{"id":"https://openalex.org/W2080332875","doi":"https://doi.org/10.1109/apccas.2010.5774931","title":"Low-noise readout circuits with a response time acceleration technique for high output impedance sensors","display_name":"Low-noise readout circuits with a response time acceleration technique for high output impedance sensors","publication_year":2010,"publication_date":"2010-12-01","ids":{"openalex":"https://openalex.org/W2080332875","doi":"https://doi.org/10.1109/apccas.2010.5774931","mag":"2080332875"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2010.5774931","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2010.5774931","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018860406","display_name":"Kamel Mars","orcid":"https://orcid.org/0000-0002-1587-6465"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Kamel Mars","raw_affiliation_strings":["Graduate School of science and Technology, Shizuoka University, Hamamatsu, Japan","Graduate School of science and Technology, Shizuoka University, Hamamatsu, Japan 432-8011"],"affiliations":[{"raw_affiliation_string":"Graduate School of science and Technology, Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"Graduate School of science and Technology, Shizuoka University, Hamamatsu, Japan 432-8011","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065338590","display_name":"Shoji Kawahito","orcid":"https://orcid.org/0000-0003-4456-5006"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shoji Kawahito","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan 432-8011"],"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan 432-8011","institution_ids":["https://openalex.org/I1298590031"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5018860406"],"corresponding_institution_ids":["https://openalex.org/I1298590031"],"apc_list":null,"apc_paid":null,"fwci":0.5773,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.72307801,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"3360","issue":null,"first_page":"1159","last_page":"1162"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6408929228782654},{"id":"https://openalex.org/keywords/acceleration","display_name":"Acceleration","score":0.5804930329322815},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5556466579437256},{"id":"https://openalex.org/keywords/rc-circuit","display_name":"RC circuit","score":0.5466381907463074},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5294812917709351},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5108913779258728},{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.4950388967990875},{"id":"https://openalex.org/keywords/noise-generator","display_name":"Noise generator","score":0.4891667664051056},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4807888865470886},{"id":"https://openalex.org/keywords/high-impedance","display_name":"High impedance","score":0.4640665650367737},{"id":"https://openalex.org/keywords/y-factor","display_name":"Y-factor","score":0.4635222852230072},{"id":"https://openalex.org/keywords/schmitt-trigger","display_name":"Schmitt trigger","score":0.4523797631263733},{"id":"https://openalex.org/keywords/effective-input-noise-temperature","display_name":"Effective input noise temperature","score":0.44820573925971985},{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.43003422021865845},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4279583692550659},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41936856508255005},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.35168153047561646},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.28298985958099365},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.28108924627304077},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.27356815338134766},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2683495283126831},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24295595288276672},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.13585582375526428}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6408929228782654},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.5804930329322815},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5556466579437256},{"id":"https://openalex.org/C39394816","wikidata":"https://www.wikidata.org/wiki/Q939318","display_name":"RC circuit","level":4,"score":0.5466381907463074},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5294812917709351},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5108913779258728},{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.4950388967990875},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.4891667664051056},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4807888865470886},{"id":"https://openalex.org/C174268685","wikidata":"https://www.wikidata.org/wiki/Q769127","display_name":"High impedance","level":3,"score":0.4640665650367737},{"id":"https://openalex.org/C166576357","wikidata":"https://www.wikidata.org/wiki/Q8045715","display_name":"Y-factor","level":5,"score":0.4635222852230072},{"id":"https://openalex.org/C90201813","wikidata":"https://www.wikidata.org/wiki/Q202957","display_name":"Schmitt trigger","level":3,"score":0.4523797631263733},{"id":"https://openalex.org/C12252657","wikidata":"https://www.wikidata.org/wiki/Q5347266","display_name":"Effective input noise temperature","level":5,"score":0.44820573925971985},{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.43003422021865845},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4279583692550659},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41936856508255005},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.35168153047561646},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.28298985958099365},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.28108924627304077},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.27356815338134766},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2683495283126831},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24295595288276672},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.13585582375526428},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2010.5774931","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2010.5774931","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1667165204","https://openalex.org/W2028655976","https://openalex.org/W2050877753","https://openalex.org/W2068044605","https://openalex.org/W2071136177","https://openalex.org/W2089161008","https://openalex.org/W2094166220","https://openalex.org/W2112370080","https://openalex.org/W4301253858","https://openalex.org/W7024001005"],"related_works":["https://openalex.org/W1993596838","https://openalex.org/W2131553985","https://openalex.org/W2071806754","https://openalex.org/W2153388028","https://openalex.org/W2038032318","https://openalex.org/W1579628402","https://openalex.org/W4281727447","https://openalex.org/W1993664839","https://openalex.org/W2735512810","https://openalex.org/W2945304421"],"abstract_inverted_index":{"In":[0,21],"this":[1],"paper,":[2],"a":[3,9,26,38],"low-noise":[4],"high-gain":[5],"read-out":[6],"circuit":[7,79],"with":[8],"response":[10,58,72,80],"time":[11,59,73,81],"acceleration":[12,74],"technique":[13,70],"for":[14,71],"high":[15,52],"output":[16,53],"impedance":[17,54],"sensors":[18,56],"is":[19,48,60,75],"presented.":[20],"the":[22,30,44,57,64,78,85],"readout":[23],"circuits":[24],"using":[25],"switched":[27],"capacitor":[28],"amplifier,":[29],"thermal":[31],"noise":[32,40,66,86],"can":[33],"be":[34],"greatly":[35],"reduced":[36],"if":[37],"reset":[39],"component":[41],"sampled":[42],"at":[43],"charge":[45],"summing":[46],"node":[47],"canceled.":[49],"Due":[50],"to":[51,62],"of":[55],"large":[61],"achieve":[63],"low":[65],"requirement.":[67],"A":[68],"new":[69],"presented":[76],"making":[77],"faster":[82],"white":[83],"keeping":[84],"level":[87],"unaffected.":[88]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}