{"id":"https://openalex.org/W2768958357","doi":"https://doi.org/10.1109/afrcon.2017.8095556","title":"Deposition of ZnO nanoparticles for thin-film transistors by doctor blade process","display_name":"Deposition of ZnO nanoparticles for thin-film transistors by doctor blade process","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2768958357","doi":"https://doi.org/10.1109/afrcon.2017.8095556","mag":"2768958357"},"language":"en","primary_location":{"id":"doi:10.1109/afrcon.2017.8095556","is_oa":false,"landing_page_url":"https://doi.org/10.1109/afrcon.2017.8095556","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE AFRICON","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080417777","display_name":"Julia Reker","orcid":null},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"J. Reker","raw_affiliation_strings":["Sensor Technology Department, University of Paderborn, Paderborn, Germany"],"affiliations":[{"raw_affiliation_string":"Sensor Technology Department, University of Paderborn, Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013771857","display_name":"Thorsten Meyers","orcid":null},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"T. Meyers","raw_affiliation_strings":["Sensor Technology Department, University of Paderborn, Paderborn, Germany"],"affiliations":[{"raw_affiliation_string":"Sensor Technology Department, University of Paderborn, Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079110530","display_name":"F\u00e1bio Fedrizzi Vidor","orcid":"https://orcid.org/0000-0002-5581-9166"},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. F. Vidor","raw_affiliation_strings":["Sensor Technology Department, University of Paderborn, Paderborn, Germany"],"affiliations":[{"raw_affiliation_string":"Sensor Technology Department, University of Paderborn, Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091462785","display_name":"Ulrich Hilleringmann","orcid":"https://orcid.org/0000-0002-1621-0067"},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"U. Hilleringmann","raw_affiliation_strings":["Sensor Technology Department, University of Paderborn, Paderborn, Germany"],"affiliations":[{"raw_affiliation_string":"Sensor Technology Department, University of Paderborn, Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5080417777"],"corresponding_institution_ids":["https://openalex.org/I206945453"],"apc_list":null,"apc_paid":null,"fwci":0.4434,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.58619345,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"634","last_page":"638"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11523","display_name":"Nanomaterials and Printing Technologies","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.8092001676559448},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.7560917139053345},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6984590291976929},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.5935653448104858},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5704551935195923},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.535385012626648},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.5310903787612915},{"id":"https://openalex.org/keywords/nanocomposite","display_name":"Nanocomposite","score":0.5307241678237915},{"id":"https://openalex.org/keywords/nanoparticle","display_name":"Nanoparticle","score":0.4675418734550476},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.4480040669441223},{"id":"https://openalex.org/keywords/deposition","display_name":"Deposition (geology)","score":0.4329182207584381},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.42386019229888916},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20523971319198608},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08791273832321167},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.059585362672805786}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8092001676559448},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.7560917139053345},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6984590291976929},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.5935653448104858},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5704551935195923},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.535385012626648},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.5310903787612915},{"id":"https://openalex.org/C92880739","wikidata":"https://www.wikidata.org/wiki/Q2639556","display_name":"Nanocomposite","level":2,"score":0.5307241678237915},{"id":"https://openalex.org/C155672457","wikidata":"https://www.wikidata.org/wiki/Q61231","display_name":"Nanoparticle","level":2,"score":0.4675418734550476},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.4480040669441223},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.4329182207584381},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.42386019229888916},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20523971319198608},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08791273832321167},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.059585362672805786},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/afrcon.2017.8095556","is_oa":false,"landing_page_url":"https://doi.org/10.1109/afrcon.2017.8095556","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE AFRICON","raw_type":"proceedings-article"},{"id":"pmh:oai:fraunhofer.de:N-481551","is_oa":false,"landing_page_url":"http://publica.fraunhofer.de/documents/N-481551.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400801","display_name":"Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Fraunhofer ENAS","raw_type":"Conference Paper"},{"id":"pmh:oai:publica.fraunhofer.de:publica/399447","is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/399447","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2050107394","https://openalex.org/W2052948883","https://openalex.org/W2068198080","https://openalex.org/W2092860250","https://openalex.org/W2102465079","https://openalex.org/W2114608954","https://openalex.org/W2120105133","https://openalex.org/W2150535451","https://openalex.org/W2163339963","https://openalex.org/W2240436241"],"related_works":["https://openalex.org/W3144433931","https://openalex.org/W1483110363","https://openalex.org/W2593046233","https://openalex.org/W2900849152","https://openalex.org/W1929348402","https://openalex.org/W2087281303","https://openalex.org/W4318302308","https://openalex.org/W2532740565","https://openalex.org/W2377589812","https://openalex.org/W2289849702"],"abstract_inverted_index":{"In":[0,46,109],"the":[1,21,30,63,89,113],"last":[2],"years":[3],"both":[4],"industry":[5],"and":[6,14,94,105,128,134],"research":[7],"groups":[8],"paid":[9],"much":[10],"attention":[11],"to":[12,101,111],"flexible":[13],"transparent":[15],"electronics.":[16],"Thin-film":[17],"transistors":[18],"(TFTs)":[19],"are":[20,96],"key":[22],"elements":[23],"for":[24,29,43,54,62],"this":[25,47],"technology":[26],"being":[27],"responsible":[28],"current":[31],"modulation.":[32],"Their":[33],"integration":[34,52],"requires":[35],"a":[36,59],"low-cost":[37],"process":[38,53],"which":[39],"is":[40,71,122],"also":[41],"suitable":[42],"large-area":[44],"fabrication.":[45],"paper":[48],"we":[49],"present":[50],"an":[51,76,99],"ZnO":[55],"nanoparticle":[56],"TFTs":[57],"using":[58],"doctor":[60,90],"blade":[61],"semiconductor":[64],"layer":[65],"deposition.":[66],"An":[67],"inverted":[68,77],"coplanar":[69],"structure":[70],"used":[72],"as":[73,75,80,98,103],"well":[74],"staggered":[78],"setup":[79],"transistor":[81],"template":[82],"with":[83,132],"high-A":[84],"nanocomposite":[85],"gate":[86],"dielectric.":[87],"Besides":[88],"bladespeed":[91],"analysis,":[92],"silver":[93],"gold":[95],"studied":[97],"alternative":[100],"aluminum":[102],"drain":[104],"source":[106],"contact":[107],"metallization.":[108],"addition":[110],"that,":[112],"transistor's":[114],"stability":[115],"when":[116],"stored":[117],"in":[118],"several":[119],"ambient":[120],"conditions":[121],"investigated.":[123],"Therefor,":[124],"alcohols":[125],"like":[126],"Ethanol":[127],"Isopropanol":[129],"were":[130],"combined":[131],"oxygen":[133],"nitrogen.":[135]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}