{"id":"https://openalex.org/W7140329121","doi":"https://doi.org/10.1109/access.2026.3677576","title":"Automated Validation and Repair Framework for Converting Operational Distribution System Into Digital-Twin-Ready Simulation Models","display_name":"Automated Validation and Repair Framework for Converting Operational Distribution System Into Digital-Twin-Ready Simulation Models","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7140329121","doi":"https://doi.org/10.1109/access.2026.3677576"},"language":"en","primary_location":{"id":"doi:10.1109/access.2026.3677576","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3677576","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3677576","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015371077","display_name":"Hasan Iqbal","orcid":"https://orcid.org/0000-0001-5930-025X"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hasan Iqbal","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"],"raw_orcid":"https://orcid.org/0000-0001-5930-025X","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5130586444","display_name":"Jawad Mohammed","orcid":null},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jawad Mohammed","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010427742","display_name":"Arif I. Sarwat","orcid":"https://orcid.org/0000-0003-1179-438X"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arif Sarwat","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"],"raw_orcid":"https://orcid.org/0000-0003-1179-438X","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I19700959"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":15.9939,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.98222817,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"14","issue":null,"first_page":"47012","last_page":"47031"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11195","display_name":"Simulation Techniques and Applications","score":0.3156000077724457,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11195","display_name":"Simulation Techniques and Applications","score":0.3156000077724457,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.1362999975681305,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10848","display_name":"Advanced Multi-Objective Optimization Algorithms","score":0.025200000032782555,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.5008000135421753},{"id":"https://openalex.org/keywords/simulation-modeling","display_name":"Simulation modeling","score":0.4510999917984009},{"id":"https://openalex.org/keywords/discrete-event-simulation","display_name":"Discrete event simulation","score":0.3646000027656555},{"id":"https://openalex.org/keywords/verification-and-validation-of-computer-simulation-models","display_name":"Verification and validation of computer simulation models","score":0.33709999918937683},{"id":"https://openalex.org/keywords/model-validation","display_name":"Model validation","score":0.33329999446868896},{"id":"https://openalex.org/keywords/distribution","display_name":"Distribution (mathematics)","score":0.2937999963760376},{"id":"https://openalex.org/keywords/verification-and-validation","display_name":"Verification and validation","score":0.2870999872684479}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7678999900817871},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.5008000135421753},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4860000014305115},{"id":"https://openalex.org/C108215451","wikidata":"https://www.wikidata.org/wiki/Q7263963","display_name":"Simulation modeling","level":2,"score":0.4510999917984009},{"id":"https://openalex.org/C147203929","wikidata":"https://www.wikidata.org/wiki/Q574814","display_name":"Discrete event simulation","level":2,"score":0.3646000027656555},{"id":"https://openalex.org/C126433048","wikidata":"https://www.wikidata.org/wiki/Q7921324","display_name":"Verification and validation of computer simulation models","level":2,"score":0.33709999918937683},{"id":"https://openalex.org/C3019813237","wikidata":"https://www.wikidata.org/wiki/Q65089264","display_name":"Model validation","level":2,"score":0.33329999446868896},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.29750001430511475},{"id":"https://openalex.org/C110121322","wikidata":"https://www.wikidata.org/wiki/Q865811","display_name":"Distribution (mathematics)","level":2,"score":0.2937999963760376},{"id":"https://openalex.org/C48002344","wikidata":"https://www.wikidata.org/wiki/Q2919644","display_name":"Verification and validation","level":2,"score":0.2870999872684479},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.2865999937057495},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.28600001335144043},{"id":"https://openalex.org/C108882727","wikidata":"https://www.wikidata.org/wiki/Q2991685","display_name":"Solid