{"id":"https://openalex.org/W2138626723","doi":"https://doi.org/10.1109/apccas.2008.4746031","title":"Multi-V&lt;inf&gt;th&lt;/inf&gt; FinFET sequential circuits with independent-gate bias and work-function engineering for reduced power consumption","display_name":"Multi-V&lt;inf&gt;th&lt;/inf&gt; FinFET sequential circuits with independent-gate bias and work-function engineering for reduced power consumption","publication_year":2008,"publication_date":"2008-11-01","ids":{"openalex":"https://openalex.org/W2138626723","doi":"https://doi.org/10.1109/apccas.2008.4746031","mag":"2138626723"},"language":"en","primary_location":{"id":"doi:10.1109/apccas.2008.4746031","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2008.4746031","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081512326","display_name":"Sherif Abdulkader Tawfik","orcid":"https://orcid.org/0000-0003-3592-1419"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sherif A. Tawfik","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin, Madison, Madison, WI, USA","Dept. of Electr. & Comput. Eng., Univ. of Wisconsin -Madison, Madison, WI"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin, Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Univ. of Wisconsin -Madison, Madison, WI","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042147600","display_name":"Volkan Kursun","orcid":"https://orcid.org/0000-0002-8050-1774"},"institutions":[{"id":"https://openalex.org/I200769079","display_name":"Hong Kong University of Science and Technology","ror":"https://ror.org/00q4vv597","country_code":"HK","type":"education","lineage":["https://openalex.org/I200769079"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Volkan Kursun","raw_affiliation_strings":["Department of Electronic and Computer Engineering, Hong Kong University of Science and Technology, Hong Kong, China","Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic and Computer Engineering, Hong Kong University of Science and Technology, Hong Kong, China","institution_ids":["https://openalex.org/I200769079"]},{"raw_affiliation_string":"Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong#TAB#","institution_ids":["https://openalex.org/I200769079"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0175,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.79304572,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"4","issue":null,"first_page":"348","last_page":"351"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6163023114204407},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46050047874450684},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4433017373085022},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4261893630027771},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.42375749349594116},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.4228472113609314},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3675857186317444},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34876126050949097},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2439548671245575},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16321566700935364}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6163023114204407},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46050047874450684},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4433017373085022},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4261893630027771},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.42375749349594116},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.4228472113609314},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3675857186317444},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34876126050949097},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2439548671245575},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16321566700935364},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/apccas.2008.4746031","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apccas.2008.4746031","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-49769","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-49769","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1489322347","https://openalex.org/W2112340819","https://openalex.org/W2117082520","https://openalex.org/W2121460280","https://openalex.org/W2124438715","https://openalex.org/W2125117969","https://openalex.org/W2129750565","https://openalex.org/W2131487004"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2899084033","https://openalex.org/W1573459484","https://openalex.org/W2371541858","https://openalex.org/W2910687076","https://openalex.org/W4252174257","https://openalex.org/W4280591916","https://openalex.org/W2144937598","https://openalex.org/W2487690192","https://openalex.org/W4241196849"],"abstract_inverted_index":{"Brute-force":[0],"sequential":[1,31,137],"circuits":[2,32,112,138,143],"with":[3,113,134,144],"reduced":[4,92,129],"clock":[5,84],"load":[6],"and":[7,37,51,75,86,98,105],"simpler":[8],"circuitry":[9],"are":[10,40,91],"widely":[11],"used":[12],"in":[13,120],"the":[14,44,58,72,77,83,87,111,126,135,142],"state-of-the-art":[15],"integrated":[16],"circuits.":[17,70],"In":[18],"this":[19],"paper,":[20],"new":[21,136],"multi":[22],"threshold":[23,61],"voltage":[24,62],"(multi-V":[25],"<sub":[26,64,115,146],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[27,65,116,147],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">th</sub>":[28,66,117,148],")":[29,67],"brute-force":[30],"based":[33],"on":[34],"independent-gate":[35],"bias":[36],"work-function":[38],"engineering":[39],"proposed":[41,73],"for":[42],"reducing":[43],"power":[45,81,90],"consumption":[46],"while":[47,101],"maintaining":[48,102],"similar":[49,103],"speed":[50,104],"noise":[52],"immunity":[53],"characteristics":[54],"as":[55,108,139],"compared":[56,109,140],"to":[57,95,110,132,141],"standard":[59],"single":[60],"(single-V":[63],"tied-gate":[68,118,149],"FinFET":[69,123],"With":[71],"latches":[74],"flip-flops,":[76],"total":[78],"active":[79],"mode":[80],"consumption,":[82],"power,":[85],"average":[88],"leakage":[89],"by":[93,130],"up":[94,131],"55%,":[96],"29%,":[97],"53%,":[99],"respectively,":[100],"data":[106],"stability":[107],"single-V":[114,145],"FinFETs":[119],"a":[121],"32nm":[122],"technology.":[124],"Furthermore,":[125],"area":[127],"is":[128],"21%":[133],"FinFETs.":[150]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2016-06-24T00:00:00"}