{"id":"https://openalex.org/W4415821518","doi":"https://doi.org/10.1109/amps66841.2025.11219953","title":"Design and compatibility of different Stand Alone Merging Unit (SAMU) calibration testbeds","display_name":"Design and compatibility of different Stand Alone Merging Unit (SAMU) calibration testbeds","publication_year":2025,"publication_date":"2025-09-24","ids":{"openalex":"https://openalex.org/W4415821518","doi":"https://doi.org/10.1109/amps66841.2025.11219953"},"language":null,"primary_location":{"id":"doi:10.1109/amps66841.2025.11219953","is_oa":false,"landing_page_url":"https://doi.org/10.1109/amps66841.2025.11219953","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 15th International Workshop on Applied Measurements for Power Systems (AMPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Ana Milagros Fuentes Herrera","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110242","display_name":"Digital Science (United States)","ror":"https://ror.org/020h4b682","country_code":"US","type":"company","lineage":["https://openalex.org/I4210110242","https://openalex.org/I4210112888","https://openalex.org/I4210118830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ana Milagros Fuentes Herrera","raw_affiliation_strings":["Digital transformation, digitalization and infrastructure cybersecurity CIRCE Research Centre,Zaragoza,España"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Digital transformation, digitalization and infrastructure cybersecurity CIRCE Research Centre,Zaragoza,España","institution_ids":["https://openalex.org/I4210110242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041370267","display_name":"M. A. Oliv\u00e1n","orcid":"https://orcid.org/0000-0001-7025-061X"},"institutions":[{"id":"https://openalex.org/I4210110242","display_name":"Digital Science (United States)","ror":"https://ror.org/020h4b682","country_code":"US","type":"company","lineage":["https://openalex.org/I4210110242","https://openalex.org/I4210112888","https://openalex.org/I4210118830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Miguel Angel Olivan","raw_affiliation_strings":["Digital transformation, digitalization and infrastructure cybersecurity CIRCE Research Centre,Zaragoza,España"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Digital transformation, digitalization and infrastructure cybersecurity CIRCE Research Centre,Zaragoza,España","institution_ids":["https://openalex.org/I4210110242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014820346","display_name":"Julio J. Melero","orcid":"https://orcid.org/0000-0003-2360-0845"},"institutions":[{"id":"https://openalex.org/I255234318","display_name":"Universidad de Zaragoza","ror":"https://ror.org/012a91z28","country_code":"ES","type":"education","lineage":["https://openalex.org/I255234318"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Julio J. Melero","raw_affiliation_strings":["Instituto Universitario de Investigación Mixto ENERGAIA, Universidad de Zaragoza – CIRCE,Zaragoza,España"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto Universitario de Investigación Mixto ENERGAIA, Universidad de Zaragoza – CIRCE,Zaragoza,España","institution_ids":["https://openalex.org/I255234318"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046812013","display_name":"\u00c1ngela Esp\u00edn-Delgado","orcid":"https://orcid.org/0000-0001-6074-8633"},"institutions":[{"id":"https://openalex.org/I2800664555","display_name":"RISE Research Institutes of Sweden","ror":"https://ror.org/03nnxqz81","country_code":"SE","type":"other","lineage":["https://openalex.org/I2800664555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Angela Espin-Delgado","raw_affiliation_strings":["RISE Research Institutes of Sweden,Department of Measurement Science and Technology,Borås,Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RISE Research Institutes of Sweden,Department of Measurement Science and Technology,Borås,Sweden","institution_ids":["https://openalex.org/I2800664555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005812520","display_name":"Stefan Svensson","orcid":"https://orcid.org/0000-0002-1871-9326"},"institutions":[{"id":"https://openalex.org/I2800664555","display_name":"RISE Research Institutes of Sweden","ror":"https://ror.org/03nnxqz81","country_code":"SE","type":"other","lineage":["https://openalex.org/I2800664555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Stefan Svensson","raw_affiliation_strings":["RISE Research Institutes of Sweden,Department of Measurement Science and Technology,Borås,Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RISE Research Institutes of Sweden,Department of Measurement Science and Technology,Borås,Sweden","institution_ids":["https://openalex.org/I2800664555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111308005","display_name":"PJJ Kamp","orcid":null},"institutions":[{"id":"https://openalex.org/I4210164637","display_name":"VSL Dutch Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Pieter van der Kamp","raw_affiliation_strings":["VSL National Metrology Institute,Delft,The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VSL National Metrology Institute,Delft,The Netherlands","institution_ids":["https://openalex.org/I4210164637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079714418","display_name":"Ernest Houtzager","orcid":"https://orcid.org/0000-0001-9430-618X"},"institutions":[{"id":"https://openalex.org/I4210164637","display_name":"VSL Dutch Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Ernest Houtzager","raw_affiliation_strings":["VSL National Metrology Institute,Delft,The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VSL National