{"id":"https://openalex.org/W7171435278","doi":"https://doi.org/10.1109/access.2026.3717243","title":"IBIS-Based Chiplet Design Methodology for Accurate Signal Integrity","display_name":"IBIS-Based Chiplet Design Methodology for Accurate Signal Integrity","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7171435278","doi":"https://doi.org/10.1109/access.2026.3717243"},"language":"en","primary_location":{"id":"doi:10.1109/access.2026.3717243","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3717243","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3717243","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101032576","display_name":"Song Jk","orcid":null},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jimin Song","raw_affiliation_strings":["Kyung Hee University"],"raw_orcid":"https://orcid.org/0009-0000-6029-7326","affiliations":[{"raw_affiliation_string":"Kyung Hee University","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100695871","display_name":"Junyong Park","orcid":"https://orcid.org/0000-0002-5446-1799"},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Junyong Park","raw_affiliation_strings":["Kyung Hee University"],"raw_orcid":"https://orcid.org/0000-0002-5446-1799","affiliations":[{"raw_affiliation_string":"Kyung Hee University","institution_ids":["https://openalex.org/I35928602"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I35928602"],"apc_list":{"value":2075,"currency":"USD","value_usd":2075},"apc_paid":{"value":2075,"currency":"USD","value_usd":2075},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.70726127,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"116613","last_page":"116620"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.1972000002861023,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.1972000002861023,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.07109999656677246,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.03290000185370445,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/design-methods","display_name":"Design methods","score":0.5081999897956848},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.42010000348091125},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.38190001249313354},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.3792000114917755},{"id":"https://openalex.org/keywords/algorithm-design","display_name":"Algorithm design","score":0.3384000062942505},{"id":"https://openalex.org/keywords/data-integrity","display_name":"Data integrity","score":0.3181999921798706}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7037000060081482},{"id":"https://openalex.org/C138852830","wikidata":"https://www.wikidata.org/wiki/Q2292993","display_name":"Design methods","level":2,"score":0.5081999897956848},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.42010000348091125},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.38190001249313354},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.3792000114917755},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3659999966621399},{"id":"https://openalex.org/C106516650","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm design","level":2,"score":0.3384000062942505},{"id":"https://openalex.org/C33762810","wikidata":"https://www.wikidata.org/wiki/Q461671","display_name":"Data integrity","level":2,"score":0.3181999921798706},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.289900004863739},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.2728999853134155},{"id":"https://openalex.org/C31352089","wikidata":"https://www.wikidata.org/wiki/Q3750474","display_name":"Systems design","level":2,"score":0.2662000060081482},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.258899986743927},{"id":"https://openalex.org/C94727143","wikidata":"https://www.wikidata.org/wiki/Q485394","display_name":"Analytic signal","level":4,"score":0.25519999861717224}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2026.3717243","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3717243","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:e6da810a8a3741a6ae9174d4d65a58c4","is_oa":false,"landing_page_url":"https://doaj.org/article/e6da810a8a3741a6ae9174d4d65a58c4","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 14, Pp 116613-116620 (2026)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3717243","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3717243","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"This":[0,200],"article":[1],"proposes":[2],"an":[3],"electromagnetic":[4],"(EM)\u2013input/output":[5],"buffer":[6,135],"information":[7],"specification":[8,90],"(IBIS)":[9],"co-optimization":[10],"methodology":[11,161,185],"for":[12,155,177,210],"next-generation":[13,211],"advanced":[14],"packaging":[15],"technologies.":[16],"The":[17,92,118,159],"proposed":[18,160,184],"method":[19],"includes":[20],"the":[21,44,52,56,63,86,99,132,174,183,197],"analysis":[22,108,119],"of":[23,46,95,101,109],"full-wave":[24],"EM":[25],"Channel":[26],"characteristics":[27],"with":[28],"non-linear":[29,122],"IBIS":[30],"behavioral":[31],"models":[32],"to":[33,145,172],"ensure":[34],"robust":[35,203],"signal":[36],"integrity":[37],"in":[38,134],"high-speed":[39],"chiplet":[40],"interconnects.":[41],"To":[42],"overcome":[43],"limitations":[45],"decoupled":[47],"analysis,":[48],"which":[49],"often":[50],"overlooks":[51],"complex":[53,77],"dependency":[54],"between":[55,124],"physical":[57,169],"channel":[58,170],"and":[59,114,126,206],"input/output":[60],"(I/O)":[61],"buffers,":[62],"composite":[64],"eye":[65],"margin":[66],"(":[67,111],"$M_{CP}$":[68,129],")":[69,113],"is":[70,98,153],"utilized":[71],"as":[72],"a":[73,81,121,149,163,187],"metric":[74],"that":[75],"converts":[76],"channel-driver":[78],"interactions":[79],"into":[80],"singular,":[82],"quantitative":[83],"value":[84],"representing":[85],"aggregate":[87],"tolerance":[88],"against":[89],"masks.":[91],"key":[93],"contribution":[94],"this":[96],"paper":[97],"identification":[100],"critical":[102],"design":[103,151,165,189,198,208],"boundaries":[104],"through":[105],"multi-dimensional":[106],"sensitivity":[107],"on-resistance":[110],"$R_{on}$":[112,125],"slew":[115],"rate":[116],"(SR).":[117],"reveals":[120],"correlation":[123],"SR,":[127],"where":[128,142],"effectively":[130],"quantifies":[131],"trade-offs":[133],"performance.":[136],"By":[137],"explicitly":[138],"defining":[139],"\u201cForbidden":[140],"Zones\u201d":[141],"configurations":[143],"fail":[144],"meet":[146],"UCIe":[147],"requirements,":[148],"practical":[150],"space":[152,176],"established":[154],"silicon":[156],"interposer":[157],"environments.":[158],"establishes":[162],"proactive":[164],"environment":[166],"by":[167,191],"allowing":[168],"constraints":[171],"define":[173],"permissible":[175],"I/O":[178],"buffers.":[179],"Unlike":[180],"previous":[181],"works,":[182],"provides":[186],"definitive":[188],"guideline":[190],"projecting":[192],"pre-validated":[193],"boundary":[194],"conditions":[195],"onto":[196],"space.":[199],"approach":[201],"ensures":[202],"system":[204],"reliability":[205],"minimizes":[207],"iterations":[209],"heterogeneous":[212],"integration.":[213]},"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2026-07-28T00:00:00"}