{"id":"https://openalex.org/W7162795301","doi":"https://doi.org/10.1109/access.2026.3697892","title":"EFS-YOLO: A Steel Surface Defect Detection Model Fusing Multi-Scale Edge Features and Frequency-Domain Information","display_name":"EFS-YOLO: A Steel Surface Defect Detection Model Fusing Multi-Scale Edge Features and Frequency-Domain Information","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7162795301","doi":"https://doi.org/10.1109/access.2026.3697892"},"language":"en","primary_location":{"id":"doi:10.1109/access.2026.3697892","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3697892","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3697892","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5137343770","display_name":"Pengcheng Meng","orcid":null},"institutions":[{"id":"https://openalex.org/I141962983","display_name":"Shanghai University of Engineering Science","ror":"https://ror.org/0557b9y08","country_code":"CN","type":"education","lineage":["https://openalex.org/I141962983"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengcheng Meng","raw_affiliation_strings":["Laboratory of Intelligent Control and Robotics, Shanghai University of Engineering Science, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0005-7964-171X","affiliations":[{"raw_affiliation_string":"Laboratory of Intelligent Control and Robotics, Shanghai University of Engineering Science, Shanghai, China","institution_ids":["https://openalex.org/I141962983"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5137385328","display_name":"Wei Zhang","orcid":"https://orcid.org/0000-0003-1400-8612"},"institutions":[{"id":"https://openalex.org/I141962983","display_name":"Shanghai University of Engineering Science","ror":"https://ror.org/0557b9y08","country_code":"CN","type":"education","lineage":["https://openalex.org/I141962983"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhang","raw_affiliation_strings":["Laboratory of Intelligent Control and Robotics, Shanghai University of Engineering Science, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-1400-8612","affiliations":[{"raw_affiliation_string":"Laboratory of Intelligent Control and Robotics, Shanghai University of Engineering Science, Shanghai, China","institution_ids":["https://openalex.org/I141962983"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5137355990","display_name":"Hao Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I141962983","display_name":"Shanghai University of Engineering Science","ror":"https://ror.org/0557b9y08","country_code":"CN","type":"education","lineage":["https://openalex.org/I141962983"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Chen","raw_affiliation_strings":["Laboratory of Intelligent Control and Robotics, Shanghai University of Engineering Science, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Intelligent Control and Robotics, Shanghai University of Engineering Science, Shanghai, China","institution_ids":["https://openalex.org/I141962983"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I141962983"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.6457299,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"82239","last_page":"82252"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.484499990940094,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.484499990940094,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.22619999945163727,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.034299999475479126,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5257999897003174},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5080999732017517},{"id":"https://openalex.org/keywords/edge-detection","display_name":"Edge detection","score":0.45590001344680786},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3506999909877777},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.3343000113964081},{"id":"https://openalex.org/keywords/surface-fitting","display_name":"Surface fitting","score":0.30959999561309814}],"concepts":[{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5257999897003174},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5080999732017517},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5026000142097473},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.47540000081062317},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.45590001344680786},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44269999861717224},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3506999909877777},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.3343000113964081},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33379998803138733},{"id":"https://openalex.org/C2984999661","wikidata":"https://www.wikidata.org/wiki/Q603159","display_name":"Surface fitting","level":3,"score":0.30959999561309814},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.29490000009536743},{"id":"https://openalex.org/C108882727","wikidata":"https://www.wikidata.org/wiki/Q2991685","display_name":"Solid