{"id":"https://openalex.org/W2964987878","doi":"https://doi.org/10.1109/aicas.2019.8771576","title":"A CMOS-based Resistive Crossbar Array with Pulsed Neural Network for Deep Learning Accelerator","display_name":"A CMOS-based Resistive Crossbar Array with Pulsed Neural Network for Deep Learning Accelerator","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2964987878","doi":"https://doi.org/10.1109/aicas.2019.8771576","mag":"2964987878"},"language":"en","primary_location":{"id":"doi:10.1109/aicas.2019.8771576","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aicas.2019.8771576","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057187008","display_name":"Injune Yeo","orcid":"https://orcid.org/0000-0002-4596-6170"},"institutions":[{"id":"https://openalex.org/I39534123","display_name":"Gwangju Institute of Science and Technology","ror":"https://ror.org/024kbgz78","country_code":"KR","type":"education","lineage":["https://openalex.org/I39534123"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Injune Yeo","raw_affiliation_strings":["School of Electrical Engineering and Computer Sicence, Gawangju Institute of Science and Technology (GIST), Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Sicence, Gawangju Institute of Science and Technology (GIST), Korea","institution_ids":["https://openalex.org/I39534123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069525558","display_name":"Sang-Gyun Gi","orcid":"https://orcid.org/0000-0002-2400-1783"},"institutions":[{"id":"https://openalex.org/I39534123","display_name":"Gwangju Institute of Science and Technology","ror":"https://ror.org/024kbgz78","country_code":"KR","type":"education","lineage":["https://openalex.org/I39534123"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang-gyun Gi","raw_affiliation_strings":["School of Electrical Engineering and Computer Sicence, Gawangju Institute of Science and Technology (GIST), Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Sicence, Gawangju Institute of Science and Technology (GIST), Korea","institution_ids":["https://openalex.org/I39534123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040183539","display_name":"Jung-Gyun Kim","orcid":"https://orcid.org/0000-0001-9011-0462"},"institutions":[{"id":"https://openalex.org/I39534123","display_name":"Gwangju Institute of Science and Technology","ror":"https://ror.org/024kbgz78","country_code":"KR","type":"education","lineage":["https://openalex.org/I39534123"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jung-gyun Kim","raw_affiliation_strings":["School of Electrical Engineering and Computer Sicence, Gawangju Institute of Science and Technology (GIST), Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Sicence, Gawangju Institute of Science and Technology (GIST), Korea","institution_ids":["https://openalex.org/I39534123"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036000098","display_name":"Byung\u2010Geun Lee","orcid":"https://orcid.org/0000-0002-1599-690X"},"institutions":[{"id":"https://openalex.org/I39534123","display_name":"Gwangju Institute of Science and Technology","ror":"https://ror.org/024kbgz78","country_code":"KR","type":"education","lineage":["https://openalex.org/I39534123"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byung-geun Lee","raw_affiliation_strings":["School of Electrical Engineering and Computer Sicence, Gawangju Institute of Science and Technology (GIST), Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Sicence, Gawangju Institute of Science and Technology (GIST), Korea","institution_ids":["https://openalex.org/I39534123"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5057187008"],"corresponding_institution_ids":["https://openalex.org/I39534123"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06516252,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"34","last_page":"37"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8349993228912354},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7461552619934082},{"id":"https://openalex.org/keywords/crossbar-switch","display_name":"Crossbar switch","score":0.7117407321929932},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6562550067901611},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6208541989326477},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.47973838448524475},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.472066193819046},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.4438228905200958},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.44144442677497864},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.41606104373931885},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.41205736994743347},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.30662477016448975},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2814328372478485},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2510271668434143},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.20242935419082642},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16362938284873962}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8349993228912354},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7461552619934082},{"id":"https://openalex.org/C29984679","wikidata":"https://www.wikidata.org/wiki/Q1929149","display_name":"Crossbar switch","level":2,"score":0.7117407321929932},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6562550067901611},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6208541989326477},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.47973838448524475},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.472066193819046},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.4438228905200958},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.44144442677497864},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.41606104373931885},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.41205736994743347},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.30662477016448975},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2814328372478485},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2510271668434143},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.20242935419082642},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16362938284873962},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aicas.2019.8771576","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aicas.2019.8771576","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2111968304","https://openalex.org/W2307193480","https://openalex.org/W2735289987","https://openalex.org/W2790556218","https://openalex.org/W2792893539","https://openalex.org/W2803083542","https://openalex.org/W2898994846"],"related_works":["https://openalex.org/W3005999147","https://openalex.org/W3195722497","https://openalex.org/W1980301972","https://openalex.org/W2167784970","https://openalex.org/W3176428941","https://openalex.org/W3089883684","https://openalex.org/W4232634182","https://openalex.org/W4301187613","https://openalex.org/W2587448511","https://openalex.org/W2923038022"],"abstract_inverted_index":{"A":[0],"CMOS-based":[1],"resistive":[2],"computing":[3],"element":[4],"(RCE),":[5],"which":[6],"can":[7],"be":[8],"integrated":[9],"in":[10],"a":[11,54,75],"crossbar":[12,82],"array,":[13],"is":[14],"presented.":[15],"The":[16,48],"RCE":[17,49,81],"successfully":[18],"solves":[19],"the":[20,24,71,92,95],"hardware":[21,41],"constraints":[22],"of":[23,32,70,94],"existing":[25],"memristive":[26],"devices":[27],"such":[28],"as":[29],"dynamic":[30],"ranges":[31],"conductance,":[33],"I-V":[34],"nonlinearity,":[35],"and":[36,59,68,88],"on/off":[37],"ratio":[38],"without":[39],"increasing":[40],"complexity":[42],"compared":[43],"to":[44,65,90],"other":[45],"CMOS":[46,57],"implementations.":[47],"has":[50,84],"been":[51,63,86],"designed":[52,87],"using":[53],"65nm":[55],"standard":[56],"process":[58],"SPICE":[60],"simulations":[61],"have":[62],"performed":[64],"evaluate":[66],"feasibility":[67],"functionality":[69],"RCE.":[72,96],"In":[73],"addition,":[74],"pulsed":[76],"neural":[77],"network":[78],"employing":[79],"an":[80],"array":[83],"also":[85],"simulated":[89],"verify":[91],"operation":[93]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}