{"id":"https://openalex.org/W7131111936","doi":"https://doi.org/10.1109/access.2026.3667143","title":"Semi-Supervised and Disentangled Causal Discovery for Analyzing Fault Propagation in Microservices","display_name":"Semi-Supervised and Disentangled Causal Discovery for Analyzing Fault Propagation in Microservices","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7131111936","doi":"https://doi.org/10.1109/access.2026.3667143"},"language":null,"primary_location":{"id":"doi:10.1109/access.2026.3667143","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3667143","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3667143","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089421147","display_name":"Nobukazu Fukuda","orcid":"https://orcid.org/0009-0005-7846-1717"},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Nobukazu Fukuda","raw_affiliation_strings":["Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan"],"raw_orcid":"https://orcid.org/0009-0005-7846-1717","affiliations":[{"raw_affiliation_string":"Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079967575","display_name":"Haruhisa Nozue","orcid":"https://orcid.org/0000-0002-9653-8221"},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruhisa Nozue","raw_affiliation_strings":["Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-9653-8221","affiliations":[{"raw_affiliation_string":"Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109440484","display_name":"Haruo Oishi","orcid":null},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Oishi","raw_affiliation_strings":["Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126608149","display_name":"Chao Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Chao Wu","raw_affiliation_strings":["Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114067893","display_name":"Shingo Horiuchi","orcid":null},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shingo Horiuchi","raw_affiliation_strings":["Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050159451","display_name":"Kenichi Tayama","orcid":null},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenichi Tayama","raw_affiliation_strings":["Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Access Network Service Systems Laboratories, NTT, Inc., Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5089421147"],"corresponding_institution_ids":["https://openalex.org/I2251713219"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.33834409,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"30613","last_page":"30626"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9868000149726868,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9868000149726868,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.00139999995008111,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/troubleshooting","display_name":"Troubleshooting","score":0.9297999739646912},{"id":"https://openalex.org/keywords/interpretability","display_name":"Interpretability","score":0.8108999729156494},{"id":"https://openalex.org/keywords/microservices","display_name":"Microservices","score":0.5770000219345093},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5343999862670898},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5271000266075134},{"id":"https://openalex.org/keywords/root-cause-analysis","display_name":"Root cause analysis","score":0.3928000032901764},{"id":"https://openalex.org/keywords/orchestration","display_name":"Orchestration","score":0.3921000063419342},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.382999986410141}],"concepts":[{"id":"https://openalex.org/C147494362","wikidata":"https://www.wikidata.org/wiki/Q2078905","display_name":"Troubleshooting","level":2,"score":0.9297999739646912},{"id":"https://openalex.org/C2781067378","wikidata":"https://www.wikidata.org/wiki/Q17027399","display_name":"Interpretability","level":2,"score":0.8108999729156494},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7706000208854675},{"id":"https://openalex.org/C2778505942","wikidata":"https://www.wikidata.org/wiki/Q18344624","display_name":"Microservices","level":3,"score":0.5770000219345093},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5343999862670898},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5271000266075134},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5184999704360962},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.41920000314712524},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.39489999413490295},{"id":"https://openalex.org/C130963320","wikidata":"https://www.wikidata.org/wiki/Q1401207","display_name":"Root cause analysis","level":2,"score":0.3928000032901764},{"id":"https://openalex.org/C199168358","wikidata":"https://www.wikidata.org/wiki/Q3367000","display_name":"Orchestration","level":3,"score":0.3921000063419342},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.382999986410141},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3799000084400177},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.3499999940395355},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34529998898506165},{"id":"https://openalex.org/C15569618","wikidata":"https://www.wikidata.org/wiki/Q3561421","display_name":"Liveness","level":2,"score":0.33480000495910645},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.3271999955177307},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3043000102043152},{"id":"https://openalex.org/C108074857","wikidata":"https://www.wikidata.org/wiki/Q3067360","display_name":"Fault management","level":3,"score":0.3012999892234802},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2696000039577484},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.26919999718666077},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.263700008392334},{"id":"https://openalex.org/C207685749","wikidata":"https://www.wikidata.org/wiki/Q2088941","display_name":"Domain knowledge","level":2,"score":0.2583000063896179},{"id":"https://openalex.org/C27158222","wikidata":"https://www.wikidata.org/wiki/Q5532422","display_name":"Generalizability theory","level":2,"score":0.2540000081062317},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.25380000472068787},{"id":"https://openalex.org/C12725497","wikidata":"https://www.wikidata.org/wiki/Q810247","display_name":"Baseline (sea)","level":2,"score":0.25279998779296875},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.2524999976158142}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/access.2026.3667143","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3667143","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3667143","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3667143","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","score":0.6457560062408447,"display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"While":[0],"troubleshooting":[1,25],"fault":[2,29,37,47,52,84],"propagation":[3,85],"in":[4],"a":[5],"microservice-based":[6,116],"system":[7,117],"is":[8,13,124,130],"labor-intensive":[9],"for":[10,19],"operators,":[11],"it":[12],"critical":[14],"to":[15,81,103,132],"their":[16],"decision-making":[17],"process":[18],"maintaining":[20],"availability":[21],"and":[22,31,126],"reliability.":[23],"Efficient":[24],"can":[26],"significantly":[27],"accelerate":[28],"recovery":[30],"help":[32],"strengthen":[33],"preventive":[34],"measures.":[35],"Therefore,":[36],"analysis":[38],"techniques":[39],"demand":[40],"high":[41],"interpretability":[42],"of":[43,107,110],"not":[44],"only":[45],"the":[46,51,83,89,105,121,127],"location":[48],"but":[49],"also":[50,99],"propagation.":[53],"However,":[54],"existing":[55],"works":[56],"have":[57],"mainly":[58],"focused":[59],"on":[60,115],"developing":[61],"root":[62],"cause":[63],"analysis,":[64],"which":[65],"cannot":[66],"capture":[67,82],"such":[68],"structures":[69],"among":[70],"microservices.":[71],"In":[72],"this":[73],"paper,":[74],"we":[75],"propose":[76],"semi-supervised":[77,122],"causal":[78],"structure":[79,96],"learning":[80,102],"across":[86],"microservices":[87],"from":[88],"time":[90],"series":[91],"data":[92],"supported":[93],"by":[94],"continuous":[95],"learning.":[97],"We":[98],"introduce":[100],"disentanglement":[101],"enhance":[104],"generalizability":[106],"out-of-distribution":[108],"graphs":[109],"new":[111],"faults.":[112],"Extensive":[113],"experiments":[114],"datasets":[118],"demonstrate":[119],"that":[120],"approach":[123],"effective,":[125],"proposed":[128],"model":[129],"superior":[131],"baseline":[133],"methods.":[134]},"counts_by_year":[],"updated_date":"2026-03-03T06:13:14.889584","created_date":"2026-02-24T00:00:00"}