{"id":"https://openalex.org/W7163901322","doi":"https://doi.org/10.1109/access.2026.3701011","title":"Robust Arc-Fault Detection in Smart Farm Environments Using Spectral Topology and Segmented Spectral Analysis","display_name":"Robust Arc-Fault Detection in Smart Farm Environments Using Spectral Topology and Segmented Spectral Analysis","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7163901322","doi":"https://doi.org/10.1109/access.2026.3701011"},"language":"en","primary_location":{"id":"doi:10.1109/access.2026.3701011","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3701011","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3701011","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5138105866","display_name":"EuiKi Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122808","display_name":"Korea Engineering Consultants Corporation","ror":"https://ror.org/02ernp878","country_code":"KR","type":"other","lineage":["https://openalex.org/I4210122808"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Euiki Hong","raw_affiliation_strings":["DK Ecofarm Company Ltd., Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0003-2692-3698","affiliations":[{"raw_affiliation_string":"DK Ecofarm Company Ltd., Seoul, South Korea","institution_ids":["https://openalex.org/I4210122808"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138153068","display_name":"HooSek Han","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119966","display_name":"Gyeonggi Research Institute","ror":"https://ror.org/02hbjae69","country_code":"KR","type":"facility","lineage":["https://openalex.org/I4210119966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoosek Han","raw_affiliation_strings":["Future Innovation Institute, SNU, Siheung-si, Gyeonggi-do, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Future Innovation Institute, SNU, Siheung-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I4210119966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138150330","display_name":"Juyeon Oh","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122808","display_name":"Korea Engineering Consultants Corporation","ror":"https://ror.org/02ernp878","country_code":"KR","type":"other","lineage":["https://openalex.org/I4210122808"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Juyeon Oh","raw_affiliation_strings":["DK Ecofarm Company Ltd., Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DK Ecofarm Company Ltd., Seoul, South Korea","institution_ids":["https://openalex.org/I4210122808"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138189273","display_name":"JeongHwan Oh","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122808","display_name":"Korea Engineering Consultants Corporation","ror":"https://ror.org/02ernp878","country_code":"KR","type":"other","lineage":["https://openalex.org/I4210122808"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeonghwan Oh","raw_affiliation_strings":["DK Ecofarm Company Ltd., Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DK Ecofarm Company Ltd., Seoul, South Korea","institution_ids":["https://openalex.org/I4210122808"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025245211","display_name":"Sungchul Cho","orcid":"https://orcid.org/0000-0001-6344-6454"},"institutions":[{"id":"https://openalex.org/I4210143664","display_name":"Suwon Science College","ror":"https://ror.org/03zscq151","country_code":"KR","type":"education","lineage":["https://openalex.org/I4210143664"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"SungChul Cho","raw_affiliation_strings":["Research for Safety (R4S), Suwon-si, Gyeonggi-do, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-8641-720X","affiliations":[{"raw_affiliation_string":"Research for Safety (R4S), Suwon-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I4210143664"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.67166128,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"88138","last_page":"88146"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.913100004196167,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.913100004196167,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.027499999850988388,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.005900000222027302,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spectral-analysis","display_name":"Spectral analysis","score":0.6152999997138977},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.5521000027656555},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5411999821662903},{"id":"https://openalex.org/keywords/arc","display_name":"Arc (geometry)","score":0.4634000062942505},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.37720000743865967},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3158999979496002},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.30730000138282776}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6626999974250793},{"id":"https://openalex.org/C2983668108","wikidata":"https://www.wikidata.org/wiki/Q280453","display_name":"Spectral