modeling","level":2,"score":0.2930000126361847},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.2904999852180481},{"id":"https://openalex.org/C20885615","wikidata":"https://www.wikidata.org/wiki/Q825595","display_name":"Surface reconstruction","level":3,"score":0.28870001435279846},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.26179999113082886}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2026.3697892","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3697892","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c6b92ec9f9b043fd9a655c1f19429d8e","is_oa":true,"landing_page_url":"https://doaj.org/article/c6b92ec9f9b043fd9a655c1f19429d8e","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 14, Pp 82239-82252 (2026)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3697892","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3697892","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7933632680","display_name":null,"funder_award_id":"2024AI011","funder_id":"https://openalex.org/F4320321881","funder_display_name":"Shanghai Municipal Education Commission"}],"funders":[{"id":"https://openalex.org/F4320321881","display_name":"Shanghai Municipal Education Commission","ror":"https://ror.org/05tewj457"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1536680647","https://openalex.org/W2102605133","https://openalex.org/W2193145675","https://openalex.org/W2919115771","https://openalex.org/W2963150697","https://openalex.org/W2963351448","https://openalex.org/W3012374719","https://openalex.org/W3018757597","https://openalex.org/W3096609285","https://openalex.org/W3172087149","https://openalex.org/W3208023024","https://openalex.org/W4309703210","https://openalex.org/W4386076325","https://openalex.org/W4390414637","https://openalex.org/W4391805449","https://openalex.org/W4393167116","https://openalex.org/W4393965003","https://openalex.org/W4396730747","https://openalex.org/W4399946473","https://openalex.org/W4400440940","https://openalex.org/W4400646029","https://openalex.org/W4402544089","https://openalex.org/W4402754006","https://openalex.org/W4404839509","https://openalex.org/W4411551433","https://openalex.org/W4413002952","https://openalex.org/W4413353440","https://openalex.org/W4414220628","https://openalex.org/W4415795831","https://openalex.org/W7081915694","https://openalex.org/W7125519528","https://openalex.org/W7133968303"],"related_works":[],"abstract_inverted_index":{"To":[0],"resolve":[1],"false":[2],"and":[3,11,19,102,127,143,167,172,190],"missed":[4],"detections":[5],"in":[6,192],"metal":[7,193],"surface":[8,194],"defect":[9,99,107,195],"detection,":[10],"to":[12,110,139],"improve":[13,111],"the":[14,49,67,79,122,130,137,156,160,176,186],"model\u2019s":[15],"performance":[16,112],"on":[17,113,141,155],"multi-scale":[18,50],"complex":[20,114],"samples,":[21],"a":[22,85],"detection":[23,76],"method":[24],"named":[25],"EFS-YOLO":[26,149],"is":[27,36,82,125],"proposed.":[28],"First,":[29],"an":[30,151],"edge":[31,40,51,61,69],"information":[32,52],"communication":[33],"(EIC)":[34],"module":[35,57,81],"designed,":[37],"which":[38],"extracts":[39],"features":[41,62],"from":[42],"shallow":[43],"network":[44],"feature":[45,94,100],"maps":[46],"comprehensively":[47],"via":[48],"generator":[53],"(MSEI).":[54],"The":[55],"EIC":[56],"further":[58],"fuses":[59],"these":[60],"with":[63,129,165],"other":[64],"layers":[65],"using":[66],"convolutional":[68],"fusion":[70],"(CEF)":[71],"module,":[72],"enhancing":[73],"cross-scale":[74],"target":[75],"accuracy.":[77],"Second,":[78],"C3k2-FTD":[80],"proposed,":[83],"incorporating":[84],"frequency-time":[86],"domain":[87],"extraction":[88],"(FTD)":[89],"submodule":[90],"for":[91],"joint":[92],"time-frequency":[93],"fusion.":[95],"This":[96],"enables":[97],"comprehensive":[98],"capture":[101],"boosts":[103],"effective":[104],"recognition":[105],"of":[106,153],"targets.":[108],"Finally,":[109],"samples":[115],"without":[116],"increasing":[117],"memory":[118],"or":[119],"computational":[120],"costs,":[121],"SlideLoss":[123],"function":[124],"introduced":[126],"integrated":[128],"exponential":[131],"moving":[132],"average":[133],"(EMA)":[134],"mechanism,":[135],"directing":[136],"model":[138,162],"focus":[140],"misclassified":[142],"challenging":[144],"samples.":[145],"Experimental":[146],"results":[147,184],"show":[148],"achieves":[150],"mAP":[152,179],"82.1%":[154],"NEU-DET":[157],"dataset,":[158,178],"outperforming":[159],"base":[161],"by":[163,170,181],"2.6%,":[164],"precision":[166],"recall":[168],"improved":[169],"1.3%":[171],"2.5%,":[173],"respectively.":[174],"On":[175],"GC10-DET":[177],"increases":[180],"2.3%.":[182],"These":[183],"validate":[185],"method\u2019s":[187],"effectiveness,":[188],"generalization,":[189],"efficacy":[191],"detection.":[196]},"counts_by_year":[],"updated_date":"2026-06-06T06:22:57.294733","created_date":"2026-05-30T00:00:00"}