{"id":"https://openalex.org/W4415821693","doi":"https://doi.org/10.1109/amps66841.2025.11219920","title":"Evaluation of a Fiber-Optic Current Sensor for On-site Calibrations","display_name":"Evaluation of a Fiber-Optic Current Sensor for On-site Calibrations","publication_year":2025,"publication_date":"2025-09-24","ids":{"openalex":"https://openalex.org/W4415821693","doi":"https://doi.org/10.1109/amps66841.2025.11219920"},"language":"en","primary_location":{"id":"doi:10.1109/amps66841.2025.11219920","is_oa":false,"landing_page_url":"https://doi.org/10.1109/amps66841.2025.11219920","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 15th International Workshop on Applied Measurements for Power Systems (AMPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.utwente.nl/en/publications/c959e36c-622f-4223-b388-4f3496105c3e","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002311337","display_name":"Wei Zhao","orcid":"https://orcid.org/0000-0002-6268-2559"},"institutions":[{"id":"https://openalex.org/I4210164637","display_name":"VSL Dutch Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Wei Zhao","raw_affiliation_strings":["National Metrology Institute,Division of Electrical and Time Frequency VSL,Delft,the Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute,Division of Electrical and Time Frequency VSL,Delft,the Netherlands","institution_ids":["https://openalex.org/I4210164637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078948815","display_name":"Chuansheng Li","orcid":"https://orcid.org/0000-0001-8045-0367"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuansheng Li","raw_affiliation_strings":["National Institute of Metrology China,Division of Electrical and Magnetic,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology China,Division of Electrical and Magnetic,Beijing,China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045083630","display_name":"Domenico Giordano","orcid":"https://orcid.org/0000-0002-2616-9459"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Domenico Giordano","raw_affiliation_strings":["Istituto Nazionale di Ricerca Metrologica,Division of Metrology for Quality of Life,Torino,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica,Division of Metrology for Quality of Life,Torino,Italy","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001265376","display_name":"Palma Sara Letizia","orcid":"https://orcid.org/0000-0002-9251-3123"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Palma Sara Letizia","raw_affiliation_strings":["Istituto Nazionale di Ricerca Metrologica,Division of Metrology for Quality of Life,Torino,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica,Division of Metrology for Quality of Life,Torino,Italy","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047767173","display_name":"Davide Signorino","orcid":"https://orcid.org/0000-0001-5141-6768"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Davide Signorino","raw_affiliation_strings":["Istituto Nazionale di Ricerca Metrologica,Division of Metrology for Quality of Life,Torino,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica,Division of Metrology for Quality of Life,Torino,Italy","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083004291","display_name":"Jari H\u00e4llstr\u00f6m","orcid":"https://orcid.org/0000-0003-1007-3089"},"institutions":[{"id":"https://openalex.org/I133698016","display_name":"National metrology institute VTT MIKES","ror":"https://ror.org/0398a1r53","country_code":"FI","type":"facility","lineage":["https://openalex.org/I133698016","https://openalex.org/I4210089493","https://openalex.org/I87653560"]},{"id":"https://openalex.org/I87653560","display_name":"VTT Technical Research Centre of Finland","ror":"https://ror.org/04b181w54","country_code":"FI","type":"nonprofit","lineage":["https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Jari H\u00e4llstr\u00f6m","raw_affiliation_strings":["MIKES Metrology VTT, Technical Research Centre of Finland,Espoo,Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MIKES Metrology VTT, Technical Research Centre of Finland,Espoo,Finland","institution_ids":["https://openalex.org/I87653560","https://openalex.org/I133698016"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073844637","display_name":"Gert Rietveld","orcid":"https://orcid.org/0000-0002-5239-4019"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Gert Rietveld","raw_affiliation_strings":["University of Twente,Power Electronics Group, faculty EEMCS,Enschede,The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Twente,Power Electronics Group, faculty EEMCS,Enschede,The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5002311337"],"corresponding_institution_ids":["https://openalex.org/I4210164637"],"apc_list":null,"apc_paid":null,"fwci":0.6149,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.75104554,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.9879999756813049,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.9879999756813049,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.0024999999441206455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.002099999925121665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.8812999725341797},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.8361999988555908},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7520999908447266},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6194999814033508},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5989000201225281},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5072000026702881},{"id":"https://openalex.org/keywords/standardization","display_name":"Standardization","score":0.43689998984336853},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4253999888896942}],"concepts":[{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.8812999725341797},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.8361999988555908},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7520999908447266},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6194999814033508},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5989000201225281},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5072000026702881},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5058000087738037},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43700000643730164},{"id":"https://openalex.org/C188087704","wikidata":"https://www.wikidata.org/wiki/Q369577","display_name":"Standardization","level":2,"score