analysis","level":3,"score":0.6152999997138977},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.5521000027656555},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5411999821662903},{"id":"https://openalex.org/C83415579","wikidata":"https://www.wikidata.org/wiki/Q161973","display_name":"Arc (geometry)","level":2,"score":0.4634000062942505},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.37720000743865967},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.32519999146461487},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3158999979496002},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.30730000138282776},{"id":"https://openalex.org/C152822103","wikidata":"https://www.wikidata.org/wiki/Q7575207","display_name":"Spectral shape analysis","level":3,"score":0.30320000648498535},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.28999999165534973},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.2791000008583069},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.2784999907016754},{"id":"https://openalex.org/C156778621","wikidata":"https://www.wikidata.org/wiki/Q1365748","display_name":"Spectrum (functional analysis)","level":2,"score":0.27379998564720154},{"id":"https://openalex.org/C2985906921","wikidata":"https://www.wikidata.org/wiki/Q190524","display_name":"Spectral properties","level":2,"score":0.26179999113082886},{"id":"https://openalex.org/C176641082","wikidata":"https://www.wikidata.org/wiki/Q2446767","display_name":"Spectral signature","level":2,"score":0.257099986076355},{"id":"https://openalex.org/C23463724","wikidata":"https://www.wikidata.org/wiki/Q2308831","display_name":"Spectral method","level":2,"score":0.2563000023365021}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2026.3701011","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3701011","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:566bd4c3548b4ca589ea9eb7be8b49fb","is_oa":false,"landing_page_url":"https://doaj.org/article/566bd4c3548b4ca589ea9eb7be8b49fb","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 14, Pp 88138-88146 (2026)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3701011","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3701011","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/2","score":0.5538657903671265,"display_name":"Zero hunger"}],"awards":[{"id":"https://openalex.org/G7642035200","display_name":null,"funder_award_id":"RS-2025-02220471","funder_id":"https://openalex.org/F4320322033","funder_display_name":"Ministry of Agriculture, Food and Rural Affairs"}],"funders":[{"id":"https://openalex.org/F4320322033","display_name":"Ministry of Agriculture, Food and Rural Affairs","ror":"https://ror.org/009g8rq41"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"The":[0],"rapid":[1],"proliferation":[2],"of":[3,92,162],"smart":[4,56,127],"farms":[5],"has":[6],"introduced":[7],"complex":[8],"electrical":[9,186],"fire":[10],"risks,":[11],"primarily":[12],"driven":[13],"by":[14],"arc":[15,32,49],"faults.":[16],"Detecting":[17],"these":[18],"faults":[19],"is":[20,116],"challenging":[21,146],"because":[22],"switching":[23],"noise":[24],"from":[25],"inverters":[26],"and":[27],"LED":[28],"grow":[29],"lights":[30],"mimics":[31],"signatures,":[33],"causing":[34],"high":[35],"false":[36,159],"positive":[37,160],"rates":[38,161],"in":[39,124,166,188],"conventional":[40,103,153],"frequency-domain":[41],"methods.":[42],"This":[43],"paper":[44],"proposes":[45],"a":[46,74,110,125,178],"robust":[47],"two-stage":[48],"fault":[50,111],"detection":[51],"algorithm":[52,108],"tailored":[53],"for":[54,184],"noise-rich":[55],"farm":[57,128],"environments.":[58],"Stage":[59,77],"I":[60],"employs":[61],"an":[62],"adaptive":[63],"Noise":[64],"Peak":[65],"Removal":[66],"technique":[67],"to":[68,86,98,164],"eliminate":[69],"transient":[70],"harmonic":[71],"interference,":[72],"establishing":[73],"stable":[75],"baseline.":[76],"II":[78],"utilizes":[79],"Segmented":[80],"Power":[81],"Spectral":[82],"Density":[83],"(PSDSF)":[84],"analysis":[85,176],"capture":[87],"the":[88,95,106,139],"broadband":[89,114],"spectral":[90,174],"topology":[91,175],"arcs":[93],"across":[94,118,133],"10":[96],"kHz":[97,100],"70":[99],"band.":[101],"Unlike":[102],"magnitude-based":[104,154],"methods,":[105],"proposed":[107],"declares":[109],"only":[112],"when":[113],"coherence":[115],"observed":[117],"multiple":[119],"frequency":[120],"segments.":[121],"Experimental":[122],"validation":[123],"simulated":[126],"testbed":[129],"demonstrated":[130],"100%":[131,165],"sensitivity":[132],"all":[134],"tested":[135],"current":[136],"levels.":[137],"Notably,":[138],"method":[140],"achieved":[141],"92%":[142],"specificity":[143],"even":[144],"under":[145],"low-current":[147],"conditions":[148],"(1.2":[149],"A),":[150],"significantly":[151],"outperforming":[152],"methods":[155],"that":[156,172],"exhibited":[157],"severe":[158],"up":[163],"identical":[167],"scenarios.":[168],"These":[169],"results":[170],"confirm":[171],"segmented":[173],"offers":[177],"highly":[179],"reliable,":[180],"computationally":[181],"efficient":[182],"solution":[183],"preventing":[185],"fires":[187],"agricultural":[189],"facilities.":[190]},"counts_by_year":[],"updated_date":"2026-06-17T06:14:20.161405","created_date":"2026-06-09T00:00:00"}