_date":"2012-12-01","ids":{"openalex":"https://openalex.org/W2010452589","doi":"https://doi.org/10.1109/apccas.2012.6419108","mag":"2010452589"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2012.6419108","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2012.6419108","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002628606","display_name":"Yuta Atobe","orcid":null},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yuta Atobe","raw_affiliation_strings":["Department of Computer Science and Engineering, Waseda University, Japan","Dept. of Computer Science and Engineering, Waseda Univ., Japan"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Waseda University, Japan","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"Dept. of Computer Science and Engineering, Waseda Univ., Japan","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056061175","display_name":"Youhua Shi","orcid":"https://orcid.org/0000-0002-1473-9776"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Youhua Shi","raw_affiliation_strings":["Department of Computer Science and Engineering, Waseda University, Japan","Dept. of Computer Science and Engineering, Waseda Univ., Japan"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Waseda University, Japan","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"Dept. of Computer Science and Engineering, Waseda Univ., Japan","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061982025","display_name":"Masao Yanagisawa","orcid":"https://orcid.org/0000-0002-5168-3214"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masao Yanagisawa","raw_affiliation_strings":["Department of Computer Science and Engineering, Waseda University, Japan","Dept. of Computer Science and Engineering, Waseda Univ., Japan"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Waseda University, Japan","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"Dept. of Computer Science and Engineering, Waseda Univ., Japan","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087516286","display_name":"Nozomu Togawa","orcid":"https://orcid.org/0000-0003-3400-3587"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nozomu Togawa","raw_affiliation_strings":["Department of Computer Science and Engineering, Waseda University, Japan","Dept. of Computer Science and Engineering, Waseda Univ., Japan"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Waseda University, Japan","institution_ids":["https://openalex.org/I150744194"]},{"raw_affiliation_string":"Dept. of Computer Science and Engineering, Waseda Univ., Japan","institution_ids":["https://openalex.org/I150744194"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5002628606"],"corresponding_institution_ids":["https://openalex.org/I150744194"],"apc_list":null,"apc_paid":null,"fwci":0.2901,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.54740491,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"607","last_page":"610"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.9198389649391174},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8579612970352173},{"id":"https://openalex.org/keywords/side-channel-attack","display_name":"Side channel attack","score":0.8008386492729187},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7024106383323669},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6459689736366272},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.5990664958953857},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5381646156311035},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4649113118648529},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.41350769996643066},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.32317396998405457},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.22449713945388794},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.21994218230247498},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.1916150152683258},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.18259871006011963},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15903723239898682}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.9198389649391174},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8579612970352173},{"id":"https://openalex.org/C49289754","wikidata":"https://www.wikidata.org/wiki/Q2267081","display_name":"Side channel attack","level":3,"score":0.8008386492729187},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7024106383323669},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6459689736366272},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.5990664958953857},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5381646156311035},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4649113118648529},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.41350769996643066},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.32317396998405457},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.22449713945388794},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.21994218230247498},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.1916150152683258},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.18259871006011963},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15903723239898682},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2012.6419108","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2012.6419108","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1992008051","https://openalex.org/W2023450006","https://openalex.org/W2068598243","https://openalex.org/W2101017779","https://openalex.org/W2141624968","https://openalex.org/W2156692142","https://openalex.org/W2550198774"],"related_works":["https://openalex.org/W2130364905","https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2765347974","https://openalex.org/W3006344745","https://openalex.org/W2553035740","https://openalex.org/W182679101","https://openalex.org/W2150046587","https://openalex.org/W2010452589","https://openalex.org/W4386374027"],"abstract_inverted_index":{"Scan":[0],"test":[1],"is":[2,45,74,89,125],"one":[3],"of":[4,116],"the":[5,82,94,100,114,117],"useful":[6],"design":[7,51],"for":[8,52],"testability":[9,36,53,60],"techniques,":[10],"which":[11],"can":[12],"detect":[13],"circuit":[14,54,110],"failure":[15],"efficiently.":[16],"However,":[17],"it":[18],"has":[19],"been":[20],"reported":[21],"that":[22],"it's":[23],"possible":[24],"to":[25,40,48,57,76,96,112,127],"retrieve":[26],"secret":[27],"keys":[28],"from":[29],"cryptographic":[30],"LSIs":[31],"through":[32],"scan":[33,69,87,101],"chains.":[34],"Therefore":[35],"and":[37,43,61,120],"security":[38,62,79],"contradicted":[39],"each":[41],"other,":[42],"there":[44],"a":[46,67],"need":[47],"an":[49,105,108],"efficient":[50],"so":[55],"as":[56],"satisfy":[58],"both":[59],"requirement.":[63],"In":[64,84],"this":[65],"paper,":[66],"secure":[68],"architecture":[70],"against":[71],"scan-based":[72,128],"attack":[73],"proposed":[75,118],"achieve":[77],"high":[78],"without":[80],"compromising":[81],"testability.":[83],"our":[85,123],"method,":[86],"structure":[88],"dynamically":[90],"changed":[91],"by":[92],"adding":[93],"latch":[95],"any":[97],"FFs":[98],"in":[99],"chain.":[102],"We":[103],"made":[104],"analysis":[106],"on":[107],"RSA":[109],"implementation":[111],"show":[113],"effectiveness":[115],"method":[119],"discussed":[121],"how":[122],"approach":[124],"resistant":[126],"attack.":[129]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}