{"id":"https://openalex.org/W2132267693","doi":"https://doi.org/10.1109/apccas.2010.5774755","title":"ADC linearity test signal generation algorithm","display_name":"ADC linearity test signal generation algorithm","publication_year":2010,"publication_date":"2010-12-01","ids":{"openalex":"https://openalex.org/W2132267693","doi":"https://doi.org/10.1109/apccas.2010.5774755","mag":"2132267693"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2010.5774755","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2010.5774755","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010998471","display_name":"Satoshi Uemori","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Satoshi Uemori","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010763159","display_name":"Takahiro Yamaguchi","orcid":"https://orcid.org/0000-0003-0325-8878"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro J. Yamaguchi","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054591359","display_name":"Satoshi Ito","orcid":"https://orcid.org/0000-0003-2550-8153"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Ito","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011936350","display_name":"Yohei Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yohei Tan","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101691738","display_name":"Haruo Kobayashi","orcid":"https://orcid.org/0000-0002-0990-5522"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Kobayashi","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054795734","display_name":"Nobukazu Takai","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobukazu Takai","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056677721","display_name":"Kiichi Niitsu","orcid":"https://orcid.org/0000-0002-3813-3955"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kiichi Niitsu","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021478356","display_name":"Nobuyoshi Ishikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobuyoshi Ishikawa","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5010998471"],"corresponding_institution_ids":["https://openalex.org/I165735259"],"apc_list":null,"apc_paid":null,"fwci":1.2484,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.81748097,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"44","last_page":"47"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.8157080411911011},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6685420274734497},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.6436985731124878},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6261565089225769},{"id":"https://openalex.org/keywords/signal-generator","display_name":"Signal generator","score":0.6067631244659424},{"id":"https://openalex.org/keywords/matlab","display_name":"MATLAB","score":0.5331807732582092},{"id":"https://openalex.org/keywords/arbitrary-waveform-generator","display_name":"Arbitrary waveform generator","score":0.5280754566192627},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5212891101837158},{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.5123032331466675},{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.4966049790382385},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.41140344738960266},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40138208866119385},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.147874653339386},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.14252546429634094},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11041432619094849},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10043755173683167},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.09235432744026184},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08453911542892456},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.07957381010055542}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.8157080411911011},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6685420274734497},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6436985731124878},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6261565089225769},{"id":"https://openalex.org/C207912722","wikidata":"https://www.wikidata.org/wiki/Q1259123","display_name":"Signal generator","level":3,"score":0.6067631244659424},{"id":"https://openalex.org/C2780365114","wikidata":"https://www.wikidata.org/wiki/Q169478","display_name":"MATLAB","level":2,"score":0.5331807732582092},{"id":"https://openalex.org/C108307224","wikidata":"https://www.wikidata.org/wiki/Q629983","display_name":"Arbitrary waveform generator","level":4,"score":0.5280754566192627},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5212891101837158},{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.5123032331466675},{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.4966049790382385},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.41140344738960266},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40138208866119385},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.147874653339386},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14252546429634094},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11041432619094849},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10043755173683167},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.09235432744026184},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08453911542892456},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.07957381010055542},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2010.5774755","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2010.5774755","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2084128131","https://openalex.org/W2105657695","https://openalex.org/W2109570325","https://openalex.org/W2111032961","https://openalex.org/W2340870620","https://openalex.org/W2581184410","https://openalex.org/W3127500035","https://openalex.org/W6671256958","https://openalex.org/W6676259397","https://openalex.org/W6704168006","https://openalex.org/W6991241010","https://openalex.org/W7065285921"],"related_works":["https://openalex.org/W2027674118","https://openalex.org/W2359958174","https://openalex.org/W2383009597","https://openalex.org/W2394052960","https://openalex.org/W2373617816","https://openalex.org/W2362691368","https://openalex.org/W2390892592","https://openalex.org/W2394008940","https://openalex.org/W2375125665","https://openalex.org/W2377478450"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"an":[3,18,70,76],"algorithm":[4],"for":[5,22,56,105],"generating":[6],"test":[7,11,34,44,53],"signals":[8],"to":[9,33,41,51,84,102],"efficiently":[10],"the":[12,54,63,66,89,96],"linearity":[13,55],"of":[14,47,65],"ADCs.":[15,37],"Linearity":[16],"is":[17,31],"important":[19,58],"testing":[20,97],"item":[21],"ADCs,":[23],"and":[24,75,88],"it":[25],"takes":[26],"a":[27,43],"long":[28],"time":[29,98],"(hence":[30],"costly)":[32],"low-sampling-rate,":[35],"high-resolution":[36],"We":[38,79],"here":[39],"propose":[40],"generate":[42],"signal":[45],"consisting":[46],"multiple":[48],"sine":[49,107],"waves,":[50],"precisely":[52],"specific":[57],"codes":[59],"(such":[60],"as":[61],"around":[62],"center":[64],"output":[67],"codes),":[68],"using":[69],"arbitrary":[71],"waveform":[72],"generator":[73],"(AWG)":[74],"analog":[77],"filter.":[78],"have":[80],"performed":[81],"MATLAB":[82],"simulation":[83],"validate":[85],"our":[86],"algorithm,":[87],"results":[90],"show":[91],"that":[92,104],"in":[93],"some":[94],"cases":[95],"can":[99],"be":[100],"reduced":[101],"half":[103],"conventional":[106],"wave":[108],"histogram":[109],"testing.":[110]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}