{"id":"https://openalex.org/W2769247084","doi":"https://doi.org/10.1109/afrcon.2017.8095447","title":"High impedance fault detection technique based on Discrete Wavelet Transform and support vector machine in power distribution networks","display_name":"High impedance fault detection technique based on Discrete Wavelet Transform and support vector machine in power distribution networks","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2769247084","doi":"https://doi.org/10.1109/afrcon.2017.8095447","mag":"2769247084"},"language":"en","primary_location":{"id":"doi:10.1109/afrcon.2017.8095447","is_oa":false,"landing_page_url":"https://doi.org/10.1109/afrcon.2017.8095447","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE AFRICON","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059193723","display_name":"Katleho Moloi","orcid":"https://orcid.org/0000-0002-2567-8745"},"institutions":[{"id":"https://openalex.org/I137616099","display_name":"Tshwane University of Technology","ror":"https://ror.org/037mrss42","country_code":"ZA","type":"education","lineage":["https://openalex.org/I137616099"]}],"countries":["ZA"],"is_corresponding":true,"raw_author_name":"K. Moloi","raw_affiliation_strings":["Dept. of Electrical Engineering, Tshwane University of Technology, Pretoria, South Africa"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Tshwane University of Technology, Pretoria, South Africa","institution_ids":["https://openalex.org/I137616099"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111689214","display_name":"J. A. Jordaan","orcid":null},"institutions":[{"id":"https://openalex.org/I137616099","display_name":"Tshwane University of Technology","ror":"https://ror.org/037mrss42","country_code":"ZA","type":"education","lineage":["https://openalex.org/I137616099"]}],"countries":["ZA"],"is_corresponding":false,"raw_author_name":"J. A. Jordaan","raw_affiliation_strings":["Dept. of Electrical Engineering, Tshwane University of Technology, Pretoria, South Africa"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Tshwane University of Technology, Pretoria, South Africa","institution_ids":["https://openalex.org/I137616099"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084480136","display_name":"Yskandar Hamam","orcid":"https://orcid.org/0000-0002-9673-9189"},"institutions":[{"id":"https://openalex.org/I137616099","display_name":"Tshwane University of Technology","ror":"https://ror.org/037mrss42","country_code":"ZA","type":"education","lineage":["https://openalex.org/I137616099"]}],"countries":["ZA"],"is_corresponding":false,"raw_author_name":"Y. Hamam","raw_affiliation_strings":["Dept. of Electrical Engineering, Tshwane University of Technology, Pretoria, South Africa"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Tshwane University of Technology, Pretoria, South Africa","institution_ids":["https://openalex.org/I137616099"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5059193723"],"corresponding_institution_ids":["https://openalex.org/I137616099"],"apc_list":null,"apc_paid":null,"fwci":1.0058,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.78323347,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"9","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.7724088430404663},{"id":"https://openalex.org/keywords/discrete-wavelet-transform","display_name":"Discrete wavelet transform","score":0.7132176756858826},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.610988974571228},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.557991623878479},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.538837730884552},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.504189133644104},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5023837089538574},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.49949049949645996},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.49178746342658997},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4702897071838379},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3806256353855133},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34487879276275635}],"concepts":[{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.7724088430404663},{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.7132176756858826},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.610988974571228},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.557991623878479},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.538837730884552},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.504189133644104},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5023837089538574},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.49949049949645996},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.49178746342658997},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4702897071838379},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3806256353855133},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34487879276275635},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/afrcon.2017.8095447","is_oa":false,"landing_page_url":"https://doi.org/10.1109/afrcon.2017.8095447","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE AFRICON","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1938862612","https://openalex.org/W1996226689","https://openalex.org/W2020770887","https://openalex.org/W2050161538","https://openalex.org/W2126202240","https://openalex.org/W2134500726","https://openalex.org/W2157948857","https://openalex.org/W2158551853","https://openalex.org/W2339065801","https://openalex.org/W2994594103","https://openalex.org/W4253447461","https://openalex.org/W6771389618"],"related_works":["https://openalex.org/W183670115","https://openalex.org/W1501179639","https://openalex.org/W3199035354","https://openalex.org/W2085792030","https://openalex.org/W1807354010","https://openalex.org/W3143644526","https://openalex.org/W2734230146","https://openalex.org/W1588899229","https://openalex.org/W2077021924","https://openalex.org/W2023142747"],"abstract_inverted_index":{"A":[0],"High":[1],"Impedance":[2],"Fault":[3],"(HIF)":[4],"is":[5,24,47,60,72,82,105,125],"a":[6,12,49,57,76,85,137],"long":[7],"standing":[8],"complex":[9],"type":[10],"of":[11,15,34,42,65],"fault,":[13],"because":[14,33],"its":[16,35],"distinctive":[17],"nature.":[18],"The":[19,131],"major":[20],"concern":[21],"with":[22,37],"HIF":[23,46,58,95,109],"the":[25,40,63,93,144,152],"potential":[26],"risk":[27],"it":[28],"poses":[29],"to":[30,74,88,107,150],"human":[31],"lives,":[32],"association":[36],"arcing.":[38],"From":[39],"point":[41],"safety":[43],"and":[44,62,68,119,127,143,156],"reliability":[45],"still":[48],"challenge":[50],"for":[51,140,154],"protection":[52],"engineers.":[53],"In":[54],"this":[55],"paper":[56],"model":[59],"adopted":[61],"combinations":[64],"wavelet":[66],"transform":[67],"support":[69],"vector":[70],"machine":[71],"presented":[73],"detect":[75],"HIF.":[77,159],"Discrete":[78],"Wavelet":[79],"Transform":[80],"(DWT)":[81],"used":[83,106,149],"as":[84,114],"feature":[86,141],"extractor":[87],"extract":[89],"useful":[90],"information":[91],"from":[92,110,146],"distorted":[94],"current":[96],"signal.":[97],"For":[98],"classification":[99,155],"purposes":[100],"Support":[101],"Vector":[102],"Machine":[103],"(SVM)":[104],"distinguish":[108],"other":[111],"events":[112],"such":[113],"normal":[115],"load,":[116],"capacitor":[117],"switching,":[118],"load":[120],"switching.":[121],"An":[122],"Eskom":[123],"network":[124],"studied":[126],"modelled":[128],"in":[129],"MATLAB/SIMULINK.":[130],"waveform":[132],"results":[133,145],"are":[134,148],"fed":[135],"into":[136],"DWT":[138,147],"tool":[139],"extraction":[142],"train":[151],"SVM":[153],"ultimately":[157],"detecting":[158]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}