{"id":"https://openalex.org/W7129099172","doi":"https://doi.org/10.1109/access.2026.3665213","title":"Verification of Novel SAR Measurement System Utilizing Multi-Probe Planar Approach Inversion Algorithm","display_name":"Verification of Novel SAR Measurement System Utilizing Multi-Probe Planar Approach Inversion Algorithm","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7129099172","doi":"https://doi.org/10.1109/access.2026.3665213"},"language":"en","primary_location":{"id":"doi:10.1109/access.2026.3665213","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3665213","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3665213","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5126126005","display_name":"Ying Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I106645853","display_name":"Changchun University of Science and Technology","ror":"https://ror.org/007mntk44","country_code":"CN","type":"education","lineage":["https://openalex.org/I106645853"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Chen","raw_affiliation_strings":["School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, Jilin, China"],"raw_orcid":"https://orcid.org/0009-0003-1328-1438","affiliations":[{"raw_affiliation_string":"School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, Jilin, China","institution_ids":["https://openalex.org/I106645853"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040554452","display_name":"Lijuan Li","orcid":"https://orcid.org/0000-0003-4965-1931"},"institutions":[{"id":"https://openalex.org/I106645853","display_name":"Changchun University of Science and Technology","ror":"https://ror.org/007mntk44","country_code":"CN","type":"education","lineage":["https://openalex.org/I106645853"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijuan Li","raw_affiliation_strings":["School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, Jilin, China"],"raw_orcid":"https://orcid.org/0000-0003-4965-1931","affiliations":[{"raw_affiliation_string":"School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, Jilin, China","institution_ids":["https://openalex.org/I106645853"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056150940","display_name":"Junwei Dong","orcid":null},"institutions":[{"id":"https://openalex.org/I106645853","display_name":"Changchun University of Science and Technology","ror":"https://ror.org/007mntk44","country_code":"CN","type":"education","lineage":["https://openalex.org/I106645853"]},{"id":"https://openalex.org/I4210127074","display_name":"Zhongshan Hospital","ror":"https://ror.org/032x22645","country_code":"CN","type":"healthcare","lineage":["https://openalex.org/I4210127074"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junwei Dong","raw_affiliation_strings":["Xiangshan Laboratory, Zhongshan Institute of Changchun University of Science and Technology, Zhongshan, Guangdong, China"],"raw_orcid":"https://orcid.org/0009-0007-7328-1754","affiliations":[{"raw_affiliation_string":"Xiangshan Laboratory, Zhongshan Institute of Changchun University of Science and Technology, Zhongshan, Guangdong, China","institution_ids":["https://openalex.org/I4210127074","https://openalex.org/I106645853"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070695672","display_name":"Ravi Kumar Arya","orcid":"https://orcid.org/0000-0003-0724-8060"},"institutions":[{"id":"https://openalex.org/I106645853","display_name":"Changchun University of Science and Technology","ror":"https://ror.org/007mntk44","country_code":"CN","type":"education","lineage":["https://openalex.org/I106645853"]},{"id":"https://openalex.org/I4210127074","display_name":"Zhongshan Hospital","ror":"https://ror.org/032x22645","country_code":"CN","type":"healthcare","lineage":["https://openalex.org/I4210127074"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ravi Kumar Arya","raw_affiliation_strings":["Xiangshan Laboratory, Zhongshan Institute of Changchun University of Science and Technology, Zhongshan, Guangdong, China"],"raw_orcid":"https://orcid.org/0000-0003-0724-8060","affiliations":[{"raw_affiliation_string":"Xiangshan Laboratory, Zhongshan Institute of Changchun University of Science and Technology, Zhongshan, Guangdong, China","institution_ids":["https://openalex.org/I4210127074","https://openalex.org/I106645853"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5093614654","display_name":"Huang Huixiong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137956","display_name":"Guangdong Testing Institute for Product Quality Supervision","ror":"https://ror.org/03wdfwr71","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210137956"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huang Huixiong","raw_affiliation_strings":["Guangdong Telecommunications Terminal Products Quality Supervision and Testing Center, Heyuan, Guangdong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guangdong Telecommunications Terminal Products Quality Supervision and Testing Center, Heyuan, Guangdong, China","institution_ids":["https://openalex.org/I4210137956"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.19263581,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"33432","last_page":"33445"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.6761000156402588,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.6761000156402588,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.11739999800920486,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10874","display_name":"Electromagnetic Fields and Biological Effects","score":0.0364999994635582,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inversion","display_name":"Inversion (geology)","score":0.576200008392334},{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.5702000260353088},{"id":"https://openalex.org/keywords/a-priori-and-a-posteriori","display_name":"A priori and a