":0.43689998984336853},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4253999888896942},{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.40560001134872437},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.40389999747276306},{"id":"https://openalex.org/C111219384","wikidata":"https://www.wikidata.org/wiki/Q6954384","display_name":"NIST","level":2,"score":0.3698999881744385},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3449000120162964},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33709999918937683},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3296999931335449},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3255999982357025},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.3221000134944916},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.2856000065803528},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.2842000126838684},{"id":"https://openalex.org/C62646347","wikidata":"https://www.wikidata.org/wiki/Q2041172","display_name":"Measuring instrument","level":2,"score":0.27079999446868896},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.26190000772476196},{"id":"https://openalex.org/C3019950295","wikidata":"https://www.wikidata.org/wiki/Q2041172","display_name":"Measurement device","level":2,"score":0.2535000145435333},{"id":"https://openalex.org/C177454536","wikidata":"https://www.wikidata.org/wiki/Q578290","display_name":"Emphasis (telecommunications)","level":2,"score":0.25290000438690186}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/amps66841.2025.11219920","is_oa":false,"landing_page_url":"https://doi.org/10.1109/amps66841.2025.11219920","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 15th International Workshop on Applied Measurements for Power Systems (AMPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:ris.utwente.nl:openaire/c959e36c-622f-4223-b388-4f3496105c3e","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/c959e36c-622f-4223-b388-4f3496105c3e","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Zhao, W, Li, C, Giordano, D, Letizia, P S, Signorino, D, Hallstrom, J & Rietveld, G 2025, Evaluation of a Fiber-Optic Current Sensor for On-site Calibrations. in 15th IEEE International Workshop on Applied Measurements for Power Systems : Workshop Proceedings. 2025 edn, IEEE, pp. 1-6, 15th IEEE International Workshop on Applied Measurements for Power Systems, AMPS 2025, Bucharest, Romania, 24/09/25. https://doi.org/10.1109/AMPS66841.2025.11219920","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:iris.inrim.it:11696/89139","is_oa":false,"landing_page_url":"https://hdl.handle.net/11696/89139","pdf_url":null,"source":{"id":"https://openalex.org/S4306400708","display_name":"CINECA IRIS Institutional Research Information System (IRIS Istituto Nazionale di Ricerca Metrologica)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I27837315","host_organization_name":"University of Michigan","host_organization_lineage":["https://openalex.org/I27837315"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:ris.utwente.nl:openaire/c959e36c-622f-4223-b388-4f3496105c3e","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/c959e36c-622f-4223-b388-4f3496105c3e","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Zhao, W, Li, C, Giordano, D, Letizia, P S, Signorino, D, Hallstrom, J & Rietveld, G 2025, Evaluation of a Fiber-Optic Current Sensor for On-site Calibrations. in 15th IEEE International Workshop on Applied Measurements for Power Systems : Workshop Proceedings. 2025 edn, IEEE, pp. 1-6, 15th IEEE International Workshop on Applied Measurements for Power Systems, AMPS 2025, Bucharest, Romania, 24/09/25. https://doi.org/10.1109/AMPS66841.2025.11219920","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1968744552","https://openalex.org/W1996529139","https://openalex.org/W2064557916","https://openalex.org/W2107956546","https://openalex.org/W2160332285","https://openalex.org/W2165114920","https://openalex.org/W2517377778","https://openalex.org/W2532421924","https://openalex.org/W2790706193","https://openalex.org/W4402040327","https://openalex.org/W4402040560"],"related_works":[],"abstract_inverted_index":{"Fiber-optic":[0],"current":[1,151],"sensor":[2,82],"(FOCS)":[3],"technology":[4],"offers":[5],"intrinsic":[6],"galvanic":[7],"isolation,":[8],"a":[9,22,34,79,111],"wide":[10],"linearity":[11,141],"range,":[12,152],"immunity":[13],"to":[14,162,169],"electromagnetic":[15],"interference,":[16],"and":[17,46,56,73,94,128,132,176],"non-invasive":[18],"measurement,":[19],"making":[20],"it":[21],"strong":[23],"candidate":[24],"for":[25,107,134],"applications":[26,39],"in":[27,37,60,84,110,137,181],"on-site":[28,101,135,182],"calibration.":[29,183],"However,":[30],"its":[31],"use":[32],"as":[33],"traceable":[35],"reference":[36],"metrological":[38,172],"remains":[40],"limited":[41],"so":[42],"far.":[43],"Laboratory":[44],"calibration":[45,136],"cross-institutional":[47],"comparisons":[48],"are":[49],"essential":[50],"steps":[51],"toward":[52],"establishing":[53],"the":[54,69,75,100,105,122,140,148,171],"reliability":[55],"traceability":[57,133],"of":[58,68,78,174],"FOCS":[59,70,81,106,119,175],"real-world":[61],"conditions.":[62],"This":[63,166],"paper":[64],"provides":[65],"an":[66],"overview":[67],"operating":[71],"principle":[72],"evaluates":[74],"key":[76],"performance":[77,123],"new":[80],"tested":[83],"two":[85],"National":[86],"Metrology":[87],"Institutes":[88],"(NMIs),":[89],"including":[90],"accuracy,":[91],"stability,":[92],"linearity,":[93],"temperature":[95,154],"dependence.":[96],"It":[97],"furthermore":[98],"describes":[99],"measurement":[102,109],"campaign":[103],"using":[104],"efficiency":[108],"medium-voltage":[112],"substation.":[113],"The":[114],"test":[115],"results":[116],"reveal":[117],"that":[118],"can":[120],"meet":[121],"requirements":[124],"under":[125],"practical":[126],"conditions":[127],"demonstrate":[129],"excellent":[130],"repeatability":[131],"operational":[138],"environments:":[139],"is":[142],"better":[143],"than":[144,157],"$0.1":[145],"\\%$":[146,159],"over":[147],"2.4":[149],"kA":[150],"with":[153],"effects":[155],"less":[156],"$0.2":[158],"from":[160],"-10":[161],"60":[163],"degrees":[164],"Celsius.":[165],"work":[167],"contributes":[168],"understanding":[170],"characteristics":[173],"supports":[177],"their":[178],"broader":[179],"adoption":[180]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-05-09T13:55:54.758798","created_date":"2025-11-03T00:00:00"}