{"id":"https://openalex.org/W7131264196","doi":"https://doi.org/10.1109/access.2026.3667521","title":"An Unsupervised Learning Framework With Efficient Weld Seam Extraction for Weld Defect Detection in Radiographic Images","display_name":"An Unsupervised Learning Framework With Efficient Weld Seam Extraction for Weld Defect Detection in Radiographic Images","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7131264196","doi":"https://doi.org/10.1109/access.2026.3667521"},"language":"en","primary_location":{"id":"doi:10.1109/access.2026.3667521","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3667521","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3667521","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003773946","display_name":"Seungho H. Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I4921948","display_name":"Pusan National University","ror":"https://ror.org/01an57a31","country_code":"KR","type":"education","lineage":["https://openalex.org/I4921948"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung-Ho Lee","raw_affiliation_strings":["Department of Information Convergence Engineering, Pusan National University, Busan, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0002-8559-8920","affiliations":[{"raw_affiliation_string":"Department of Information Convergence Engineering, Pusan National University, Busan, Republic of Korea","institution_ids":["https://openalex.org/I4921948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126706279","display_name":"Doojin Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Doo-Jin Choi","raw_affiliation_strings":["Samsung Heavy Industries Company Ltd., Geoje, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Heavy Industries Company Ltd., Geoje, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126663198","display_name":"Hyungjin Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyung-Jin Kim","raw_affiliation_strings":["Samsung Heavy Industries Company Ltd., Geoje, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0008-6953-5704","affiliations":[{"raw_affiliation_string":"Samsung Heavy Industries Company Ltd., Geoje, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003116212","display_name":"Yonguk Kim","orcid":"https://orcid.org/0000-0003-3026-0893"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong-Uk Kim","raw_affiliation_strings":["Samsung Heavy Industries Company Ltd., Geoje, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Heavy Industries Company Ltd., Geoje, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126692654","display_name":"Jaemin Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae-Min Lee","raw_affiliation_strings":["Samsung Heavy Industries Company Ltd., Geoje, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0003-4437-8091","affiliations":[{"raw_affiliation_string":"Samsung Heavy Industries Company Ltd., Geoje, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126729418","display_name":"Dong-Hyun Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I4921948","display_name":"Pusan National University","ror":"https://ror.org/01an57a31","country_code":"KR","type":"education","lineage":["https://openalex.org/I4921948"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong-Hyun Kim","raw_affiliation_strings":["Department of Information Convergence Engineering, Pusan National University, Busan, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-1362-4846","affiliations":[{"raw_affiliation_string":"Department of Information Convergence Engineering, Pusan National University, Busan, Republic of Korea","institution_ids":["https://openalex.org/I4921948"]}]},{"author_position":"last","author":{"id":null,"display_name":"Jong-Deok Kim","orcid":"https://orcid.org/0000-0003-2914-7033"},"institutions":[{"id":"https://openalex.org/I4921948","display_name":"Pusan National University","ror":"https://ror.org/01an57a31","country_code":"KR","type":"education","lineage":["https://openalex.org/I4921948"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong-Deok Kim","raw_affiliation_strings":["Department of Information Convergence Engineering, Pusan National University, Busan, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0003-2914-7033","affiliations":[{"raw_affiliation_string":"Department of Information Convergence Engineering, Pusan National University, Busan, Republic of Korea","institution_ids":["https://openalex.org/I4921948"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16877313,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"32395","last_page":"32406"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.5777999758720398,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.5777999758720398,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.03999999910593033,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.03739999979734421,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/welding","display_name":"Welding","score":0.6811000108718872},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.5756000280380249},{"id":"https://openalex.org/keywords/unsupervised-learning","display_name":"Unsupervised