{"id":"https://openalex.org/W4383501607","doi":"https://doi.org/10.1109/aicas57966.2023.10168638","title":"Read-disturb Detection Methodology for RRAM-based Computation-in-Memory Architecture","display_name":"Read-disturb Detection Methodology for RRAM-based Computation-in-Memory Architecture","publication_year":2023,"publication_date":"2023-06-11","ids":{"openalex":"https://openalex.org/W4383501607","doi":"https://doi.org/10.1109/aicas57966.2023.10168638"},"language":"en","primary_location":{"id":"doi:10.1109/aicas57966.2023.10168638","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aicas57966.2023.10168638","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://repository.tudelft.nl/file/File_a4ac3a95-038a-4527-8a07-113c0cc3a515","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035548082","display_name":"Mohammad Amin Yaldagard","orcid":"https://orcid.org/0000-0001-5333-7270"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Mohammad Amin Yaldagard","raw_affiliation_strings":["Delft University of Technology,Computer Engineering Lab,Delft,The Netherlands","Computer Engineering Lab, Delft University of Technology, Delft, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology,Computer Engineering Lab,Delft,The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Computer Engineering Lab, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038299694","display_name":"Sumit Diware","orcid":"https://orcid.org/0000-0003-4461-1623"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Sumit Diware","raw_affiliation_strings":["Delft University of Technology,Computer Engineering Lab,Delft,The Netherlands","Computer Engineering Lab, Delft University of Technology, Delft, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology,Computer Engineering Lab,Delft,The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Computer Engineering Lab, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105554115","display_name":"Rajiv Joshi","orcid":"https://orcid.org/0009-0007-7486-1531"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rajiv V. Joshi","raw_affiliation_strings":["IBM Research Division,Yorktown Heights,NY,USA","IBM Research Division, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Research Division,Yorktown Heights,NY,USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM Research Division, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Said Hamdioui","raw_affiliation_strings":["Delft University of Technology,Computer Engineering Lab,Delft,The Netherlands","Computer Engineering Lab, Delft University of Technology, Delft, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology,Computer Engineering Lab,Delft,The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Computer Engineering Lab, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103277679","display_name":"Rajendra Bishnoi","orcid":"https://orcid.org/0000-0002-1590-0365"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Rajendra Bishnoi","raw_affiliation_strings":["Delft University of Technology,Computer Engineering Lab,Delft,The Netherlands","Computer Engineering Lab, Delft University of Technology, Delft, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology,Computer Engineering Lab,Delft,The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Computer Engineering Lab, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5035548082"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":0.9318,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.74261266,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.8829381465911865},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7856722474098206},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.5891199707984924},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.5493422150611877},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5317123532295227},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.44950708746910095},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4053974747657776},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34536612033843994},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3281214237213135},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17077577114105225},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1365039050579071},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11631160974502563},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10571929812431335}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.8829381465911865},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7856722474098206},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5891199707984924},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.5493422150611877},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5317123532295227},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.44950708746910095},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4053974747657776},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34536612033843994},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3281214237213135},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17077577114105225},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1365039050579071},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11631160974502563},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10571929812431335},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/aicas57966.2023.10168638","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aicas57966.2023.10168638","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:tudelft.nl:uuid:21aefc58-7c7f-487c-9bbb-d7cfb10b4e86","is_oa":true,"landing_page_url":"http://resolver.tudelft.nl/uuid:21aefc58-7c7f-487c-9bbb-d7cfb10b4e86","pdf_url":"https://repository.tudelft.nl/file/File_a4ac3a95-038a-4527-8a07-113c0cc3a515","source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conference paper"}],"best_oa_location":{"id":"pmh:oai:tudelft.nl:uuid:21aefc58-7c7f-487c-9bbb-d7cfb10b4e86","is_oa":true,"landing_page_url":"http://resolver.tudelft.nl/uuid:21aefc58-7c7f-487c-9bbb-d7cfb10b4e86","pdf_url":"https://repository.tudelft.nl/file/File_a4ac3a95-038a-4527-8a07-113c0cc3a515","source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conference paper"},"sustainable_development_goals":[{"score":0.9100000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4383501607.pdf"},"referenced_works_count":21,"referenced_works":["https://openalex.org/W1806144281","https://openalex.org/W2603636614","https://openalex.org/W2960778947","https://openalex.org/W3013080934","https://openalex.org/W3017267458","https://openalex.org/W3040302020","https://openalex.org/W3081228736","https://openalex.org/W3082899001","https://openalex.org/W3119933723","https://openalex.org/W3155456425","https://openalex.org/W3157191380","https://openalex.org/W3175345297","https://openalex.org/W3194056411","https://openalex.org/W4226111665","https://openalex.org/W4229015029","https://openalex.org/W4251342985","https://openalex.org/W4285173196","https://openalex.org/W4292121737","https://openalex.org/W4308575307","https://openalex.org/W4312986799","https://openalex.org/W6847660619"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W1943174035","https://openalex.org/W2054635671","https://openalex.org/W2096437374","https://openalex.org/W1928481607","https://openalex.org/W3195722497","https://openalex.org/W2167784970","https://openalex.org/W1980301972","https://openalex.org/W2587448511","https://openalex.org/W2199653281"],"abstract_inverted_index":{"Resistive":[0],"random":[1],"access":[2],"memory":[3],"(RRAM)":[4],"based":[5],"computation-in-memory":[6],"(CIM)":[7],"architectures":[8,31],"can":[9,32],"meet":[10],"the":[11,25,40,89,103,117,131],"unprecedented":[12],"energy":[13],"efficiency":[14],"requirements":[15],"to":[16,34,101,119],"execute":[17],"AI":[18],"algorithms":[19],"directly":[20],"on":[21],"edge":[22],"devices.":[23],"However,":[24],"read-disturb":[26,76,111],"problem":[27],"associated":[28],"with":[29],"these":[30,53],"lead":[33],"accumulated":[35],"computational":[36,44],"errors.":[37],"To":[38],"achieve":[39],"necessary":[41],"level":[42],"of":[43,50,84,134],"accuracy,":[45],"after":[46],"a":[47,57,62,67,73],"specific":[48],"number":[49],"read":[51],"cycles,":[52],"devices":[54],"must":[55],"undergo":[56],"reprogramming":[58,90],"process":[59],"which":[60,87],"is":[61,99,114],"static":[63],"approach":[64],"and":[65,108],"needs":[66],"large":[68],"counter.":[69],"This":[70],"paper":[71],"proposes":[72],"circuit-level":[74],"RRAM":[75,85],"detection":[77,106,112,137],"technique":[78,113],"by":[79],"monitoring":[80],"real-time":[81],"conductance":[82,105],"drifts":[83],"devices,":[86],"initiate":[88],"when":[91],"actually":[92],"it":[93,121],"needs.":[94],"Moreover,":[95],"an":[96],"analytic":[97],"method":[98],"presented":[100],"determine":[102],"minimum":[104],"requirements,":[107],"our":[109,135],"proposed":[110,136],"tuned":[115],"for":[116],"same":[118],"detect":[120],"dynamically.":[122],"SPICE":[123],"simulation":[124],"result":[125],"using":[126],"TSMC":[127],"40":[128],"nm":[129],"shows":[130],"correct":[132],"functionality":[133],"technique.":[138]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-11T14:59:36.786465","created_date":"2025-10-10T00:00:00"}