{"id":"https://openalex.org/W2944499651","doi":"https://doi.org/10.1109/aipr.2018.8707401","title":"Line Segments based Rotation Invariant Descriptor for Disparate Images","display_name":"Line Segments based Rotation Invariant Descriptor for Disparate Images","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2944499651","doi":"https://doi.org/10.1109/aipr.2018.8707401","mag":"2944499651"},"language":"en","primary_location":{"id":"doi:10.1109/aipr.2018.8707401","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aipr.2018.8707401","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032560582","display_name":"Teena Sharma","orcid":"https://orcid.org/0000-0001-6709-1435"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Teena Sharma","raw_affiliation_strings":["Dept. of Electrical Engineering, Indian Institute of Technology Kanpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Indian Institute of Technology Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044732554","display_name":"Pooja Agrawal","orcid":"https://orcid.org/0000-0001-5464-8118"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Pooja Agrawal","raw_affiliation_strings":["Dept. of Electrical Engineering, Indian Institute of Technology Kanpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Indian Institute of Technology Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043983619","display_name":"Piyush Sahoo","orcid":null},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Piyush Sahoo","raw_affiliation_strings":["Dept. of Electrical Engineering, Indian Institute of Technology Kanpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Indian Institute of Technology Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014147535","display_name":"Nishchal K. Verma","orcid":"https://orcid.org/0000-0001-8752-5616"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Nishchal K. Verma","raw_affiliation_strings":["Dept. of Electrical Engineering, Indian Institute of Technology Kanpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Indian Institute of Technology Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069050515","display_name":"Shantaram Vasikarla","orcid":null},"institutions":[{"id":"https://openalex.org/I127339247","display_name":"California State University System","ror":"https://ror.org/020qm1538","country_code":"US","type":"education","lineage":["https://openalex.org/I127339247"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shantaram Vasikarla","raw_affiliation_strings":["Dept. of Computer Science, California State University, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science, California State University, CA","institution_ids":["https://openalex.org/I127339247"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7109512090682983},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6054359674453735},{"id":"https://openalex.org/keywords/invariant","display_name":"Invariant (physics)","score":0.596479058265686},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5797610282897949},{"id":"https://openalex.org/keywords/rotation","display_name":"Rotation (mathematics)","score":0.5634281635284424},{"id":"https://openalex.org/keywords/point-set-registration","display_name":"Point set registration","score":0.5336236357688904},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.4937368333339691},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.48644018173217773},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.41609466075897217},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3451380729675293},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.10322728753089905}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7109512090682983},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6054359674453735},{"id":"https://openalex.org/C190470478","wikidata":"https://www.wikidata.org/wiki/Q2370229","display_name":"Invariant (physics)","level":2,"score":0.596479058265686},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5797610282897949},{"id":"https://openalex.org/C74050887","wikidata":"https://www.wikidata.org/wiki/Q848368","display_name":"Rotation (mathematics)","level":2,"score":0.5634281635284424},{"id":"https://openalex.org/C200336642","wikidata":"https://www.wikidata.org/wiki/Q15058706","display_name":"Point set registration","level":3,"score":0.5336236357688904},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.4937368333339691},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.48644018173217773},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.41609466075897217},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3451380729675293},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.10322728753089905},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C37914503","wikidata":"https://www.wikidata.org/wiki/Q156495","display_name":"Mathematical physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aipr.2018.8707401","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aipr.2018.8707401","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1677409904","https://openalex.org/W2099363089","https://openalex.org/W2115439018","https://openalex.org/W2119605622","https://openalex.org/W2151103935","https://openalex.org/W2156953558","https://openalex.org/W2177274842","https://openalex.org/W2194949381","https://openalex.org/W2313061539","https://openalex.org/W2507287376","https://openalex.org/W2598742729","https://openalex.org/W2787580321","https://openalex.org/W2880905934","https://openalex.org/W2888927335","https://openalex.org/W2888962714","https://openalex.org/W2889042841","https://openalex.org/W2889212808","https://openalex.org/W2889491988","https://openalex.org/W3004860231","https://openalex.org/W3131766545","https://openalex.org/W4309650892","https://openalex.org/W6687686492","https://openalex.org/W6753892862","https://openalex.org/W6774006155"],"related_works":["https://openalex.org/W1972035260","https://openalex.org/W4301594054","https://openalex.org/W2016145238","https://openalex.org/W68787175","https://openalex.org/W2085818817","https://openalex.org/W2359134215","https://openalex.org/W2343272898","https://openalex.org/W2385593246","https://openalex.org/W2021831821","https://openalex.org/W1182131121"],"abstract_inverted_index":{"Computer":[0],"vision-based":[1],"real-time":[2],"applications":[3],"demand":[4],"robust":[5],"image":[6,64,103],"matching":[7,92],"approaches":[8],"due":[9],"to":[10,112],"disparity":[11],"in":[12,61,81,120],"images.":[13,95],"This":[14,27],"can":[15],"be":[16],"achieved":[17],"using":[18,130],"descriptor":[19,33,43,56,87,119],"vector":[20,34,88],"with":[21,105,134],"scale":[22],"and":[23],"rotation":[24,31,106],"invariance":[25],"capability.":[26],"paper":[28],"presents":[29],"a":[30,45,73],"invariant":[32],"formation":[35],"based":[36],"on":[37],"line":[38,58,68],"point":[39,51],"duality.":[40],"The":[41,85],"proposed":[42,118],"uses":[44],"simple":[46],"consistent":[47],"method":[48],"of":[49,75,93,110,116],"key":[50,79],"detection.":[52],"For":[53,122],"obtaining":[54],"the":[55,62,82,108,114,117],"vector,":[57],"segments":[59,69],"present":[60],"input":[63,83],"are":[65,70,97],"used.":[66],"These":[67],"located":[71],"within":[72],"region":[74],"interest":[76],"around":[77],"obtained":[78,86],"points":[80],"image.":[84],"is":[89,128],"used":[90],"for":[91,100],"disparate":[94],"Experiments":[96],"carried":[98],"out":[99],"four":[101],"different":[102],"sets":[104],"at":[107],"range":[109],"angles":[111],"validate":[113],"performance":[115],"real-time.":[121],"comparative":[123],"study,":[124],"normalized":[125],"match":[126],"ratio":[127],"computed":[129],"multi-layered":[131],"neural":[132],"network":[133],"two":[135],"hidden":[136],"layers.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}