{"id":"https://openalex.org/W7140073215","doi":"https://doi.org/10.1109/access.2026.3676707","title":"A Technique for the Characterization of the X-Ray-Induced Leakage Path in a Linear Voltage Regulator","display_name":"A Technique for the Characterization of the X-Ray-Induced Leakage Path in a Linear Voltage Regulator","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7140073215","doi":"https://doi.org/10.1109/access.2026.3676707"},"language":"en","primary_location":{"id":"doi:10.1109/access.2026.3676707","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3676707","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3676707","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031182363","display_name":"Vladimir Dj. Vuki\u0107","orcid":"https://orcid.org/0000-0002-4421-0574"},"institutions":[{"id":"https://openalex.org/I4068193","display_name":"University of Belgrade","ror":"https://ror.org/02qsmb048","country_code":"RS","type":"education","lineage":["https://openalex.org/I4068193"]},{"id":"https://openalex.org/I4210120853","display_name":"Univerzitet Union Nikola Tesla","ror":"https://ror.org/02kgjn162","country_code":"RS","type":"education","lineage":["https://openalex.org/I4210120853"]}],"countries":["RS"],"is_corresponding":true,"raw_author_name":"Vladimir D. Vuki\u0107","raw_affiliation_strings":["Nikola Tesla Institute of Electrical Engineering, University of Belgrade, Belgrade, Serbia"],"raw_orcid":"https://orcid.org/0000-0002-4421-0574","affiliations":[{"raw_affiliation_string":"Nikola Tesla Institute of Electrical Engineering, University of Belgrade, Belgrade, Serbia","institution_ids":["https://openalex.org/I4210120853","https://openalex.org/I4068193"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5031182363"],"corresponding_institution_ids":["https://openalex.org/I4068193","https://openalex.org/I4210120853"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.62192247,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"47270","last_page":"47288"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10787","display_name":"Lightning and Electromagnetic Phenomena","score":0.20589999854564667,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10787","display_name":"Lightning and Electromagnetic Phenomena","score":0.20589999854564667,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.09160000085830688,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.06390000134706497,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6158000230789185},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5940999984741211},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5056999921798706},{"id":"https://openalex.org/keywords/low-dropout-regulator","display_name":"Low-dropout regulator","score":0.4537999927997589},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.4537000060081482},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.45010000467300415},{"id":"https://openalex.org/keywords/regulator","display_name":"Regulator","score":0.42649999260902405}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6158000230789185},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5940999984741211},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5056999921798706},{"id":"https://openalex.org/C140501009","wikidata":"https://www.wikidata.org/wiki/Q6692746","display_name":"Low-dropout regulator","level":5,"score":0.4537999927997589},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4537000060081482},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.45010000467300415},{"id":"https://openalex.org/C6929976","wikidata":"https://www.wikidata.org/wiki/Q3771881","display_name":"Regulator","level":3,"score":0.42649999260902405},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.42250001430511475},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3935000002384186},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37560001015663147},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3716000020503998},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.322299987077713},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3111000061035156},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.3052999973297119},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.29100000858306885},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.26660001277923584},{"id":"https://openalex.org/C6802819","wikidata":"https://www.wikidata.org/wiki/Q1072174","display_name":"Linear system","level":2,"score":0.25760000944137573},{"id":"https://openalex.org/C2988995629","wikidata":"https://www.wikidata.org/wiki/Q2915729","display_name":"Matrix algebra","level":3,"score":0.2540999948978424}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2026.3676707","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3676707","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:66c9a49e6c7f44c3991af9766000f93f","is_oa":true,"landing_page_url":"https://doaj.org/article/66c9a49e6c7f44c3991af9766000f93f","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 14, Pp 47270-47288 (2026)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3676707","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3676707","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5444957613945007,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,10,25,75,122,202,224,230,242],"procedure":[4],"for":[5],"leakage":[6,135,147,172,217,225],"path":[7,148,226],"characterization":[8],"in":[9,19,166,178,210],"power":[11],"integrated":[12],"circuit:":[13],"LM2990T-5.0.":[14],"Tested":[15],"devices":[16],"were":[17,38,65,158],"irradiated":[18],"two":[20],"radiation":[21,190],"environments":[22],"created":[23],"by":[24],"high-energy":[26],"X-ray":[27],"generator.":[28],"The":[29,56,174],"SPICE":[30],"computer":[31],"simulation":[32],"tool":[33],"and":[34,47,60,93,129,149],"the":[35,51,71,78,90,97,104,107,115,125,130,134,139,142,146,150,162,167,171,179,195,211,216,220,233,236],"presented":[36],"technique":[37],"used":[39,159],"to":[40,160,194],"estimate":[41],"experimental":[42],"data":[43],"on":[44,138,240],"output":[45],"voltage":[46,73,175],"several":[48],"parameters":[49],"of":[50,77,85,96,106,111,124,133,170,188,223,232,235],"parasitic":[52,98,243],"metal\u2013oxide\u2013semiconductor":[53],"(MOS)":[54],"structure.":[55,246],"drain\u2013source":[57],"(leakage)":[58],"resistance":[59],"its":[61],"accompanying":[62],"drain":[63,86],"current":[64],"also":[66],"estimated,":[67],"as":[68,70,74,121,229],"well":[69],"threshold":[72],"function":[76,123],"absorbed":[79],"total":[80,126,151],"ionizing":[81,127,189],"dose.":[82],"Simulated":[83],"values":[84],"current,":[87],"along":[88,215],"with":[89,201],"calculated":[91,120],"drain-source":[92],"gate-source":[94],"voltages":[95],"MOS":[99,244],"field-effect":[100],"transistor":[101],"(MOSFET),":[102],"enabled":[103],"determination":[105],"gate-channel":[108],"aspect":[109],"ratio":[110],"this":[112],"device.":[113],"Consequently,":[114,219],"oxide":[116,144],"trap":[117],"density":[118,214],"was":[119,206,227],"dose":[128],"surface":[131],"potential":[132,140],"path.":[136,173,218],"Data":[137],"across":[141],"field":[143],"above":[145],"accumulated":[152],"space":[153],"charge":[154,213,239],"per":[155],"unit":[156],"area":[157,169],"verify":[161],"acceptor":[163],"impurity":[164],"concentration":[165],"semiconductor":[168],"regulators":[176],"examined":[177],"300-kVp":[180],"bremsstrahlung":[181],"environment":[182],"failed":[183],"after":[184],"absorbing":[185],"lower":[186],"doses":[187],"than":[191],"those":[192],"exposed":[193],"83-kVp":[196],"photon":[197],"spectrum.":[198],"An":[199],"analogy":[200],"radiation-sensitive":[203],"FET":[204],"(RADFET)":[205],"drawn,":[207],"regarding":[208],"variations":[209],"oxide-trapped":[212],"ideality":[221],"factor":[222],"defined":[228],"measure":[231],"influence":[234],"radiation-induced":[237],"trapped":[238],"such":[241],"capacitor":[245]},"counts_by_year":[],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2026-03-24T00:00:00"}