learning","score":0.5289000272750854},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.5246999859809875},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.4936000108718872},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4869999885559082},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4262999892234802},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.41679999232292175}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7073000073432922},{"id":"https://openalex.org/C19474535","wikidata":"https://www.wikidata.org/wiki/Q131172","display_name":"Welding","level":2,"score":0.6811000108718872},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6611999869346619},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.5756000280380249},{"id":"https://openalex.org/C8038995","wikidata":"https://www.wikidata.org/wiki/Q1152135","display_name":"Unsupervised learning","level":2,"score":0.5289000272750854},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.5246999859809875},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.4936000108718872},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4869999885559082},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4846999943256378},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4262999892234802},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.41679999232292175},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4043999910354614},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.40130001306533813},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.38370001316070557},{"id":"https://openalex.org/C81669768","wikidata":"https://www.wikidata.org/wiki/Q2359161","display_name":"Precision and recall","level":2,"score":0.3458000123500824},{"id":"https://openalex.org/C36454342","wikidata":"https://www.wikidata.org/wiki/Q245341","display_name":"Radiography","level":2,"score":0.34060001373291016},{"id":"https://openalex.org/C194051981","wikidata":"https://www.wikidata.org/wiki/Q1337691","display_name":"Economic shortage","level":3,"score":0.2946000099182129},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.2847999930381775},{"id":"https://openalex.org/C2776143536","wikidata":"https://www.wikidata.org/wiki/Q7980866","display_name":"Weld pool","level":5,"score":0.2775000035762787},{"id":"https://openalex.org/C136389625","wikidata":"https://www.wikidata.org/wiki/Q334384","display_name":"Supervised learning","level":3,"score":0.2705000042915344},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.2671000063419342}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2026.3667521","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3667521","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a355b1c13bce4505be4dab6106b02668","is_oa":true,"landing_page_url":"https://doaj.org/article/a355b1c13bce4505be4dab6106b02668","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 14, Pp 32395-32406 (2026)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3667521","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3667521","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Life below water","score":0.4385424256324768,"id":"https://metadata.un.org/sdg/14"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Radiographic":[0],"testing":[1],"(RT)":[2],"using":[3,131],"X-rays":[4],"is":[5,22,33],"essential":[6,45],"for":[7,67,102],"ensuring":[8],"weld":[9,48,82,125,138,147],"integrity":[10],"in":[11,76],"shipbuilding.":[12],"However,":[13],"current":[14],"RT":[15,77,129],"inspection":[16,31],"relies":[17],"on":[18,144,161],"manual":[19],"evaluation,":[20],"which":[21],"subjective,":[23],"time-consuming,":[24],"and":[25,38,54,79,158],"costly.":[26],"Therefore,":[27],"automation":[28],"of":[29,81],"this":[30,68],"process":[32],"needed":[34],"to":[35,123],"improve":[36],"efficiency":[37],"reliability.":[39],"This":[40],"automated":[41],"approach":[42,66],"involves":[43],"two":[44],"stages,":[46],"extracting":[47],"seams":[49,126],"from":[50,73,127,150],"raw":[51],"radiographic":[52],"images":[53,78,130,148],"detecting":[55],"defects":[56,139],"within":[57],"them.":[58],"Deep":[59],"learning":[60,142],"has":[61],"emerged":[62],"as":[63],"a":[64,99,132,151],"promising":[65],"automation,":[69],"but":[70],"faces":[71],"challenges":[72],"data":[74,115],"heterogeneity":[75],"scarcity":[80],"defect":[83],"data.":[84,163],"Previous":[85],"studies":[86],"have":[87],"addressed":[88],"these":[89],"stages":[90,112],"separately":[91],"or":[92],"required":[93],"large":[94],"labeled":[95],"datasets,":[96],"thus":[97],"lacking":[98],"complete":[100],"pipeline":[101],"industrial":[103],"deployment.We":[104],"propose":[105],"an":[106],"end-to-end":[107],"framework":[108,118,166],"that":[109],"addresses":[110],"both":[111],"with":[113,177],"minimal":[114,178],"requirements.":[116],"The":[117],"first":[119],"employs":[120],"few-shot":[121],"segmentation":[122],"extract":[124],"heterogeneous":[128],"fewlabeled":[133],"examples.":[134],"Subsequently,":[135],"it":[136],"detects":[137],"through":[140],"unsupervised":[141],"trained":[143],"183":[145],"normal":[146],"collected":[149],"shipyard.":[152],"Experimental":[153],"results":[154],"show":[155],"94.5%":[156],"accuracy":[157],"95.7%":[159],"recall":[160],"shipyard":[162],"Additionally,":[164],"the":[165],"achieves":[167],"pixel-level":[168,172],"anomaly":[169],"localization":[170],"without":[171],"annotations,":[173],"enabling":[174],"field":[175],"deployment":[176],"labeling":[179],"burden.":[180]},"counts_by_year":[],"updated_date":"2026-03-05T07:30:30.508283","created_date":"2026-02-25T00:00:00"}