Metrology Institute,Delft,The Netherlands","institution_ids":["https://openalex.org/I4210164637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5120235669","display_name":"H\u00e4llstr\u00f6m Jari","orcid":null},"institutions":[{"id":"https://openalex.org/I133698016","display_name":"National metrology institute VTT MIKES","ror":"https://ror.org/0398a1r53","country_code":"FI","type":"facility","lineage":["https://openalex.org/I133698016","https://openalex.org/I4210089493","https://openalex.org/I87653560"]},{"id":"https://openalex.org/I87653560","display_name":"VTT Technical Research Centre of Finland","ror":"https://ror.org/04b181w54","country_code":"FI","type":"nonprofit","lineage":["https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"H\u00e4llstr\u00f6m Jari","raw_affiliation_strings":["Centre for Metrology MIKES VTT Technical Research Centre of Finland Ltd,Espoo,Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre for Metrology MIKES VTT Technical Research Centre of Finland Ltd,Espoo,Finland","institution_ids":["https://openalex.org/I87653560","https://openalex.org/I133698016"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024386758","display_name":"Tapio Lehtonen","orcid":"https://orcid.org/0000-0001-9413-1631"},"institutions":[{"id":"https://openalex.org/I133698016","display_name":"National metrology institute VTT MIKES","ror":"https://ror.org/0398a1r53","country_code":"FI","type":"facility","lineage":["https://openalex.org/I133698016","https://openalex.org/I4210089493","https://openalex.org/I87653560"]},{"id":"https://openalex.org/I87653560","display_name":"VTT Technical Research Centre of Finland","ror":"https://ror.org/04b181w54","country_code":"FI","type":"nonprofit","lineage":["https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Tapio A. Lehtonen","raw_affiliation_strings":["Centre for Metrology MIKES VTT Technical Research Centre of Finland Ltd,Espoo,Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre for Metrology MIKES VTT Technical Research Centre of Finland Ltd,Espoo,Finland","institution_ids":["https://openalex.org/I87653560","https://openalex.org/I133698016"]}]}],"institutions":[],"countries_distinct_count":5,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.27439711,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.4320000112056732,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.4320000112056732,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.09380000084638596,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.03959999978542328,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/compatibility","display_name":"Compatibility (geochemistry)","score":0.9189000129699707},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.4268999993801117},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.3517000079154968},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.2921000123023987}],"concepts":[{"id":"https://openalex.org/C2778648169","wikidata":"https://www.wikidata.org/wiki/Q967768","display_name":"Compatibility (geochemistry)","level":2,"score":0.9189000129699707},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5699999928474426},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4875999987125397},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.4268999993801117},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3605000078678131},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.3517000079154968},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3391000032424927},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.2921000123023987},{"id":"https://openalex.org/C20574231","wikidata":"https://www.wikidata.org/wiki/Q844605","display_name":"Backward compatibility","level":2,"score":0.24950000643730164},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2386000007390976}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/amps66841.2025.11219953","is_oa":false,"landing_page_url":"https://doi.org/10.1109/amps66841.2025.11219953","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 15th International Workshop on Applied Measurements for Power Systems (AMPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320334322","display_name":"HORIZON EUROPE Framework Programme","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2129878098","https://openalex.org/W2516145900","https://openalex.org/W2594565618"],"related_works":[],"abstract_inverted_index":{"The":[0],"implementation":[1],"of":[2,11,24,35,40],"digital":[3],"substations":[4],"is":[5,15,27],"becoming":[6],"increasingly":[7],"common":[8],"and":[9,33,65,72,82],"one":[10],"the":[12,16,22,25,31,38,41,59,85,100],"principal":[13],"elements":[14],"stand-alone":[17],"merging":[18],"unit":[19],"(SAMU).":[20],"Therefore,":[21],"calibration":[23,101],"SAMU":[26],"essential":[28],"to":[29,57],"ensure":[30],"accuracy":[32],"reliability":[34],"measurements,":[36],"as":[37],"operation":[39],"protection":[42],"equipment":[43],"depends":[44],"on":[45,50,77],"them.":[46],"This":[47],"study":[48],"focuses":[49],"evaluating":[51],"testbeds":[52],"used":[53],"in":[54,99],"different":[55],"laboratories":[56,88],"calibrate":[58],"same":[60],"SAMU:":[61],"CIRCE,":[62],"RISE,":[63],"VSL,":[64],"VTT.":[66],"Following":[67],"IEC":[68],"61869-13":[69],"standard,":[70],"magnitude":[71],"phase":[73],"displacement":[74],"were":[75],"calibrated":[76],"all":[78],"channels":[79],"for":[80],"current":[81],"voltage.":[83],"Additionally,":[84],"compatibility":[86,93,98],"among":[87],"was":[89],"evaluated":[90],"using":[91],"a":[92],"index,":[94],"confirming":[95],"their":[96],"mutual":[97],"process.":[102]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-11-03T00:00:00"}