{"id":"https://openalex.org/W7133919720","doi":"https://doi.org/10.1109/access.2026.3670860","title":"Reliability Risk Assessment and Standardization Strategy for Single-Phase Immersion-Cooled Data Center","display_name":"Reliability Risk Assessment and Standardization Strategy for Single-Phase Immersion-Cooled Data Center","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7133919720","doi":"https://doi.org/10.1109/access.2026.3670860"},"language":"en","primary_location":{"id":"doi:10.1109/access.2026.3670860","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3670860","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3670860","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058173415","display_name":"Jungeon Lee","orcid":"https://orcid.org/0000-0002-2877-9453"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jungeon Lee","raw_affiliation_strings":["Department of Industrial Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-2877-9453","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5128180309","display_name":"Daeil Kwon","orcid":null},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Daeil Kwon","raw_affiliation_strings":["Department of Industrial Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-2949-7172","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I848706"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.22001177,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"36774","last_page":"36787"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.10480000078678131,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.10480000078678131,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","score":0.07400000095367432,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12560","display_name":"Nuclear Engineering Thermal-Hydraulics","score":0.05700000002980232,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/standardization","display_name":"Standardization","score":0.8510000109672546},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6746000051498413},{"id":"https://openalex.org/keywords/risk-assessment","display_name":"Risk assessment","score":0.5735999941825867},{"id":"https://openalex.org/keywords/center","display_name":"Center (category theory)","score":0.49459999799728394},{"id":"https://openalex.org/keywords/data-center","display_name":"Data center","score":0.48750001192092896},{"id":"https://openalex.org/keywords/risk-management","display_name":"Risk management","score":0.41040000319480896}],"concepts":[{"id":"https://openalex.org/C188087704","wikidata":"https://www.wikidata.org/wiki/Q369577","display_name":"Standardization","level":2,"score":0.8510000109672546},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6746000051498413},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.666100025177002},{"id":"https://openalex.org/C12174686","wikidata":"https://www.wikidata.org/wiki/Q1058438","display_name":"Risk assessment","level":2,"score":0.5735999941825867},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5630999803543091},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.5164999961853027},{"id":"https://openalex.org/C2779463800","wikidata":"https://www.wikidata.org/wiki/Q5062222","display_name":"Center (category theory)","level":2,"score":0.49459999799728394},{"id":"https://openalex.org/C153740404","wikidata":"https://www.wikidata.org/wiki/Q671224","display_name":"Data center","level":2,"score":0.48750001192092896},{"id":"https://openalex.org/C32896092","wikidata":"https://www.wikidata.org/wiki/Q189447","display_name":"Risk management","level":2,"score":0.41040000319480896},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.2980000078678131},{"id":"https://openalex.org/C33762810","wikidata":"https://www.wikidata.org/wiki/Q461671","display_name":"Data integrity","level":2,"score":0.2953999936580658},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.2888999879360199},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.26840001344680786}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2026.3670860","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3670860","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:21a98c0ac4b64f8799291ed602c23942","is_oa":true,"landing_page_url":"https://doaj.org/article/21a98c0ac4b64f8799291ed602c23942","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 14, Pp 36774-36787 (2026)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3670860","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3670860","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5829739570617676,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[{"id":"https://openalex.org/G5155366766","display_name":null,"funder_award_id":"RS-2024-00423772","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G7004555493","display_name":null,"funder_award_id":"RS-2023-00239657","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":129,"referenced_works":["https://openalex.org/W1052390988","https://openalex.org/W1748004124","https://openalex.org/W1925877775","https://openalex.org/W1972165841","https://openalex.org/W1976274021","https://openalex.org/W1982994921","https://openalex.org/W1985195132","https://openalex.org/W2001769123","https://openalex.org/W2005373647","https://openalex.org/W2006368856","https://openalex.org/W2016464419","https://openalex.org/W2054767479","https://openalex.org/W2105745969","https://openalex.org/W2133069359","https://openalex.org/W2133830160","https://openalex.org/W2135551247","https://openalex.org/W2143585755","https://openalex.org/W2144855626","https://openalex.org/W2145002123","https://openalex.org/W2148727027","https://openalex.org/W2164251682","https://openalex.org/W2178974487","https://openalex.org/W2330952536","https://openalex.org/W2413495951","https://openalex.org/W2498848982","https://openalex.org/W2500078801","https://openalex.org/W2510812834","https://openalex.org/W2522710757