{"id":"https://openalex.org/W2070334699","doi":"https://doi.org/10.1109/apccas.2008.4746326","title":"The Irradiation Effect of DC-DC Power Converter under X-ray","display_name":"The Irradiation Effect of DC-DC Power Converter under X-ray","publication_year":2008,"publication_date":"2008-11-01","ids":{"openalex":"https://openalex.org/W2070334699","doi":"https://doi.org/10.1109/apccas.2008.4746326","mag":"2070334699"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2008.4746326","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2008.4746326","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000237593","display_name":"Yunfei En","orcid":"https://orcid.org/0000-0002-9038-8103"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yunfei En","raw_affiliation_strings":["Microelectronics Institute, Xidian University, Xi'an, China","Microelectron. Inst., Xidian Univ., Xi'an"],"affiliations":[{"raw_affiliation_string":"Microelectronics Institute, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Microelectron. Inst., Xidian Univ., Xi'an","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101097595","display_name":"Yujuan He","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092257","display_name":"China Guangzhou Analysis and Testing Center","ror":"https://ror.org/00d6bjs95","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210092257"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yujuan He","raw_affiliation_strings":["Research and Analysis Center, CEPREI, Guangzhou, 510610, China","Res. & Anal. Center, CEPREI, Guangzhou"],"affiliations":[{"raw_affiliation_string":"Research and Analysis Center, CEPREI, Guangzhou, 510610, China","institution_ids":["https://openalex.org/I4210092257"]},{"raw_affiliation_string":"Res. & Anal. Center, CEPREI, Guangzhou","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100940468","display_name":"Hongwei Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092257","display_name":"China Guangzhou Analysis and Testing Center","ror":"https://ror.org/00d6bjs95","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210092257"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongwei Luo","raw_affiliation_strings":["Research and Analysis Center, CEPREI, Guangzhou, 510610, China","Res. & Anal. Center, CEPREI, Guangzhou"],"affiliations":[{"raw_affiliation_string":"Research and Analysis Center, CEPREI, Guangzhou, 510610, China","institution_ids":["https://openalex.org/I4210092257"]},{"raw_affiliation_string":"Res. & Anal. Center, CEPREI, Guangzhou","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111850190","display_name":"Qian Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092257","display_name":"China Guangzhou Analysis and Testing Center","ror":"https://ror.org/00d6bjs95","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210092257"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qian Shi","raw_affiliation_strings":["Research and Analysis Center, CEPREI, Guangzhou, 510610, China","Res. & Anal. Center, CEPREI, Guangzhou"],"affiliations":[{"raw_affiliation_string":"Research and Analysis Center, CEPREI, Guangzhou, 510610, China","institution_ids":["https://openalex.org/I4210092257"]},{"raw_affiliation_string":"Res. & Anal. Center, CEPREI, Guangzhou","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053279499","display_name":"Kuang Xian-jun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092257","display_name":"China Guangzhou Analysis and Testing Center","ror":"https://ror.org/00d6bjs95","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210092257"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianjun Kuang","raw_affiliation_strings":["Research and Analysis Center, CEPREI, Guangzhou, 510610, China","Res. & Anal. Center, CEPREI, Guangzhou"],"affiliations":[{"raw_affiliation_string":"Research and Analysis Center, CEPREI, Guangzhou, 510610, China","institution_ids":["https://openalex.org/I4210092257"]},{"raw_affiliation_string":"Res. & Anal. Center, CEPREI, Guangzhou","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048205578","display_name":"Zhijian Pan","orcid":"https://orcid.org/0000-0001-9945-6478"},"institutions":[{"id":"https://openalex.org/I4210092257","display_name":"China Guangzhou Analysis and Testing Center","ror":"https://ror.org/00d6bjs95","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210092257"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhijian Pan","raw_affiliation_strings":["Research and Analysis Center, CEPREI, Guangzhou, 510610, China","Res. & Anal. Center, CEPREI, Guangzhou"],"affiliations":[{"raw_affiliation_string":"Research and Analysis Center, CEPREI, Guangzhou, 510610, China","institution_ids":["https://openalex.org/I4210092257"]},{"raw_affiliation_string":"Res. & Anal. Center, CEPREI, Guangzhou","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5000237593"],"corresponding_institution_ids":["https://openalex.org/I149594827"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.07851234,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"25","issue":null,"first_page":"1537","last_page":"1541"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9696999788284302,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9696999788284302,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9424999952316284,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9096999764442444,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.6333750486373901},{"id":"https://openalex.org/keywords/forward-converter","display_name":"Forward converter","score":0.6259113550186157},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5582190155982971},{"id":"https://openalex.org/keywords/flyback-converter","display_name":"Flyback converter","score":0.5443578958511353},{"id":"https://openalex.org/keywords/boost-converter","display_name":"Boost converter","score":0.5035242438316345},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4807474613189697},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4740825891494751},{"id":"https://openalex.org/keywords/\u0107uk-converter","display_name":"\u0106uk converter","score":0.451140433549881},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4078565835952759},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.346943736076355},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.324850469827652},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1880376935005188}],"concepts":[{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.6333750486373901},{"id":"https://openalex.org/C55118286","wikidata":"https://www.wikidata.org/wiki/Q634739","display_name":"Forward converter","level":4,"score":0.6259113550186157},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5582190155982971},{"id":"https://openalex.org/C103303742","wikidata":"https://www.wikidata.org/wiki/Q1293595","display_name":"Flyback converter","level":4,"score":0.5443578958511353},{"id":"https://openalex.org/C78336795","wikidata":"https://www.wikidata.org/wiki/Q760134","display_name":"Boost converter","level":3,"score":0.5035242438316345},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4807474613189697},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4740825891494751},{"id":"https://openalex.org/C100329506","wikidata":"https://www.wikidata.org/wiki/Q336439","display_name":"\u0106uk converter","level":4,"score":0.451140433549881},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4078565835952759},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.346943736076355},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.324850469827652},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1880376935005188},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2008.4746326","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2008.4746326","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8999999761581421,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1993162940","https://openalex.org/W2109645932","https://openalex.org/W2110789622","https://openalex.org/W2120238673","https://openalex.org/W2353266883","https://openalex.org/W2373364160"],"related_works":["https://openalex.org/W2588047361","https://openalex.org/W2783344684","https://openalex.org/W1539693063","https://openalex.org/W2501890988","https://openalex.org/W3214460120","https://openalex.org/W2540337461","https://openalex.org/W2013624817","https://openalex.org/W2024567372","https://openalex.org/W2162727408","https://openalex.org/W2539781515"],"abstract_inverted_index":{"The":[0],"irradiation":[1],"response":[2],"of":[3,56],"DC-DC":[4,15,44,57],"power":[5,16,45],"converter":[6,17,46,58],"is":[7,18,38,47,59],"studied":[8],"using":[9],"X-ray":[10],"source.":[11],"During":[12],"the":[13,21,35,53,62],"test,":[14],"unsteady":[19],"and":[20,28],"characteristic":[22],"parameter":[23],"such":[24],"as":[25],"input":[26],"current":[27],"output":[29],"voltage":[30],"was":[31],"strong":[32],"influenced":[33],"by":[34,50],"total-irradiation-dose.":[36],"It":[37],"indicated":[39],"that":[40],"optical":[41],"coupler":[42],"in":[43],"tremendous":[48],"affected":[49],"irradiation,":[51],"but":[52],"ultimate":[54],"failure":[55],"due":[60],"to":[61],"VDMOSFET":[63],"broken":[64],"out.":[65]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}