posteriori","score":0.5458999872207642},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.5202000141143799},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.48910000920295715},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.4510999917984009},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.415800005197525},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.3716999888420105}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7544000148773193},{"id":"https://openalex.org/C1893757","wikidata":"https://www.wikidata.org/wiki/Q3653001","display_name":"Inversion (geology)","level":3,"score":0.576200008392334},{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.5702000260353088},{"id":"https://openalex.org/C75553542","wikidata":"https://www.wikidata.org/wiki/Q178161","display_name":"A priori and a posteriori","level":2,"score":0.5458999872207642},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.5202000141143799},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5141000151634216},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.48910000920295715},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.4510999917984009},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.415800005197525},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3889000117778778},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.3716999888420105},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3693000078201294},{"id":"https://openalex.org/C84237751","wikidata":"https://www.wikidata.org/wiki/Q914138","display_name":"Specific absorption rate","level":3,"score":0.3336000144481659},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.319599986076355},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.3066999912261963},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.30300000309944153},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.296099990606308},{"id":"https://openalex.org/C187191949","wikidata":"https://www.wikidata.org/wiki/Q1138496","display_name":"Profiling (computer programming)","level":2,"score":0.26739999651908875},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.25870001316070557},{"id":"https://openalex.org/C106516650","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm design","level":2,"score":0.25760000944137573}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2026.3665213","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3665213","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:aff3101f57454a539b63573d6c23d81f","is_oa":true,"landing_page_url":"https://doaj.org/article/aff3101f57454a539b63573d6c23d81f","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 14, Pp 33432-33445 (2026)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3665213","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3665213","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1968175153","https://openalex.org/W2057367132","https://openalex.org/W2064104529","https://openalex.org/W2115414375","https://openalex.org/W2160994178","https://openalex.org/W2410085172","https://openalex.org/W2803570899","https://openalex.org/W2809955258","https://openalex.org/W2965672394","https://openalex.org/W2989070760","https://openalex.org/W3014184393","https://openalex.org/W3138338713","https://openalex.org/W4205556338","https://openalex.org/W4224436763","https://openalex.org/W4243256759","https://openalex.org/W4251415381","https://openalex.org/W4251622770","https://openalex.org/W4387314784","https://openalex.org/W4388100911","https://openalex.org/W4389352557","https://openalex.org/W4393033011","https://openalex.org/W4393036176","https://openalex.org/W4394939118","https://openalex.org/W4395471024","https://openalex.org/W4405811789","https://openalex.org/W4407899879","https://openalex.org/W4410536823","https://openalex.org/W4412030372"],"related_works":[],"abstract_inverted_index":{"The":[0,65],"certification":[1],"of":[2,67,75,112],"wireless":[3,168],"devices":[4],"necessitates":[5],"rapid":[6],"and":[7,38,73,96,143,150,166],"precise":[8],"Specific":[9],"Absorption":[10],"Rate":[11],"(SAR)":[12],"assessment,":[13],"a":[14,44,52,76,83,109,148],"critical":[15,139],"yet":[16],"challenging":[17],"requirement":[18],"in":[19],"modern":[20],"electromagnetic":[21],"compatibility":[22],"(EMC)":[23],"testing.":[24],"Conventional":[25],"systems,":[26],"dependent":[27],"on":[28],"sequential":[29],"mechanical":[30],"scanning,":[31],"are":[32],"fundamentally":[33],"limited":[34],"by":[35],"low":[36],"throughput":[37],"inherent":[39],"probe-induced":[40,89],"field":[41,79],"distortions,":[42],"creating":[43],"bottleneck":[45],"for":[46,163],"large-scale":[47],"certification.":[48],"This":[49,91],"paper":[50],"presents":[51],"novel":[53,84],"multi-probe":[54],"planar":[55],"inversion":[56,80],"system":[57,85,125],"(0.6\u20136":[58],"GHz)":[59],"designed":[60],"to":[61,87,99,132,157],"overcome":[62],"these":[63],"limitations.":[64],"core":[66],"this":[68,145],"work":[69,146],"is":[70,154],"the":[71,117,124,138,159],"development":[72],"integration":[74],"dedicated":[77],"3D":[78],"algorithm":[81,92],"within":[82],"framework":[86,152],"correct":[88,100],"errors.":[90],"uniquely":[93],"integrates":[94],"experimental":[95],"simulated":[97],"data":[98],"systematic":[101],"probe":[102],"errors,":[103],"enabling":[104],"high-fidelity":[105],"SAR":[106],"reconstruction":[107],"with":[108],"maximum":[110],"deviation":[111],"less":[113],"than":[114],"3%":[115],"from":[116,129],"reference":[118],"standard.":[119],"Experimental":[120],"validation":[121],"demonstrates":[122],"that":[123,153],"reduces":[126],"measurement":[127],"time":[128],"several":[130],"hours":[131],"just":[133],"minutes.":[134],"By":[135],"simultaneously":[136],"resolving":[137],"trade-off":[140],"between":[141],"speed":[142],"accuracy,":[144],"provides":[147],"robust":[149],"efficient":[151],"directly":[155],"applicable":[156],"accelerating":[158],"EMC":[160],"compliance":[161],"pipeline":[162],"5G,":[164],"IoT,":[165],"next-generation":[167],"technologies.":[169]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2026-02-17T00:00:00"}