modeling","level":2,"score":0.2734000086784363},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.2685999870300293},{"id":"https://openalex.org/C2780966626","wikidata":"https://www.wikidata.org/wiki/Q11292308","display_name":"Object-oriented modeling","level":3,"score":0.2597000002861023},{"id":"https://openalex.org/C183322885","wikidata":"https://www.wikidata.org/wiki/Q17007702","display_name":"Context model","level":3,"score":0.2587999999523163},{"id":"https://openalex.org/C2986605239","wikidata":"https://www.wikidata.org/wiki/Q925667","display_name":"Numerical models","level":3,"score":0.25769999623298645},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.2567000091075897}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2026.3677576","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3677576","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:755a929eb04247cbbec7abc08104438a","is_oa":true,"landing_page_url":"https://doaj.org/article/755a929eb04247cbbec7abc08104438a","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 14, Pp 47012-47031 (2026)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3677576","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3677576","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Operational":[0],"distribution":[1,71,254],"networks":[2],"maintained":[3],"in":[4,13],"ADMS":[5],"and":[6,35,45,65,93,114,122,145,158,180,183,197,202,252],"SCADA":[7],"platforms":[8],"are":[9],"not":[10],"directly":[11],"usable":[12],"planning-grade":[14],"simulation":[15],"tools":[16],"such":[17,245],"as":[18,246],"OpenDSS":[19],"due":[20],"to":[21,137,218],"inconsistent":[22],"schema":[23,94],"definitions,":[24],"incomplete":[25],"asset":[26],"attributes,":[27],"electrically":[28,74,174],"isolated":[29,175],"network":[30],"islands,":[31,176],"invalid":[32,112],"control":[33,182],"references,":[34],"missing":[36],"protection":[37,125,184],"dependencies.":[38],"These":[39],"issues":[40],"prevent":[41],"repeatable":[42,149],"feeder":[43,77,235],"studies":[44,163,210],"hinder":[46],"the":[47,107],"creation":[48],"of":[49,131,173],"reliable":[50,242],"baseline":[51,159,234],"models":[52,236],"required":[53],"for":[54,231],"digital-twin-enabled":[55],"planning":[56,250],"workflows.":[57],"This":[58],"paper":[59],"presents":[60],"an":[61],"automated":[62],"ingestion,":[63],"validation,":[64],"repair":[66,214],"framework":[67,80,226],"that":[68,212],"converts":[69],"operational":[70,238],"exports":[72,85],"into":[73,86],"consistent,":[75],"simulator-ready":[76],"models.":[78],"The":[79,224],"(i)":[81],"parses":[82],"multi-table":[83],"utility":[84,167,239],"a":[87,98,129,148,228],"typed":[88],"intermediate":[89],"representation":[90],"with":[91],"unit":[92],"normalization,":[95],"(ii)":[96],"enforces":[97],"single":[99],"energized":[100],"connected":[101],"topology":[102,156],"using":[103,147],"graph-based":[104],"traversal":[105],"from":[106,237],"source":[108],"bus,":[109],"(iii)":[110],"repairs":[111],"regulator":[113],"capacitor":[115],"monitoring":[116],"references":[117],"through":[118],"topology-aware":[119],"upstream":[120],"tracing,":[121],"(iv)":[123],"ensures":[124],"instantiation":[126,185],"by":[127],"injecting":[128],"library":[130],"standard":[132],"time-current":[133],"characteristic":[134,220],"curves":[135],"prior":[136],"device":[138],"generation.":[139],"Each":[140],"model":[141,221],"build":[142],"is":[143,216],"versioned":[144],"evaluated":[146],"verification":[150],"protocol":[151],"including":[152],"compile-time":[153],"integrity":[154],"checks,":[155],"metrics,":[157],"power-flow":[160,178],"validation.":[161],"Case":[162],"on":[164],"anonymized":[165],"real":[166],"feeders":[168],"demonstrate":[169],"consistent":[170,199],"compilation,":[171],"elimination":[172],"stable":[177],"convergence,":[179],"valid":[181],"without":[186],"manual":[187],"intervention.":[188],"A":[189],"yearlong,":[190],"no-DER":[191],"time-series":[192],"validation":[193],"confirms":[194],"numerical":[195],"stability":[196],"physically":[198],"voltage,":[200],"energy,":[201],"loss":[203],"trends":[204],"under":[205],"time-varying":[206],"loading,":[207],"while":[208],"ablation":[209],"show":[211],"each":[213],"module":[215],"necessary":[217],"avoid":[219],"failure":[222],"modes.":[223],"proposed":[225],"establishes":[227],"scalable":[229],"method":[230],"generating":[232],"digital-twin-ready":[233],"exports,":[240],"enabling":[241],"downstream":[243],"applications":[244],"DER":[247],"hosting-capacity":[248],"analysis,":[249],"studies,":[251],"long-horizon":[253],"system":[255],"simulations.":[256]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-03-31T06:02:25.137627","created_date":"2026-03-26T00:00:00"}