{"id":"https://openalex.org/W1954763644","doi":"https://doi.org/10.1109/amps.2015.7312741","title":"Monitoring of power transformer bushings in high voltage substations","display_name":"Monitoring of power transformer bushings in high voltage substations","publication_year":2015,"publication_date":"2015-09-01","ids":{"openalex":"https://openalex.org/W1954763644","doi":"https://doi.org/10.1109/amps.2015.7312741","mag":"1954763644"},"language":"en","primary_location":{"id":"doi:10.1109/amps.2015.7312741","is_oa":false,"landing_page_url":"https://doi.org/10.1109/amps.2015.7312741","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Workshop on Applied Measurements for Power Systems (AMPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084326215","display_name":"Loredana Cristaldi","orcid":"https://orcid.org/0000-0002-8446-8203"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Loredana Cristaldi","raw_affiliation_strings":["Politecnico di Milano, Milano, Lombardia, IT","DEIB, Politecnico di Milano, Milano, ITALY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano, Milano, Lombardia, IT","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB, Politecnico di Milano, Milano, ITALY","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001972308","display_name":"Marco Faifer","orcid":"https://orcid.org/0000-0002-8777-5444"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Faifer","raw_affiliation_strings":["Politecnico di Milano, Milano, Lombardia, IT","DEIB, Politecnico di Milano, Milano, ITALY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano, Milano, Lombardia, IT","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB, Politecnico di Milano, Milano, ITALY","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059759550","display_name":"Christian Laurano","orcid":"https://orcid.org/0000-0002-6011-6246"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Christian Laurano","raw_affiliation_strings":["Politecnico di Milano, Milano, Lombardia, IT","DEIB, Politecnico di Milano, Milano, ITALY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano, Milano, Lombardia, IT","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB, Politecnico di Milano, Milano, ITALY","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017740145","display_name":"Roberto Ottoboni","orcid":"https://orcid.org/0000-0002-5371-1346"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Roberto Ottoboni","raw_affiliation_strings":["DEIB, Politecnico di Milano Milano, Italy","DEIB, Politecnico di Milano, Milano, ITALY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DEIB, Politecnico di Milano Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB, Politecnico di Milano, Milano, ITALY","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003675815","display_name":"Sergio Toscani","orcid":"https://orcid.org/0000-0003-2317-5818"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sergio Toscani","raw_affiliation_strings":["DEIB, Politecnico di Milano Milano, Italy","DEIB, Politecnico di Milano, Milano, ITALY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DEIB, Politecnico di Milano Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB, Politecnico di Milano, Milano, ITALY","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":2.0588,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.86003228,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10787","display_name":"Lightning and Electromagnetic Phenomena","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bushing","display_name":"Bushing","score":0.9936931133270264},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.659305989742279},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5685514807701111},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5530930161476135},{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.5380117297172546},{"id":"https://openalex.org/keywords/transmission-line","display_name":"Transmission line","score":0.5372884273529053},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.535006582736969},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5172625184059143},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5025632381439209},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4793699085712433},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.45940887928009033},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39789044857025146},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3355955481529236},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2112393081188202},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1093468964099884},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.08102381229400635}],"concepts":[{"id":"https://openalex.org/C30293662","wikidata":"https://www.wikidata.org/wiki/Q2262992","display_name":"Bushing","level":2,"score":0.9936931133270264},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.659305989742279},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5685514807701111},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5530930161476135},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.5380117297172546},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.5372884273529053},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.535006582736969},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5172625184059143},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5025632381439209},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4793699085712433},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.45940887928009033},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39789044857025146},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3355955481529236},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2112393081188202},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1093468964099884},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.08102381229400635},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/amps.2015.7312741","is_oa":false,"landing_page_url":"https://doi.org/10.1109/amps.2015.7312741","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Workshop on Applied Measurements for Power Systems (AMPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/983009","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/983009","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.46000000834465027,"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10"},{"score":0.4300000071525574,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1974616917","https://openalex.org/W2005874892","https://openalex.org/W2036844886","https://openalex.org/W2065673930","https://openalex.org/W2070574631","https://openalex.org/W2096039780","https://openalex.org/W2108757374","https://openalex.org/W2112205209","https://openalex.org/W2134735283","https://openalex.org/W2138140044","https://openalex.org/W2140723035","https://openalex.org/W2537780002","https://openalex.org/W2544730462","https://openalex.org/W6643862868"],"related_works":["https://openalex.org/W2742827818","https://openalex.org/W2001989632","https://openalex.org/W2012090846","https://openalex.org/W3115307632","https://openalex.org/W2554019664","https://openalex.org/W4255886484","https://openalex.org/W787855002","https://openalex.org/W2949628984","https://openalex.org/W2096055231","https://openalex.org/W2543668496"],"abstract_inverted_index":{"Power":[0],"transformer":[1,46],"bushings":[2,47],"are":[3],"among":[4],"the":[5,14,36,51,59,62,73,77,90,104,111,123,126,130,136,139,150,153,161,183,186,193,196],"least":[6],"reliable":[7],"components":[8],"in":[9,191],"high":[10,85,197],"voltage":[11,198],"systems,":[12],"therefore":[13],"knowledge":[15],"of":[16,30,38,40,61,125,138,152,160,185,195],"their":[17],"wear":[18],"condition":[19],"is":[20,33,81,94,99,119,163],"very":[21],"important":[22],"for":[23,45],"a":[24,84,156,168,175],"proper":[25,181],"network":[26],"management.":[27],"The":[28,53,79],"aim":[29],"this":[31,116,166],"work":[32],"to":[34,56,71,103,121,129,135,143,148],"study":[35],"limits":[37],"applicability":[39,151,184],"an":[41],"on-line":[42],"monitoring":[43,154],"method":[44,80,187],"previously":[48],"presented":[49],"by":[50],"authors.":[52],"technique":[54],"allows":[55],"continuously":[57],"estimate":[58],"variation":[60],"bushing":[63,74,91,131],"capacitance":[64],"and":[65,147],"its":[66,97],"dissipation":[67],"factor,":[68],"without":[69],"requiring":[70],"disconnect":[72],"itself":[75],"from":[76,132],"network.":[78],"based":[82],"on":[83,110],"frequency":[86,176],"impedance":[87],"measurement":[88],"at":[89],"tap.":[92],"It":[93],"clear":[95],"that":[96],"value":[98],"not":[100],"only":[101],"related":[102],"bushing,":[105],"but":[106],"it":[107,118],"also":[108],"depends":[109],"other":[112],"substation":[113,162,170],"devices.":[114],"For":[115],"reason,":[117],"vital":[120],"discriminate":[122],"variations":[124],"parameters":[127],"due":[128,134],"those":[133],"rest":[137],"components.":[140],"In":[141,165],"order":[142],"understand":[144],"these":[145],"dependencies":[146],"evaluate":[149],"method,":[155],"high-frequency":[157],"equivalent":[158],"model":[159],"required.":[164],"work,":[167],"typical":[169],"has":[171,188,201],"been":[172,189,202],"modeled":[173],"considering":[174],"around":[177],"1":[178],"MHz.":[179],"Through":[180],"simulations,":[182],"investigated,":[190],"particular":[192],"impact":[194],"transmission":[199],"lines":[200],"studied.":[203]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}