{"id":"https://openalex.org/W4388115981","doi":"https://doi.org/10.1109/amps59207.2023.10297152","title":"Development of a Low-Cost Three-Phase Current Generator for Testing Current Transformers","display_name":"Development of a Low-Cost Three-Phase Current Generator for Testing Current Transformers","publication_year":2023,"publication_date":"2023-09-27","ids":{"openalex":"https://openalex.org/W4388115981","doi":"https://doi.org/10.1109/amps59207.2023.10297152"},"language":"en","primary_location":{"id":"doi:10.1109/amps59207.2023.10297152","is_oa":false,"landing_page_url":"https://doi.org/10.1109/amps59207.2023.10297152","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 13th International Workshop on Applied Measurements for Power Systems (AMPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001972308","display_name":"Marco Faifer","orcid":"https://orcid.org/0000-0002-8777-5444"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Faifer","raw_affiliation_strings":["DEIB Politecnico di Milano,Milano,Italy","DEIB Politecnico di Milano, Milano, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DEIB Politecnico di Milano,Milano,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059759550","display_name":"Christian Laurano","orcid":"https://orcid.org/0000-0002-6011-6246"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Christian Laurano","raw_affiliation_strings":["DEIB Politecnico di Milano,Milano,Italy","DEIB Politecnico di Milano, Milano, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DEIB Politecnico di Milano,Milano,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017740145","display_name":"Roberto Ottoboni","orcid":"https://orcid.org/0000-0002-5371-1346"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Roberto Ottoboni","raw_affiliation_strings":["DEIB Politecnico di Milano,Milano,Italy","DEIB Politecnico di Milano, Milano, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DEIB Politecnico di Milano,Milano,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003675815","display_name":"Sergio Toscani","orcid":"https://orcid.org/0000-0003-2317-5818"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sergio Toscani","raw_affiliation_strings":["DEIB Politecnico di Milano,Milano,Italy","DEIB Politecnico di Milano, Milano, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DEIB Politecnico di Milano,Milano,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":1.6226,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.82598869,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"01","last_page":"06"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.666179358959198},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6453620195388794},{"id":"https://openalex.org/keywords/current-transformer","display_name":"Current transformer","score":0.6234359741210938},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6217378377914429},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.5635252594947815},{"id":"https://openalex.org/keywords/signal-generator","display_name":"Signal generator","score":0.513846218585968},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.46903762221336365},{"id":"https://openalex.org/keywords/arbitrary-waveform-generator","display_name":"Arbitrary waveform generator","score":0.4661110043525696},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4516654312610626},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3633121848106384},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2531428933143616},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08602756261825562}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.666179358959198},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6453620195388794},{"id":"https://openalex.org/C133770746","wikidata":"https://www.wikidata.org/wiki/Q856535","display_name":"Current transformer","level":4,"score":0.6234359741210938},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6217378377914429},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.5635252594947815},{"id":"https://openalex.org/C207912722","wikidata":"https://www.wikidata.org/wiki/Q1259123","display_name":"Signal generator","level":3,"score":0.513846218585968},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.46903762221336365},{"id":"https://openalex.org/C108307224","wikidata":"https://www.wikidata.org/wiki/Q629983","display_name":"Arbitrary waveform generator","level":4,"score":0.4661110043525696},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4516654312610626},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3633121848106384},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2531428933143616},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08602756261825562},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/amps59207.2023.10297152","is_oa":false,"landing_page_url":"https://doi.org/10.1109/amps59207.2023.10297152","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 13th International Workshop on Applied Measurements for Power Systems (AMPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1257285","is_oa":false,"landing_page_url":"https://hdl.handle.net/11311/1257285","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2056561565","https://openalex.org/W2098397735","https://openalex.org/W2466427413","https://openalex.org/W2494837712","https://openalex.org/W2587496665","https://openalex.org/W2593838945","https://openalex.org/W2726174371","https://openalex.org/W2792827519","https://openalex.org/W2795298520","https://openalex.org/W2906651697","https://openalex.org/W2994432237","https://openalex.org/W3010579655","https://openalex.org/W3108997813","https://openalex.org/W4206180546","https://openalex.org/W4211226915","https://openalex.org/W4235109919","https://openalex.org/W4290465967","https://openalex.org/W4362683601","https://openalex.org/W4378528376","https://openalex.org/W6631362934"],"related_works":["https://openalex.org/W3128433826","https://openalex.org/W2168529281","https://openalex.org/W2378673986","https://openalex.org/W978543704","https://openalex.org/W2027674118","https://openalex.org/W2385502811","https://openalex.org/W2387706796","https://openalex.org/W2353206139","https://openalex.org/W2391206061","https://openalex.org/W2978914987"],"abstract_inverted_index":{"Many":[0],"papers":[1],"in":[2,20,96,143,157],"the":[3,28,50,63,92,112,115,135,149,153],"scientific":[4],"literature":[5],"show":[6],"that":[7,33,89,131,139],"a":[8,69,77,85,124],"thorough":[9],"accuracy":[10],"testing":[11],"of":[12,30,104,114],"Current":[13],"Transformers":[14],"(CTs)":[15],"employed":[16],"for":[17,84,122,134],"harmonic":[18],"measurements":[19],"ac":[21],"power":[22],"systems":[23],"should":[24,73],"be":[25,74],"based":[26,75],"on":[27,76],"injection":[29],"multitone":[31,160],"waveforms":[32,163],"are":[34],"similar":[35],"to":[36,49,62],"those":[37],"found":[38],"during":[39],"regular":[40],"operation.":[41],"CTs":[42],"typically":[43,141],"measure":[44],"three-phase":[45,79,86],"currents":[46],"and":[47,59,107,152],"according":[48],"sensing":[51],"principle":[52,151],"they":[53],"may":[54],"suffer":[55],"from":[56],"both":[57],"nonlinearity":[58],"crosstalk":[60],"due":[61],"other":[64],"phases.":[65],"For":[66],"this":[67,82,110],"reason,":[68],"full":[70],"metrological":[71],"characterization":[72],"truly":[78],"testing.":[80],"However,":[81],"demands":[83],"current":[87,129,162],"generator":[88,130],"allows":[90],"applying":[91],"required":[93],"waveforms,":[94],"which":[95],"most":[97],"cases":[98],"it":[99],"is":[100,118,132,140],"not":[101],"available":[102,142],"because":[103],"its":[105,155],"cost":[106],"complexity.":[108],"In":[109],"scenario,":[111],"target":[113],"present":[116],"paper":[117],"proposing":[119],"an":[120],"architecture":[121],"implementing":[123],"low-cost":[125],"three-phase,":[126],"three-":[127],"wire":[128],"suitable":[133],"purpose,":[136],"using":[137],"instrumentation":[138],"calibration":[144],"laboratories.":[145],"After":[146],"having":[147],"discussed":[148],"operating":[150],"implementation,":[154],"performance":[156],"generating":[158],"realistic":[159],"periodic":[161],"has":[164],"been":[165],"assessed.":[166]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}