{"id":"https://openalex.org/W2028269581","doi":"https://doi.org/10.1109/apccas.2012.6419049","title":"A design for testability of non-volatile memory reliability test for automotive embedded processor","display_name":"A design for testability of non-volatile memory reliability test for automotive embedded processor","publication_year":2012,"publication_date":"2012-12-01","ids":{"openalex":"https://openalex.org/W2028269581","doi":"https://doi.org/10.1109/apccas.2012.6419049","mag":"2028269581"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2012.6419049","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2012.6419049","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083220221","display_name":"Chung Chuang","orcid":null},"institutions":[{"id":"https://openalex.org/I142066694","display_name":"ITRI International","ror":"https://ror.org/04wwsbd59","country_code":"US","type":"facility","lineage":["https://openalex.org/I142066694"]},{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW","US"],"is_corresponding":true,"raw_author_name":"Chung Chuang","raw_affiliation_strings":["Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]},{"raw_affiliation_string":"[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]","institution_ids":["https://openalex.org/I142066694"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011833797","display_name":"Chun-Yen Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I142066694","display_name":"ITRI International","ror":"https://ror.org/04wwsbd59","country_code":"US","type":"facility","lineage":["https://openalex.org/I142066694"]},{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Chun-Yen Wu","raw_affiliation_strings":["Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]},{"raw_affiliation_string":"[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]","institution_ids":["https://openalex.org/I142066694"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113586574","display_name":"Chi-Chun Hsu","orcid":null},"institutions":[{"id":"https://openalex.org/I142066694","display_name":"ITRI International","ror":"https://ror.org/04wwsbd59","country_code":"US","type":"facility","lineage":["https://openalex.org/I142066694"]},{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Chi-Chun Hsu","raw_affiliation_strings":["Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]},{"raw_affiliation_string":"[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]","institution_ids":["https://openalex.org/I142066694"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019020209","display_name":"Liren Huang","orcid":"https://orcid.org/0000-0002-2180-1937"},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]},{"id":"https://openalex.org/I142066694","display_name":"ITRI International","ror":"https://ror.org/04wwsbd59","country_code":"US","type":"facility","lineage":["https://openalex.org/I142066694"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Li-Ren Huang","raw_affiliation_strings":["Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]},{"raw_affiliation_string":"[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]","institution_ids":["https://openalex.org/I142066694"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059489310","display_name":"Wei-Min Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I142066694","display_name":"ITRI International","ror":"https://ror.org/04wwsbd59","country_code":"US","type":"facility","lineage":["https://openalex.org/I142066694"]},{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Wei-Min Cheng","raw_affiliation_strings":["Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]},{"raw_affiliation_string":"[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]","institution_ids":["https://openalex.org/I142066694"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019029138","display_name":"Wen-Dar Hsieh","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]},{"id":"https://openalex.org/I142066694","display_name":"ITRI International","ror":"https://ror.org/04wwsbd59","country_code":"US","type":"facility","lineage":["https://openalex.org/I142066694"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Wen-Dar Hsieh","raw_affiliation_strings":["Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]},{"raw_affiliation_string":"[Information and Communication Research Lab, Industrial Technology Research Institute, Hsinchu, Taiwan]","institution_ids":["https://openalex.org/I142066694"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5083220221"],"corresponding_institution_ids":["https://openalex.org/I142066694","https://openalex.org/I4210148468"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09743301,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"372","last_page":"375"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.680026113986969},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6532893776893616},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.6241292953491211},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5992506146430969},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.5504357814788818},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5400133728981018},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.47693151235580444},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46552011370658875},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1949324905872345}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.680026113986969},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6532893776893616},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6241292953491211},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5992506146430969},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.5504357814788818},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5400133728981018},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.47693151235580444},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46552011370658875},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1949324905872345},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2012.6419049","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2012.6419049","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2079486027","https://openalex.org/W2082455736","https://openalex.org/W2164679870"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W3037788266","https://openalex.org/W2157191248","https://openalex.org/W2132658806","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253"],"abstract_inverted_index":{"The":[0,70],"reliability":[1,60,79],"of":[2,32,62,81],"non-volatile":[3,50,63],"memory":[4,64,109],"is":[5,68,89],"a":[6,47,55],"very":[7],"important":[8],"and":[9,26,35,108],"critical":[10],"issue":[11],"for":[12,58,77],"automotive":[13,82],"embedded":[14,49,66],"processors.":[15],"In":[16,52],"addition":[17],"to":[18,45,95],"the":[19,30,59,75,78,85,92,98,103,106],"reliable":[20,48],"cell":[21],"as":[22,24],"well":[23],"read":[25],"write":[27],"circuitry":[28],"design,":[29],"testing":[31,99],"endurance,":[33],"burn-in,":[34],"run":[36],"time":[37],"safety":[38,107],"design":[39],"are":[40],"all":[41,97],"required":[42],"in":[43,65,91],"order":[44],"provide":[46],"memory.":[51],"this":[53],"paper,":[54],"novel":[56],"architecture":[57],"test":[61,80],"processor":[67],"proposed.":[69],"proposed":[71,93,104],"approach":[72],"especially":[73],"meets":[74],"requirement":[76],"electronics.":[83],"Moreover,":[84],"extra":[86],"hardware":[87],"cost":[88],"minimized":[90],"methodology":[94],"cover":[96],"requirements.":[100],"By":[101],"applying":[102],"approach,":[105],"space":[110],"usage":[111],"can":[112],"be":[113],"further":[114],"optimized.":[115]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}