{"id":"https://openalex.org/W3177379469","doi":"https://doi.org/10.1109/aicas51828.2021.9458402","title":"Performance of Crossbar based Long Short Term Memory with Aging Memristors","display_name":"Performance of Crossbar based Long Short Term Memory with Aging Memristors","publication_year":2021,"publication_date":"2021-06-06","ids":{"openalex":"https://openalex.org/W3177379469","doi":"https://doi.org/10.1109/aicas51828.2021.9458402","mag":"3177379469"},"language":"en","primary_location":{"id":"doi:10.1109/aicas51828.2021.9458402","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aicas51828.2021.9458402","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 3rd International Conference on Artificial Intelligence Circuits and Systems (AICAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103993419","display_name":"AR Aswani","orcid":null},"institutions":[{"id":"https://openalex.org/I68695296","display_name":"Indian Institute of Information Technology and Management, Kerala","ror":"https://ror.org/02w9cdh50","country_code":"IN","type":"education","lineage":["https://openalex.org/I68695296"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"AR Aswani","raw_affiliation_strings":["NeuroAGI Centre, IIITMK, Trivandrum, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NeuroAGI Centre, IIITMK, Trivandrum, India","institution_ids":["https://openalex.org/I68695296"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103984149","display_name":"Rohan Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I154549908","display_name":"Indian Institute of Technology Jodhpur","ror":"https://ror.org/03yacj906","country_code":"IN","type":"education","lineage":["https://openalex.org/I154549908"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rohan Kumar","raw_affiliation_strings":["Indian Institute of Technology Jodhpur, Jodhpur, Rajasthan, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Jodhpur, Jodhpur, Rajasthan, India","institution_ids":["https://openalex.org/I154549908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083364512","display_name":"Jai Narayan Tripathi","orcid":"https://orcid.org/0000-0001-9109-2948"},"institutions":[{"id":"https://openalex.org/I154549908","display_name":"Indian Institute of Technology Jodhpur","ror":"https://ror.org/03yacj906","country_code":"IN","type":"education","lineage":["https://openalex.org/I154549908"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Jai Narayan Tripathi","raw_affiliation_strings":["Indian Institute of Technology Jodhpur, Jodhpur, Rajasthan, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Jodhpur, Jodhpur, Rajasthan, India","institution_ids":["https://openalex.org/I154549908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017719665","display_name":"Alex Pappachen James","orcid":null},"institutions":[{"id":"https://openalex.org/I68695296","display_name":"Indian Institute of Information Technology and Management, Kerala","ror":"https://ror.org/02w9cdh50","country_code":"IN","type":"education","lineage":["https://openalex.org/I68695296"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Alex James","raw_affiliation_strings":["Innovation and Technology, Kerala University of Digital Sciences, Trivandrum, India","NeuroAGI Centre, IIITMK, Trivandrum, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Innovation and Technology, Kerala University of Digital Sciences, Trivandrum, India","institution_ids":[]},{"raw_affiliation_string":"NeuroAGI Centre, IIITMK, Trivandrum, India","institution_ids":["https://openalex.org/I68695296"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.07840394,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.9691966772079468},{"id":"https://openalex.org/keywords/crossbar-switch","display_name":"Crossbar switch","score":0.9364418387413025},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6977205276489258},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6077693104743958},{"id":"https://openalex.org/keywords/memistor","display_name":"Memistor","score":0.6003368496894836},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.511216402053833},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.5031389594078064},{"id":"https://openalex.org/keywords/term","display_name":"Term (time)","score":0.4810538589954376},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.461119145154953},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4121798276901245},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.34578368067741394},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32800939679145813},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25904107093811035},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19893598556518555},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17146903276443481},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11574432253837585},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10152590274810791},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08655041456222534}],"concepts":[{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.9691966772079468},{"id":"https://openalex.org/C29984679","wikidata":"https://www.wikidata.org/wiki/Q1929149","display_name":"Crossbar switch","level":2,"score":0.9364418387413025},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6977205276489258},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6077693104743958},{"id":"https://openalex.org/C1895703","wikidata":"https://www.wikidata.org/wiki/Q6034938","display_name":"Memistor","level":4,"score":0.6003368496894836},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.511216402053833},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.5031389594078064},{"id":"https://openalex.org/C61797465","wikidata":"https://www.wikidata.org/wiki/Q1188986","display_name":"Term (time)","level":2,"score":0.4810538589954376},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.461119145154953},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4121798276901245},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34578368067741394},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32800939679145813},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25904107093811035},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19893598556518555},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17146903276443481},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11574432253837585},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10152590274810791},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08655041456222534},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aicas51828.2021.9458402","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aicas51828.2021.9458402","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 3rd International Conference on Artificial Intelligence Circuits and Systems (AICAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2013656496","https://openalex.org/W2036166268","https://openalex.org/W2113459411","https://openalex.org/W2795913282","https://openalex.org/W2803914619","https://openalex.org/W2805362231","https://openalex.org/W2895545069","https://openalex.org/W2946591837","https://openalex.org/W2978527443","https://openalex.org/W2979650406","https://openalex.org/W3013080934","https://openalex.org/W3047040508","https://openalex.org/W3081252801","https://openalex.org/W3094245622","https://openalex.org/W3096451388","https://openalex.org/W6676984168","https://openalex.org/W6784606084","https://openalex.org/W6785369026"],"related_works":["https://openalex.org/W2171130799","https://openalex.org/W1568378063","https://openalex.org/W4317826599","https://openalex.org/W2015477599","https://openalex.org/W4253441086","https://openalex.org/W2548135880","https://openalex.org/W2106343578","https://openalex.org/W2516929886","https://openalex.org/W3177379469","https://openalex.org/W2942778963"],"abstract_inverted_index":{"The":[0,19,70],"Long":[1],"Short":[2],"Term":[3],"Memory":[4],"(LSTM)":[5],"neural":[6],"networks":[7],"find":[8],"a":[9],"wide":[10],"range":[11],"of":[12,24,56,59],"applications":[13],"in":[14,63,99,118],"time":[15],"series":[16],"prediction":[17],"problems.":[18],"long-term":[20],"accuracy":[21],"and":[22,36,40,81],"reliability":[23],"LSTM":[25,103],"memristor":[26,33,64,111],"crossbar":[27,68,101],"array":[28],"are":[29,73,113],"subjected":[30],"to":[31],"the":[32,54,67,90,100,106],"device's":[34],"endurance":[35],"failures.":[37],"Memristor":[38],"aging":[39,60,92,107],"its":[41],"impact":[42],"on":[43,66,75],"such":[44],"LSTM's":[45],"performance":[46,71,96],"is":[47],"an":[48],"open":[49],"problem.":[50],"This":[51],"paper":[52],"analyzes":[53],"effects":[55],"different":[57,91,95],"types":[58],"typically":[61],"exhibited":[62],"devices":[65],"performance.":[69],"results":[72],"analyzed":[74],"two":[76],"datasets,":[77],"(1)":[78],"SMS":[79],"Spam":[80],"(2)":[82],"IMDB":[83],"movie":[84],"review.":[85],"Our":[86],"analysis":[87,108],"indicated":[88],"that":[89],"type":[93],"shows":[94],"deterioration":[97],"levels":[98],"based":[102],"system.":[104],"Here,":[105],"for":[109],"oxide-based":[110],"implementation":[112],"primarily":[114],"considered":[115],"when":[116],"used":[117],"CMOS-Memristor":[119],"hybrid":[120],"crossbars.":[121]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}