{"id":"https://openalex.org/W2138538109","doi":"https://doi.org/10.1109/apccas.2008.4746035","title":"Stochastic estimation trip frequency of sensitive equipment due to voltage sag","display_name":"Stochastic estimation trip frequency of sensitive equipment due to voltage sag","publication_year":2008,"publication_date":"2008-11-01","ids":{"openalex":"https://openalex.org/W2138538109","doi":"https://doi.org/10.1109/apccas.2008.4746035","mag":"2138538109"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2008.4746035","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2008.4746035","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041666549","display_name":"Xianyong Xiao","orcid":"https://orcid.org/0000-0001-5926-4068"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xianyong Xiao","raw_affiliation_strings":["School of Electrical Engineering & Information, Sichuan University, China","Sch. of Electr. Eng. & Inf., Sichuan Univ., Chengdu"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering & Information, Sichuan University, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"Sch. of Electr. Eng. & Inf., Sichuan Univ., Chengdu","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065221855","display_name":"Xuna Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuna Liu","raw_affiliation_strings":["School of Electrical Engineering & Information, Sichuan University, China","Sch. of Electr. Eng. & Inf., Sichuan Univ., Chengdu"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering & Information, Sichuan University, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"Sch. of Electr. Eng. & Inf., Sichuan Univ., Chengdu","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110203977","display_name":"Yang Hong-geng","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Honggeng Yang","raw_affiliation_strings":["School of Electrical Engineering & Information, Sichuan University, China","Sch. of Electr. Eng. & Inf., Sichuan Univ., Chengdu"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering & Information, Sichuan University, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"Sch. of Electr. Eng. & Inf., Sichuan Univ., Chengdu","institution_ids":["https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5041666549"],"corresponding_institution_ids":["https://openalex.org/I24185976"],"apc_list":null,"apc_paid":null,"fwci":4.0688,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.936315,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"30","issue":null,"first_page":"364","last_page":"367"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-sag","display_name":"Voltage sag","score":0.93067467212677},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.7948544025421143},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6536549925804138},{"id":"https://openalex.org/keywords/probability-density-function","display_name":"Probability density function","score":0.5704561471939087},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.526166558265686},{"id":"https://openalex.org/keywords/cumulative-distribution-function","display_name":"Cumulative distribution function","score":0.5032829642295837},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.48351147770881653},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.465986430644989},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4480854570865631},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3460121750831604},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.257538378238678},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.23109731078147888},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22111719846725464},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16073504090309143},{"id":"https://openalex.org/keywords/power-quality","display_name":"Power quality","score":0.1415063440799713}],"concepts":[{"id":"https://openalex.org/C2781134633","wikidata":"https://www.wikidata.org/wiki/Q14945479","display_name":"Voltage sag","level":4,"score":0.93067467212677},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.7948544025421143},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6536549925804138},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.5704561471939087},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.526166558265686},{"id":"https://openalex.org/C103784038","wikidata":"https://www.wikidata.org/wiki/Q386228","display_name":"Cumulative distribution function","level":3,"score":0.5032829642295837},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48351147770881653},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.465986430644989},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4480854570865631},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3460121750831604},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.257538378238678},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.23109731078147888},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22111719846725464},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16073504090309143},{"id":"https://openalex.org/C2779665505","wikidata":"https://www.wikidata.org/wiki/Q1780079","display_name":"Power quality","level":3,"score":0.1415063440799713},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apccas.2008.4746035","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2008.4746035","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6800000071525574}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1988004737","https://openalex.org/W2097087347","https://openalex.org/W2098285285","https://openalex.org/W2100652790","https://openalex.org/W2136213984","https://openalex.org/W2155858094","https://openalex.org/W2164338734","https://openalex.org/W2169786832","https://openalex.org/W2350198615","https://openalex.org/W2359707447","https://openalex.org/W2366419155","https://openalex.org/W2370633049","https://openalex.org/W2386069093"],"related_works":["https://openalex.org/W4213267843","https://openalex.org/W1980528650","https://openalex.org/W3102213005","https://openalex.org/W2168519368","https://openalex.org/W2036854414","https://openalex.org/W2753355162","https://openalex.org/W2392327107","https://openalex.org/W192702211","https://openalex.org/W3129080429","https://openalex.org/W3014243556"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,20],"case":[4],"study":[5],"where":[6],"the":[7,10,37,44,78,83],"sensitivity":[8,67],"of":[9,36,53],"sensitive":[11,54],"equipment":[12,38,55,71],"due":[13],"to":[14,64],"voltage":[15,26,31,39],"sag":[16,32],"is":[17,41,86],"estimated":[18,57],"using":[19,43,58],"stochastic":[21],"estimating":[22],"method":[23,85],"based":[24],"on":[25],"tolerance":[27,40],"curve":[28],"and":[29,88],"load":[30],"sensitivity.":[33],"The":[34,50,73],"randomicity":[35],"described":[42],"normal":[45],"distribution":[46],"probability":[47],"density":[48],"function.":[49],"trip":[51],"frequencies":[52],"are":[56],"accumulative":[59],"sum":[60],"mode":[61],"in":[62],"order":[63],"avoid":[65],"identifying":[66],"grade":[68],"for":[69],"different":[70],"types.":[72],"simulation":[74],"results":[75],"comparing":[76],"with":[77],"practical":[79],"testing":[80],"show":[81],"that":[82],"proposed":[84],"corrective":[87],"effective.":[89]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}