","https://openalex.org/W2575708350","https://openalex.org/W2614936908","https://openalex.org/W2750611344","https://openalex.org/W2754712022","https://openalex.org/W2766386287","https://openalex.org/W2767567283","https://openalex.org/W2794088815","https://openalex.org/W2803435597","https://openalex.org/W2804301792","https://openalex.org/W2807939604","https://openalex.org/W2885868028","https://openalex.org/W2920281406","https://openalex.org/W2920478852","https://openalex.org/W2920931631","https://openalex.org/W2938135042","https://openalex.org/W2952277720","https://openalex.org/W2955931832","https://openalex.org/W2978414254","https://openalex.org/W2979749077","https://openalex.org/W2995093072","https://openalex.org/W3004395199","https://openalex.org/W3005942935","https://openalex.org/W3008025684","https://openalex.org/W3009397209","https://openalex.org/W3029002268","https://openalex.org/W3030402187","https://openalex.org/W3033934099","https://openalex.org/W3034780955","https://openalex.org/W3044082245","https://openalex.org/W3047147843","https://openalex.org/W3108160277","https://openalex.org/W3110674761","https://openalex.org/W3122276920","https://openalex.org/W3138915596","https://openalex.org/W3157144979","https://openalex.org/W3157888572","https://openalex.org/W3162255000","https://openalex.org/W3190777708","https://openalex.org/W3195839992","https://openalex.org/W3202885913","https://openalex.org/W3204315223","https://openalex.org/W4205638817","https://openalex.org/W4205678267","https://openalex.org/W4206676363","https://openalex.org/W4210817581","https://openalex.org/W4210839043","https://openalex.org/W4211130358","https://openalex.org/W4213347059","https://openalex.org/W4214731507","https://openalex.org/W4224930764","https://openalex.org/W4230200579","https://openalex.org/W4231271915","https://openalex.org/W4236336714","https://openalex.org/W4239422366","https://openalex.org/W4247759582","https://openalex.org/W4248013734","https://openalex.org/W4248874845","https://openalex.org/W4253973203","https://openalex.org/W4256365590","https://openalex.org/W4256433147","https://openalex.org/W4294982486","https://openalex.org/W4295102718","https://openalex.org/W4302489269","https://openalex.org/W4308495105","https://openalex.org/W4312219172","https://openalex.org/W4312250545","https://openalex.org/W4312529846","https://openalex.org/W4312776236","https://openalex.org/W4313206541","https://openalex.org/W4316813038","https://openalex.org/W4319456220","https://openalex.org/W4319459146","https://openalex.org/W4321196616","https://openalex.org/W4328093602","https://openalex.org/W4361007129","https://openalex.org/W4366147529","https://openalex.org/W4377143046","https://openalex.org/W4379409180","https://openalex.org/W4383900004","https://openalex.org/W4385541959","https://openalex.org/W4385705309","https://openalex.org/W4386545938","https://openalex.org/W4387252196","https://openalex.org/W4388333358","https://openalex.org/W4389044952","https://openalex.org/W4389210048","https://openalex.org/W4389722461","https://openalex.org/W4391043102","https://openalex.org/W4392979522","https://openalex.org/W4393211286","https://openalex.org/W4394852179","https://openalex.org/W4396531773","https://openalex.org/W4400034670","https://openalex.org/W4402508025","https://openalex.org/W4402743040","https://openalex.org/W4403297875","https://openalex.org/W4405774323","https://openalex.org/W4407386150","https://openalex.org/W4414829615","https://openalex.org/W4415524672","https://openalex.org/W4416880950"],"related_works":[],"abstract_inverted_index":{"Recently,":[0],"immersion":[1,38,73,78],"cooling":[2],"has":[3],"been":[4],"widely":[5],"adopted":[6],"in":[7,99],"hyperscale":[8],"data":[9,35,69,102],"centers.":[10],"Despite":[11],"the":[12,30,47,107,141,147],"rapid":[13],"adoption,":[14],"its":[15],"reliability":[16,32,94,115,157,167,189],"challenges":[17],"remain":[18],"insufficiently":[19],"addressed":[20],"due":[21],"to":[22,45,139,155,165,169,192],"a":[23,42,57,110,184],"lack":[24],"of":[25,34,68,113,150],"standardization.":[26],"This":[27,126],"study":[28,60,161],"identifies":[29,62],"potential":[31,65],"risks":[33,95],"center":[36,70,103],"under":[37,72],"cooling,":[39,137],"and":[40,52,63,89,123],"proposes":[41],"standardization":[43],"strategy":[44],"bridge":[46],"gap":[48,111],"between":[49],"current":[50,130,151,166],"protocols":[51],"immersion-specific":[53],"environments.":[54,194],"First,":[55],"utilizing":[56],"FMMEA,":[58],"this":[59,160,181],"systematically":[61],"prioritizes":[64],"failure":[66,80,144,176],"mechanisms":[67,81,177],"server":[71],"cooling.":[74],"The":[75],"results":[76],"highlight":[77],"specific":[79,163],"such":[82],"as":[83],"absorption,":[84],"environmental":[85],"stress":[86],"cracking,":[87],"corrosion,":[88],"oxidation":[90],"that":[91,129],"can":[92,153],"introduce":[93],"distinct":[96],"from":[97],"those":[98],"air":[100,136],"cooled":[101],"operation.":[104],"Based":[105],"on":[106],"FMMEA":[108],"results,":[109],"analysis":[112,127],"existing":[114],"standards":[116,152,168,190],"is":[117],"comprehensively":[118],"conducted":[119],"across":[120],"methodology,":[121],"domain,":[122],"practice":[124],"levels.":[125],"reveals":[128],"practice-level":[131],"standards,":[132],"predominantly":[133],"designed":[134],"for":[135,187],"fail":[138],"capture":[140],"identified":[142,172],"unique":[143],"mechanism.":[145],"Consequently,":[146],"direct":[148],"application":[149],"lead":[154],"inaccurate":[156],"assessments.":[158],"Finally,":[159],"suggests":[162],"modifications":[164],"address":[170],"these":[171],"gaps.":[173],"By":[174],"aligning":[175],"with":[178],"test":[179],"methods,":[180],"work":[182],"provides":[183],"strategic":[185],"direction":[186],"developing":[188],"tailored":[191],"immersion-cooled":[193]},"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2026-03-06T00:00:00"}