{"id":"https://openalex.org/W7131088310","doi":"https://doi.org/10.1109/access.2026.3667206","title":"Digital Twin Synthetic Dataset for Bearing Fault Diagnosis in Industrial Spindles","display_name":"Digital Twin Synthetic Dataset for Bearing Fault Diagnosis in Industrial Spindles","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7131088310","doi":"https://doi.org/10.1109/access.2026.3667206"},"language":null,"primary_location":{"id":"doi:10.1109/access.2026.3667206","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3667206","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3667206","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5106319639","display_name":"Mohsen Zeynivand","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Mohsen Zeynivand","raw_affiliation_strings":["Department of Electronics and Informatics, Politecnico di Milano, Milan, Italy"],"raw_orcid":"https://orcid.org/0009-0006-4582-6246","affiliations":[{"raw_affiliation_string":"Department of Electronics and Informatics, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115873002","display_name":"Azadeh Kermansaravi","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Azadeh Kermansaravi","raw_affiliation_strings":["Electrical Sustainable Energy, Delft University of Technology, Delft, The Netherlands"],"raw_orcid":"https://orcid.org/0009-0002-0708-7543","affiliations":[{"raw_affiliation_string":"Electrical Sustainable Energy, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037810713","display_name":"Hani Vahedi","orcid":"https://orcid.org/0000-0001-6309-2633"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Hani Vahedi","raw_affiliation_strings":["Electrical Sustainable Energy, Delft University of Technology, Delft, The Netherlands"],"raw_orcid":"https://orcid.org/0000-0001-6309-2633","affiliations":[{"raw_affiliation_string":"Electrical Sustainable Energy, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032756237","display_name":"Giambattista Gruosso","orcid":"https://orcid.org/0000-0001-6417-3750"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giambattista Gruosso","raw_affiliation_strings":["Department of Electronics and Informatics, Politecnico di Milano, Milan, Italy"],"raw_orcid":"https://orcid.org/0000-0001-6417-3750","affiliations":[{"raw_affiliation_string":"Department of Electronics and Informatics, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5106319639"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.37659138,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"29369","last_page":"29386"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.5303000211715698,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.5303000211715698,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.14000000059604645,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.10729999840259552,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.5770999789237976},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5110999941825867},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.49779999256134033},{"id":"https://openalex.org/keywords/bearing","display_name":"Bearing (navigation)","score":0.4339999854564667},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4032000005245209},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.390500009059906},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.3889000117778778},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.3547999858856201}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6786999702453613},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.5770999789237976},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5110999941825867},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.49779999256134033},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4449999928474426},{"id":"https://openalex.org/C199978012","wikidata":"https://www.wikidata.org/wiki/Q1273815","display_name":"Bearing (navigation)","level":2,"score":0.4339999854564667},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4032000005245209},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.390500009059906},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.3889000117778778},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3628000020980835},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.3547999858856201},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.3540000021457672},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.34139999747276306},{"id":"https://openalex.org/C51632099","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Training set","level":2,"score":0.3366999924182892},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33550000190734863},{"id":"https://openalex.org/C2776365744","wikidata":"https://www.wikidata.org/wiki/Q5438149","display_name":"Fault Simulator","level":5,"score":0.30880001187324524},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.30790001153945923},{"id":"https://openalex.org/C2781170535","wikidata":"https://www.wikidata.org/wiki/Q30587856","display_name":"Noisy data","level":2,"score":0.2831999957561493},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.2732999920845032},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.2728999853134155},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.2680000066757202},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.2515999972820282}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/access.2026.3667206","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3667206","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3667206","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3667206","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"This":[0,28],"paper":[1],"proposes":[2],"a":[3,10,17,66],"hybrid":[4],"digital":[5,13,125],"twin":[6,14,126],"framework":[7,29],"that":[8,103],"couples":[9],"real-time":[11],"physics-based":[12],"model":[15,83],"with":[16,94],"data-driven":[18,147],"diagnostic":[19],"layer":[20],"implemented":[21],"through":[22],"cloud-based":[23],"data":[24,91,100],"acquisition":[25],"and":[26,37,44,57,71,77,98,107,144],"analysis.":[27],"generates":[30],"synthetic":[31],"datasets":[32],"across":[33],"multiple":[34],"speed":[35],"levels":[36],"fault":[38,42,52,75,137,149],"severities":[39],"for":[40,73],"bearing":[41,148],"detection":[43,76],"classification":[45],"in":[46],"industrial":[47],"spindle":[48],"systems,":[49],"where":[50],"real":[51,136],"recordings":[53],"are":[54,92],"costly,":[55],"risky,":[56],"difficult":[58],"to":[59],"reproduce.":[60],"Once":[61],"the":[62,81,123,129,133,141],"system":[63],"is":[64,69],"validated,":[65],"two-stage":[67],"classifier":[68],"trained":[70],"used":[72],"online":[74],"fault-type":[78],"identification,":[79],"whereas":[80],"deep-sequence":[82],"provides":[84],"offline":[85],"verification.":[86],"To":[87],"improve":[88],"robustness,":[89],"training":[90],"enhanced":[93],"multi-domain":[95],"feature":[96],"enrichment":[97],"targeted":[99],"augmentation":[101],"techniques":[102],"simulate":[104],"measurement":[105],"noise":[106],"small":[108],"operating":[109,120],"variations.":[110],"The":[111],"resulting":[112],"models":[113],"achieved":[114],"strong":[115],"performance":[116],"under":[117],"previously":[118],"unseen":[119],"conditions":[121],"within":[122],"validated":[124],"envelope.":[127],"Overall,":[128],"proposed":[130],"approach":[131],"reduces":[132],"dependence":[134],"on":[135],"experiments":[138],"by":[139],"enabling":[140],"risk-reduced":[142],"development":[143],"evaluation":[145],"of":[146],"diagnosis.":[150]},"counts_by_year":[],"updated_date":"2026-02-28T06:14:18.631764","created_date":"2026-02-24T00:00:00"}