{"id":"https://openalex.org/W2117902105","doi":"https://doi.org/10.1109/allerton.2010.5707107","title":"Reliability analysis of future special protection schemes","display_name":"Reliability analysis of future special protection schemes","publication_year":2010,"publication_date":"2010-09-01","ids":{"openalex":"https://openalex.org/W2117902105","doi":"https://doi.org/10.1109/allerton.2010.5707107","mag":"2117902105"},"language":"en","primary_location":{"id":"doi:10.1109/allerton.2010.5707107","is_oa":false,"landing_page_url":"https://doi.org/10.1109/allerton.2010.5707107","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 48th Annual Allerton Conference on Communication, Control, and Computing (Allerton)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049691833","display_name":"Kai Jiang","orcid":"https://orcid.org/0000-0002-3543-8825"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]},{"id":"https://openalex.org/I58152225","display_name":"Texas A&M University at Qatar","ror":"https://ror.org/03vb4dm14","country_code":"QA","type":"education","lineage":["https://openalex.org/I58152225","https://openalex.org/I91045830"]}],"countries":["QA","US"],"is_corresponding":true,"raw_author_name":"Kai Jiang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Texas A and M University, Qatar, College Station, TX, USA","Department of Electrical & Computer Engineering, Texas A&M University, College Station, 77843-3128 USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Texas A and M University, Qatar, College Station, TX, USA","institution_ids":["https://openalex.org/I58152225"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Texas A&M University, College Station, 77843-3128 USA#TAB#","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041128595","display_name":"Chanan Singh","orcid":"https://orcid.org/0000-0003-1941-1259"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]},{"id":"https://openalex.org/I58152225","display_name":"Texas A&M University at Qatar","ror":"https://ror.org/03vb4dm14","country_code":"QA","type":"education","lineage":["https://openalex.org/I58152225","https://openalex.org/I91045830"]}],"countries":["QA","US"],"is_corresponding":false,"raw_author_name":"Chanan Singh","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Texas A and M University, Qatar, College Station, TX, USA","Department of Electrical & Computer Engineering, Texas A&M University, College Station, 77843-3128 USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Texas A and M University, Qatar, College Station, TX, USA","institution_ids":["https://openalex.org/I58152225"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Texas A&M University, College Station, 77843-3128 USA#TAB#","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5049691833"],"corresponding_institution_ids":["https://openalex.org/I58152225","https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":4.4908,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.94242479,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1614","last_page":"1621"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.731094241142273},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7069441080093384},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6596205830574036},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.5238583087921143},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.4205670654773712},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.35100752115249634},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2501233220100403},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.19963011145591736}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.731094241142273},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7069441080093384},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6596205830574036},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.5238583087921143},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.4205670654773712},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.35100752115249634},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2501233220100403},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.19963011145591736},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/allerton.2010.5707107","is_oa":false,"landing_page_url":"https://doi.org/10.1109/allerton.2010.5707107","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 48th Annual Allerton Conference on Communication, Control, and Computing (Allerton)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1662686153","https://openalex.org/W1982708527","https://openalex.org/W2007089229","https://openalex.org/W2025057466","https://openalex.org/W2054866331","https://openalex.org/W2082405709","https://openalex.org/W2103308411","https://openalex.org/W2136036456","https://openalex.org/W2171176312","https://openalex.org/W2183651468","https://openalex.org/W2525758159","https://openalex.org/W2542769575","https://openalex.org/W3152409212","https://openalex.org/W6679923857","https://openalex.org/W6686302849","https://openalex.org/W6727146234"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"The":[0,21,50,68],"penetration":[1],"of":[2,12,23,52,55,70,85],"information-age":[3],"technologies":[4],"can":[5],"bring":[6],"significant":[7],"changes":[8],"to":[9,32,58,80],"the":[10,24,48,59,71,76,82,86],"area":[11],"instrumentation,":[13],"monitoring,":[14],"control,":[15],"and":[16,75],"protection":[17,26],"in":[18,47,65,92],"power":[19],"systems.":[20],"development":[22],"special":[25],"schemes":[27],"(SPS)":[28],"is":[29,45,63,90],"also":[30],"likely":[31],"be":[33],"influenced":[34],"greatly.":[35],"This":[36],"paper":[37],"proposes":[38],"a":[39],"conceptual":[40],"all-digital":[41,61],"SPS":[42,62,88],"architecture":[43,89],"which":[44],"possible":[46],"future.":[49],"application":[51],"general":[53],"methodologies":[54],"reliability":[56,83],"analysis":[57],"new":[60],"focused":[64],"this":[66],"paper.":[67],"implementation":[69],"network":[72],"reduction":[73],"method":[74,79],"Markov":[77],"modeling":[78],"obtain":[81],"indices":[84],"proposed":[87],"illustrated":[91],"detail.":[93]},"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}