{"id":"https://openalex.org/W2116742609","doi":"https://doi.org/10.1109/apccas.2010.5774740","title":"Stochastic TDC architecture with self-calibration","display_name":"Stochastic TDC architecture with self-calibration","publication_year":2010,"publication_date":"2010-12-01","ids":{"openalex":"https://openalex.org/W2116742609","doi":"https://doi.org/10.1109/apccas.2010.5774740","mag":"2116742609"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2010.5774740","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2010.5774740","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054591359","display_name":"Satoshi Ito","orcid":"https://orcid.org/0000-0003-2550-8153"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Satoshi Ito","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113946195","display_name":"Shigeyuki Nishimura","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shigeyuki Nishimura","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101691738","display_name":"Haruo Kobayashi","orcid":"https://orcid.org/0000-0002-0990-5522"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Kobayashi","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010998471","display_name":"Satoshi Uemori","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Uemori","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011936350","display_name":"Yohei Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yohei Tan","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054795734","display_name":"Nobukazu Takai","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobukazu Takai","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010763159","display_name":"Takahiro Yamaguchi","orcid":"https://orcid.org/0000-0003-0325-8878"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro J. Yamaguchi","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056677721","display_name":"Kiichi Niitsu","orcid":"https://orcid.org/0000-0002-3813-3955"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kiichi Niitsu","raw_affiliation_strings":["Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Department of Electronic Engineering, Gunma University, Kiryu, 376\u20108515 Japan","institution_ids":["https://openalex.org/I165735259"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5054591359"],"corresponding_institution_ids":["https://openalex.org/I165735259"],"apc_list":null,"apc_paid":null,"fwci":1.1546,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.81485179,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1027","last_page":"1030"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7157928943634033},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6754521131515503},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.6129822731018066},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5418646335601807},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.4974854290485382},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4646206796169281},{"id":"https://openalex.org/keywords/matlab","display_name":"MATLAB","score":0.4631241261959076},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4507749080657959},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.4328472912311554},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41031110286712646},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3483162522315979},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11960199475288391},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11183780431747437}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7157928943634033},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6754521131515503},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.6129822731018066},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5418646335601807},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.4974854290485382},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4646206796169281},{"id":"https://openalex.org/C2780365114","wikidata":"https://www.wikidata.org/wiki/Q169478","display_name":"MATLAB","level":2,"score":0.4631241261959076},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4507749080657959},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4328472912311554},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41031110286712646},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3483162522315979},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11960199475288391},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11183780431747437},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2010.5774740","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2010.5774740","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.4099999964237213,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1552193912","https://openalex.org/W1599319857","https://openalex.org/W2016253482","https://openalex.org/W2084552778","https://openalex.org/W2098474711","https://openalex.org/W2112328125","https://openalex.org/W2116995862","https://openalex.org/W2119220251","https://openalex.org/W2150783292","https://openalex.org/W2160412553","https://openalex.org/W2177833654","https://openalex.org/W2999201241","https://openalex.org/W3144798171","https://openalex.org/W6654468519","https://openalex.org/W6685578863","https://openalex.org/W6772178070"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2023858428","https://openalex.org/W4247324130","https://openalex.org/W2538259895","https://openalex.org/W2126963364","https://openalex.org/W4400804331","https://openalex.org/W2617868873","https://openalex.org/W4251298892","https://openalex.org/W2218509615","https://openalex.org/W2113057816"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3],"time-to-digital":[4],"converter":[5],"(TDC)":[6],"architecture":[7,38],"with":[8,53],"fine":[9,40,56],"time":[10,41],"resolution,":[11],"self-calibration":[12],"and":[13,15,66,70],"self-testing,":[14],"these":[16],"features":[17,49],"are":[18,68,74],"realized":[19],"by":[20],"the":[21],"following:":[22],"(1)":[23],"Encoder":[24],"circuit":[25,32,64],"that":[26],"ensures":[27],"monotonic":[28],"characteristics.":[29],"(2)":[30],"Self-calibration":[31],"for":[33,39,45],"linearity":[34],"improvement.":[35],"(3)":[36],"Stochastic":[37],"resolution.":[42],"(4)":[43],"Self-testing":[44],"reliability":[46],"requirements.":[47],"These":[48],"can":[50],"be":[51],"implemented":[52],"an":[54],"advanced":[55],"CMOS":[57],"process":[58],"using":[59],"digital":[60],"design":[61],"methodology.":[62],"The":[63],"structure":[65],"operation":[67],"described,":[69],"MATLAB":[71],"simulation":[72],"results":[73],"presented.":[75]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":6},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}