{"id":"https://openalex.org/W2135469543","doi":"https://doi.org/10.1109/apccas.2010.5774747","title":"Non-binary SAR ADC with digital error correction for low power applications","display_name":"Non-binary SAR ADC with digital error correction for low power applications","publication_year":2010,"publication_date":"2010-12-01","ids":{"openalex":"https://openalex.org/W2135469543","doi":"https://doi.org/10.1109/apccas.2010.5774747","mag":"2135469543"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2010.5774747","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2010.5774747","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102259663","display_name":"Tomohiko Ogawa","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Tomohiko Ogawa","raw_affiliation_strings":["Electronic Engineering Department, Gunma University, Japan"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department, Gunma University, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057155001","display_name":"Tatsuji Matsuura","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tatsuji Matsuura","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Japan","Semiconductor Technology Academic Research Center (STARC), Japan"],"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101691738","display_name":"Haruo Kobayashi","orcid":"https://orcid.org/0000-0002-0990-5522"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Kobayashi","raw_affiliation_strings":["Electronic Engineering Department, Gunma University, Japan"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department, Gunma University, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054795734","display_name":"Nobukazu Takai","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobukazu Takai","raw_affiliation_strings":["Electronic Engineering Department, Gunma University, Japan"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department, Gunma University, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103736612","display_name":"Masao Hotta","orcid":null},"institutions":[{"id":"https://openalex.org/I165522056","display_name":"Tokyo Denki University","ror":"https://ror.org/01pa62v70","country_code":"JP","type":"education","lineage":["https://openalex.org/I165522056"]},{"id":"https://openalex.org/I185088104","display_name":"Tokyo City University","ror":"https://ror.org/04dt6bw53","country_code":"JP","type":"education","lineage":["https://openalex.org/I185088104"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masao Hotta","raw_affiliation_strings":["Department of Information Network Engineering, Tokyo Denki University, Japan","Dept. of Information Network Engineering, TOKYO CITY UNIVERSITY, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Information Network Engineering, Tokyo Denki University, Japan","institution_ids":["https://openalex.org/I165522056"]},{"raw_affiliation_string":"Dept. of Information Network Engineering, TOKYO CITY UNIVERSITY, Japan","institution_ids":["https://openalex.org/I185088104"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075914397","display_name":"Hao San","orcid":"https://orcid.org/0000-0001-7024-3444"},"institutions":[{"id":"https://openalex.org/I165522056","display_name":"Tokyo Denki University","ror":"https://ror.org/01pa62v70","country_code":"JP","type":"education","lineage":["https://openalex.org/I165522056"]},{"id":"https://openalex.org/I185088104","display_name":"Tokyo City University","ror":"https://ror.org/04dt6bw53","country_code":"JP","type":"education","lineage":["https://openalex.org/I185088104"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hao San","raw_affiliation_strings":["Department of Information Network Engineering, Tokyo Denki University, Japan","Dept. of Information Network Engineering, TOKYO CITY UNIVERSITY, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Information Network Engineering, Tokyo Denki University, Japan","institution_ids":["https://openalex.org/I165522056"]},{"raw_affiliation_string":"Dept. of Information Network Engineering, TOKYO CITY UNIVERSITY, Japan","institution_ids":["https://openalex.org/I185088104"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016097325","display_name":"Akira ABE","orcid":"https://orcid.org/0000-0001-6477-5006"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akira Abe","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Japan","Semiconductor Technology Academic Research Center (STARC), Japan"],"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041236303","display_name":"Katsuyoshi Yagi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Katsuyoshi Yagi","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Japan","Semiconductor Technology Academic Research Center (STARC), Japan"],"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060888275","display_name":"Toshihiko Mori","orcid":"https://orcid.org/0000-0003-0421-2740"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshihiko Mori","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Japan","Semiconductor Technology Academic Research Center (STARC), Japan"],"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5102259663"],"corresponding_institution_ids":["https://openalex.org/I165735259"],"apc_list":null,"apc_paid":null,"fwci":0.4348,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.68823714,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"196","last_page":"199"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.8956421613693237},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.8688880801200867},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.738102376461029},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6219470500946045},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.6108402609825134},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4920799136161804},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.477627694606781},{"id":"https://openalex.org/keywords/matlab","display_name":"MATLAB","score":0.47255629301071167},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.46074405312538147},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.4239717423915863},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3204795718193054},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16349396109580994},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1368395984172821},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13498112559318542},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11981707811355591}],"concepts":[{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.8956421613693237},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.8688880801200867},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.738102376461029},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6219470500946045},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.6108402609825134},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4920799136161804},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.477627694606781},{"id":"https://openalex.org/C2780365114","wikidata":"https://www.wikidata.org/wiki/Q169478","display_name":"MATLAB","level":2,"score":0.47255629301071167},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.46074405312538147},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.4239717423915863},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3204795718193054},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16349396109580994},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1368395984172821},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13498112559318542},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11981707811355591},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/apccas.2010.5774747","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2010.5774747","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.833.8895","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.833.8895","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.el.gunma-u.ac.jp/%7Ekobaweb/news/pdf/2010/1569326283.pdf?origin%3DpublicationDetail","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1971294617","https://openalex.org/W1982133254","https://openalex.org/W2077839561","https://openalex.org/W2107169806","https://openalex.org/W2110880033","https://openalex.org/W2674412496","https://openalex.org/W6676599623"],"related_works":["https://openalex.org/W2278942241","https://openalex.org/W1977749038","https://openalex.org/W2082979872","https://openalex.org/W1641489184","https://openalex.org/W2136440001","https://openalex.org/W2135250276","https://openalex.org/W3004044036","https://openalex.org/W2792167570","https://openalex.org/W1965493748","https://openalex.org/W2368405386"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"techniques":[3,35,54],"for":[4,20,39,72,85],"creating":[5],"a":[6,49,66],"low-power":[7,41],"SAR":[8,42],"ADC":[9],"with":[10],"an":[11],"error-correcting":[12],"non-binary":[13,67],"successive":[14],"approximation":[15],"algorithm;":[16],"it":[17],"is":[18],"suitable":[19],"low":[21],"power":[22],"applications,":[23],"performs":[24],"digital":[25,78],"error":[26],"correction,":[27],"and":[28,48,80],"does":[29],"not":[30],"require":[31,57],"analog":[32,58,86],"calibration.":[33,87],"Two":[34],"have":[36],"been":[37],"proposed":[38],"implementing":[40],"ADCs:":[43],"use":[44],"of":[45,60,89,96],"two":[46],"comparators,":[47],"charge-sharing":[50],"architecture.":[51],"However":[52],"these":[53],"would":[55],"normally":[56],"calibration":[59],"comparator":[61,73],"offsets.":[62],"Here":[63],"we":[64],"propose":[65],"SA":[68],"algorithm":[69],"that":[70],"compensates":[71],"offset":[74],"effects":[75],"in":[76],"the":[77,83,94],"domain,":[79],"so":[81],"eliminates":[82],"need":[84],"Results":[88],"our":[90],"Matlab":[91],"simulation":[92],"validate":[93],"effectiveness":[95],"this":[97],"approach.":[98]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}