{"id":"https://openalex.org/W2889947384","doi":"https://doi.org/10.1109/aipr.2017.8457956","title":"Addressing supply chain risks of microelectronic devices through computer vision","display_name":"Addressing supply chain risks of microelectronic devices through computer vision","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2889947384","doi":"https://doi.org/10.1109/aipr.2017.8457956","mag":"2889947384"},"language":"en","primary_location":{"id":"doi:10.1109/aipr.2017.8457956","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aipr.2017.8457956","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100775427","display_name":"Zhenhua Chen","orcid":"https://orcid.org/0000-0002-5195-2234"},"institutions":[{"id":"https://openalex.org/I4210119109","display_name":"Indiana University Bloomington","ror":"https://ror.org/02k40bc56","country_code":"US","type":"education","lineage":["https://openalex.org/I4210119109","https://openalex.org/I592451"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Zhenhua Chen","raw_affiliation_strings":["School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN"],"affiliations":[{"raw_affiliation_string":"School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN","institution_ids":["https://openalex.org/I4210119109"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076569669","display_name":"Tingyi Wanyan","orcid":"https://orcid.org/0000-0002-5011-3973"},"institutions":[{"id":"https://openalex.org/I4210119109","display_name":"Indiana University Bloomington","ror":"https://ror.org/02k40bc56","country_code":"US","type":"education","lineage":["https://openalex.org/I4210119109","https://openalex.org/I592451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tingyi Wanyan","raw_affiliation_strings":["School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN"],"affiliations":[{"raw_affiliation_string":"School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN","institution_ids":["https://openalex.org/I4210119109"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112865231","display_name":"Ramya Rao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119109","display_name":"Indiana University Bloomington","ror":"https://ror.org/02k40bc56","country_code":"US","type":"education","lineage":["https://openalex.org/I4210119109","https://openalex.org/I592451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ramya Rao","raw_affiliation_strings":["School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN"],"affiliations":[{"raw_affiliation_string":"School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN","institution_ids":["https://openalex.org/I4210119109"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042538463","display_name":"Benjamin Cutilli","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119109","display_name":"Indiana University Bloomington","ror":"https://ror.org/02k40bc56","country_code":"US","type":"education","lineage":["https://openalex.org/I4210119109","https://openalex.org/I592451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Benjamin Cutilli","raw_affiliation_strings":["School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN"],"affiliations":[{"raw_affiliation_string":"School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN","institution_ids":["https://openalex.org/I4210119109"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108091906","display_name":"J. Sowi\u0144ski","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119109","display_name":"Indiana University Bloomington","ror":"https://ror.org/02k40bc56","country_code":"US","type":"education","lineage":["https://openalex.org/I4210119109","https://openalex.org/I592451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James Sowinski","raw_affiliation_strings":["School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN"],"affiliations":[{"raw_affiliation_string":"School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN","institution_ids":["https://openalex.org/I4210119109"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003268415","display_name":"David Crandall","orcid":"https://orcid.org/0000-0002-5827-5344"},"institutions":[{"id":"https://openalex.org/I4210119109","display_name":"Indiana University Bloomington","ror":"https://ror.org/02k40bc56","country_code":"US","type":"education","lineage":["https://openalex.org/I4210119109","https://openalex.org/I592451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Crandall","raw_affiliation_strings":["School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN"],"affiliations":[{"raw_affiliation_string":"School of Informatics, Computing, and Engineering, Indiana University, Bloomington, IN","institution_ids":["https://openalex.org/I4210119109"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036138371","display_name":"Robert Templeman","orcid":null},"institutions":[{"id":"https://openalex.org/I2802287952","display_name":"Naval Surface Warfare Center","ror":"https://ror.org/03d4ecn10","country_code":"US","type":"facility","lineage":["https://openalex.org/I1328969757","https://openalex.org/I1330347796","https://openalex.org/I2802287952","https://openalex.org/I3130687028"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Robert Templeman","raw_affiliation_strings":["Crane Division, Naval Surface Warfare Center, Crane, IN"],"affiliations":[{"raw_affiliation_string":"Crane Division, Naval Surface Warfare Center, Crane, IN","institution_ids":["https://openalex.org/I2802287952"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100775427"],"corresponding_institution_ids":["https://openalex.org/I4210119109"],"apc_list":null,"apc_paid":null,"fwci":0.2867,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.62500633,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"8","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.903889536857605},{"id":"https://openalex.org/keywords/counterfeit","display_name":"Counterfeit","score":0.7394181489944458},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6464486122131348},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5595681071281433},{"id":"https://openalex.org/keywords/supply-chain","display_name":"Supply