{"id":"https://openalex.org/W2148871398","doi":"https://doi.org/10.1109/apccas.2008.4746061","title":"Digital signal processing in electrical capacitance tomography","display_name":"Digital signal processing in electrical capacitance tomography","publication_year":2008,"publication_date":"2008-11-01","ids":{"openalex":"https://openalex.org/W2148871398","doi":"https://doi.org/10.1109/apccas.2008.4746061","mag":"2148871398"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2008.4746061","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2008.4746061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060150695","display_name":"Huaxiang Wang","orcid":"https://orcid.org/0000-0003-1584-6925"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Huaxiang Wang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084651271","display_name":"Ziqiang Cui","orcid":"https://orcid.org/0000-0003-0498-9955"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziqiang Cui","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108645175","display_name":"Yanbin Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanbin Xu","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003556201","display_name":"Lifeng Zhang","orcid":"https://orcid.org/0000-0001-5431-6084"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lifeng Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102342850","display_name":"Yongbo He","orcid":null},"institutions":[{"id":"https://openalex.org/I28813325","display_name":"Civil Aviation University of China","ror":"https://ror.org/03je71k37","country_code":"CN","type":"education","lineage":["https://openalex.org/I28813325"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongbo He","raw_affiliation_strings":["School of Automation, Civil Aviation University of China, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Automation, Civil Aviation University of China, Tianjin, China","institution_ids":["https://openalex.org/I28813325"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5060150695"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.3329,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.66513437,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"465","last_page":"468"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9828000068664551,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7359174489974976},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6056694388389587},{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.5980786085128784},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5546023845672607},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5304346084594727},{"id":"https://openalex.org/keywords/demodulation","display_name":"Demodulation","score":0.5061861872673035},{"id":"https://openalex.org/keywords/analog-signal","display_name":"Analog signal","score":0.4642745852470398},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4401808977127075},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.4331505000591278},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.42387276887893677},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.4210498332977295},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.40225428342819214},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22913724184036255},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.09668919444084167},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0887252688407898},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08262050151824951}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7359174489974976},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6056694388389587},{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.5980786085128784},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5546023845672607},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5304346084594727},{"id":"https://openalex.org/C195251586","wikidata":"https://www.wikidata.org/wiki/Q1185939","display_name":"Demodulation","level":3,"score":0.5061861872673035},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.4642745852470398},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4401808977127075},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.4331505000591278},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.42387276887893677},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.4210498332977295},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.40225428342819214},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22913724184036255},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.09668919444084167},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0887252688407898},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08262050151824951},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2008.4746061","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2008.4746061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1590348499","https://openalex.org/W1832500607","https://openalex.org/W1974831921","https://openalex.org/W2018055868","https://openalex.org/W2025034867","https://openalex.org/W2056407018","https://openalex.org/W2108754845","https://openalex.org/W2127519209","https://openalex.org/W2131100802","https://openalex.org/W4302437260"],"related_works":["https://openalex.org/W1996543123","https://openalex.org/W4388516297","https://openalex.org/W1978042965","https://openalex.org/W2010761432","https://openalex.org/W4389302182","https://openalex.org/W2089955640","https://openalex.org/W4229074657","https://openalex.org/W1978322239","https://openalex.org/W4210925376","https://openalex.org/W2168466824"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,34,59,79,104,107,125,138,144,149],"design,":[4],"implementation":[5],"and":[6,41,56,66,113,146],"performance":[7,88],"of":[8,68,148],"a":[9],"16-electrode":[10],"electrical":[11,18],"capacitance":[12,19,152],"tomography":[13,20],"in":[14,51,61,86,95],"Tianjin":[15],"University.":[16],"Currently,":[17],"systems":[21],"are":[22,30,89,140],"primarily":[23],"based":[24,72,151],"on":[25,137],"analog":[26,35,81,99],"hardware.":[27,100],"However,":[28],"there":[29],"some":[31],"disadvantages":[32],"for":[33],"devices,":[36],"e.g.":[37],"relatively":[38],"narrow":[39],"bandwidth":[40],"long":[42],"settling":[43],"time,":[44],"which":[45],"place":[46],"limits":[47],"to":[48,142],"further":[49],"improvements":[50],"both":[52],"data":[53,73,114],"acquisition":[54,74],"rate":[55],"precision.":[57],"With":[58],"advances":[60],"logic":[62],"resource,":[63],"lower":[64],"cost":[65],"flexibility":[67],"FPGA,":[69],"an":[70],"FPGA":[71,105,150],"scheme":[75],"was":[76],"chosen":[77],"over":[78],"traditional":[80],"signal":[82,108],"processing":[83],"method.":[84],"Improvements":[85],"system":[87],"achieved":[90],"by":[91],"implementing":[92],"most":[93],"functions":[94],"digital":[96],"rather":[97],"than":[98,131],"Logics":[101],"realized":[102],"within":[103],"perform":[106],"generation,":[109],"phase-sensitive":[110],"demodulation,":[111],"micro-controller":[112],"transfer":[115],"functions,":[116],"thus":[117],"providing":[118],"effective":[119],"integration.":[120],"Preliminary":[121],"results":[122],"show":[123],"that":[124],"signal-to-noise":[126],"ratio":[127],"could":[128],"be":[129],"greater":[130],"76":[132],"dB.":[133],"The":[134],"reconstructed":[135],"images":[136],"prototype":[139],"presented":[141],"illustrate":[143],"feasibility":[145],"potentiality":[147],"measurement":[153],"system.":[154]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}