chain","score":0.5387983918190002},{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.5129139423370361},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5081944465637207},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.505169689655304},{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.4522932767868042},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4271897077560425},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3959219753742218},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3368186950683594},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.3245081603527069},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29048866033554077},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23141822218894958},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1750933825969696},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1250039041042328}],"concepts":[{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.903889536857605},{"id":"https://openalex.org/C2779356469","wikidata":"https://www.wikidata.org/wiki/Q502918","display_name":"Counterfeit","level":2,"score":0.7394181489944458},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6464486122131348},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5595681071281433},{"id":"https://openalex.org/C108713360","wikidata":"https://www.wikidata.org/wiki/Q1824206","display_name":"Supply chain","level":2,"score":0.5387983918190002},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.5129139423370361},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5081944465637207},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.505169689655304},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.4522932767868042},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4271897077560425},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3959219753742218},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3368186950683594},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.3245081603527069},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29048866033554077},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23141822218894958},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1750933825969696},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1250039041042328},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aipr.2017.8457956","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aipr.2017.8457956","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6499999761581421,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306111","display_name":"U.S. Department of Commerce","ror":"https://ror.org/04chq2495"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":52,"referenced_works":["https://openalex.org/W199948672","https://openalex.org/W283009591","https://openalex.org/W745875053","https://openalex.org/W905188449","https://openalex.org/W1212490493","https://openalex.org/W1597628491","https://openalex.org/W1625255723","https://openalex.org/W1677182931","https://openalex.org/W1970554723","https://openalex.org/W1971802165","https://openalex.org/W1987835579","https://openalex.org/W1998834041","https://openalex.org/W2004901269","https://openalex.org/W2015604461","https://openalex.org/W2017814585","https://openalex.org/W2024971501","https://openalex.org/W2039885833","https://openalex.org/W2057480608","https://openalex.org/W2076802384","https://openalex.org/W2093137120","https://openalex.org/W2107176174","https://openalex.org/W2110764733","https://openalex.org/W2111440402","https://openalex.org/W2113221323","https://openalex.org/W2163605009","https://openalex.org/W2174896420","https://openalex.org/W2177914549","https://openalex.org/W2297976743","https://openalex.org/W2415766129","https://openalex.org/W2473536074","https://openalex.org/W2478895222","https://openalex.org/W2511192821","https://openalex.org/W2581098894","https://openalex.org/W2593942734","https://openalex.org/W2962858109","https://openalex.org/W4243036236","https://openalex.org/W4243195860","https://openalex.org/W4245046367","https://openalex.org/W4246504800","https://openalex.org/W4252653098","https://openalex.org/W4295110498","https://openalex.org/W6608058824","https://openalex.org/W6635614406","https://openalex.org/W6636494156","https://openalex.org/W6642952686","https://openalex.org/W6654896396","https://openalex.org/W6673857877","https://openalex.org/W6676885845","https://openalex.org/W6676930236","https://openalex.org/W6684191040","https://openalex.org/W6697645995","https://openalex.org/W6725168036"],"related_works":["https://openalex.org/W2783354812","https://openalex.org/W4384112194","https://openalex.org/W2103009189","https://openalex.org/W4312958259","https://openalex.org/W4308259661","https://openalex.org/W4390813131","https://openalex.org/W2041294738","https://openalex.org/W2018464517","https://openalex.org/W294051742","https://openalex.org/W2460662058"],"abstract_inverted_index":{"Microelectronics":[0],"are":[1],"at":[2,98],"the":[3,55,106,109,125,158,164],"heart":[4],"of":[5,31,37,46,60,108,124,151,160,167],"nearly":[6],"all":[7,45],"modern":[8,146],"devices,":[9],"ranging":[10],"from":[11,34,132],"small":[12],"embedded":[13],"integrated":[14],"circuits":[15],"(ICs)":[16],"inside":[17],"household":[18],"products":[19],"to":[20,51,71,76,87,128,170],"complex":[21],"microprocessors":[22],"that":[23,105,145],"power":[24],"critical":[25,65],"infrastructure":[26],"systems.":[27],"Devices":[28],"often":[29],"consist":[30],"numerous":[32],"ICs":[33],"a":[35,64,100,116,133],"variety":[36],"different":[38,43],"manufacturers":[39],"and":[40,58,113,115,176],"procured":[41],"through":[42],"vendors,":[44],"whom":[47],"may":[48],"be":[49,96],"trusted":[50],"varying":[52],"degrees.":[53],"Ensuring":[54],"quality,":[56],"safety,":[57],"security":[59],"these":[61],"components":[62],"is":[63,70,141],"challenge.":[66],"One":[67],"possible":[68],"solution":[69],"use":[72],"automated":[73],"imaging":[74],"techniques":[75],"check":[77],"devices'":[78],"physical":[79],"appearance":[80],"against":[81],"known":[82],"reference":[83,134],"models":[84],"in":[85,139],"order":[86],"detect":[88,129],"counterfeit":[89],"or":[90],"malicious":[91],"components.":[92],"This":[93,136],"analysis":[94,138],"can":[95,148],"performed":[97],"both":[99],"macro":[101],"level":[102,118],"(i.e.,":[103,119],"ensuring":[104],"packaging":[107],"IC":[110],"appears":[111],"legitimate":[112],"undamaged)":[114],"micro":[117],"comparing":[120],"microscopic,":[121],"transistor-level":[122],"imagery":[123],"circuit":[126],"itself":[127],"suspicious":[130],"deviations":[131],"model).":[135],"latter":[137],"particular":[140],"very":[142],"challenging,":[143],"considering":[144],"devices":[147],"contain":[149],"billions":[150],"transistors.":[152],"In":[153],"this":[154],"paper,":[155],"we":[156],"review":[157],"problem":[159],"microelectronics":[161,171],"counterfeiting,":[162],"discuss":[163],"potential":[165],"application":[166],"computer":[168],"vision":[169],"inspection,":[172],"present":[173],"initial":[174],"results,":[175],"recommend":[177],"directions":[178],"for":[179],"future":[180],"work.":[181]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}