{"id":"https://openalex.org/W7128442783","doi":"https://doi.org/10.1109/access.2026.3662623","title":"Efficient Dual Modular Redundancy Units of Convolutional Neural Networks Based on Quantization","display_name":"Efficient Dual Modular Redundancy Units of Convolutional Neural Networks Based on Quantization","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7128442783","doi":"https://doi.org/10.1109/access.2026.3662623"},"language":null,"primary_location":{"id":"doi:10.1109/access.2026.3662623","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3662623","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3662623","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5115762717","display_name":"Yamato Saikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I141591182","display_name":"University of Aizu","ror":"https://ror.org/02pg0e883","country_code":"JP","type":"education","lineage":["https://openalex.org/I141591182"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yamato Saikawa","raw_affiliation_strings":["Graduate School of Computer Science and Engineering, The University of Aizu, Aizuwakamatsu, Fukushima, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Computer Science and Engineering, The University of Aizu, Aizuwakamatsu, Fukushima, Japan","institution_ids":["https://openalex.org/I141591182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5125469436","display_name":"Yoichi Tomioka","orcid":null},"institutions":[{"id":"https://openalex.org/I141591182","display_name":"University of Aizu","ror":"https://ror.org/02pg0e883","country_code":"JP","type":"education","lineage":["https://openalex.org/I141591182"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoichi Tomioka","raw_affiliation_strings":["School of Computer Science and Engineering, The University of Aizu, Aizuwakamatsu, Fukushima, Japan"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, The University of Aizu, Aizuwakamatsu, Fukushima, Japan","institution_ids":["https://openalex.org/I141591182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5125470575","display_name":"Hiroshi Saito","orcid":null},"institutions":[{"id":"https://openalex.org/I141591182","display_name":"University of Aizu","ror":"https://ror.org/02pg0e883","country_code":"JP","type":"education","lineage":["https://openalex.org/I141591182"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Saito","raw_affiliation_strings":["School of Computer Science and Engineering, The University of Aizu, Aizuwakamatsu, Fukushima, Japan"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, The University of Aizu, Aizuwakamatsu, Fukushima, Japan","institution_ids":["https://openalex.org/I141591182"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020327745","display_name":"Yukihide Kohira","orcid":"https://orcid.org/0000-0002-4063-2497"},"institutions":[{"id":"https://openalex.org/I141591182","display_name":"University of Aizu","ror":"https://ror.org/02pg0e883","country_code":"JP","type":"education","lineage":["https://openalex.org/I141591182"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukihide Kohira","raw_affiliation_strings":["School of Computer Science and Engineering, The University of Aizu, Aizuwakamatsu, Fukushima, Japan"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, The University of Aizu, Aizuwakamatsu, Fukushima, Japan","institution_ids":["https://openalex.org/I141591182"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5115762717"],"corresponding_institution_ids":["https://openalex.org/I141591182"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.31821632,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"24447","last_page":"24459"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.7529000043869019,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.7529000043869019,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.049800001084804535,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12131","display_name":"Wireless Signal Modulation Classification","score":0.035100001841783524,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6952000260353088},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.6796000003814697},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.5773000121116638},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.5763000249862671},{"id":"https://openalex.org/keywords/quantization","display_name":"Quantization (signal processing)","score":0.5612000226974487},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.47780001163482666},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4578000009059906},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.4002000093460083},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.39730000495910645}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7139000296592712},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6952000260353088},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.6796000003814697},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.5773000121116638},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.5763000249862671},{"id":"https://openalex.org/C28855332","wikidata":"https://www.wikidata.org/wiki/Q198099","display_name":"Quantization (signal processing)","level":2,"score":0.5612000226974487},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.47780001163482666},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4754999876022339},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4578000009059906},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.4002000093460083},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.39730000495910645},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.38999998569488525},{"id":"https://openalex.org/C138236772","wikidata":"https://www.wikidata.org/wiki/Q25098575","display_name":"Edge device","level":3,"score":0.38119998574256897},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.373199999332428},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.35429999232292175},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.34769999980926514},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.34049999713897705},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.32409998774528503},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.310699999332428},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.3077000081539154},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.30469998717308044},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2939000129699707},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.28870001435279846},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2818000018596649},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.27619999647140503},{"id":"https://openalex.org/C114237110","wikidata":"https://www.wikidata.org/wiki/Q114901","display_name":"Gate array","level":3,"score":0.2624000012874603},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.25360000133514404},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.2524999976158142}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/access.2026.3662623","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3662623","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3662623","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3662623","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1814947882","display_name":null,"funder_award_id":"JPMJPR22C7","funder_id":"https://openalex.org/F4320334789","funder_display_name":"Japan Science and Technology Agency"}],"funders":[{"id":"https://openalex.org/F4320334789","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2170333286","https://openalex.org/W2194775991","https://openalex.org/W2606722458","https://openalex.org/W2964108906","https://openalex.org/W2982135357","https://openalex.org/W2990650295","https://openalex.org/W3036878841","https://openalex.org/W3036979375","https://openalex.org/W3121542217","https://openalex.org/W3138516171","https://openalex.org/W3173541532","https://openalex.org/W3190062760","https://openalex.org/W4200370950","https://openalex.org/W4213038514","https://openalex.org/W4381612599","https://openalex.org/W4406047640"],"related_works":[],"abstract_inverted_index":{"Edge":[0],"devices":[1,22],"powered":[2],"by":[3,50,111,118,165],"convolutional":[4],"neural":[5],"networks":[6],"(CNNs)":[7],"are":[8,178,194],"being":[9],"rapidly":[10],"developed":[11],"and":[12,18,67,86,104,131,160,190,211,227],"utilized":[13],"in":[14,26,143],"image":[15],"recognition,":[16],"classification,":[17],"generation.":[19],"As":[20],"these":[21],"become":[23],"more":[24],"widespread":[25],"mission-critical":[27],"systems,":[28],"fault":[29,146,239],"tolerance":[30],"is":[31,41,141,158,163],"critical":[32],"to":[33,197],"ensure":[34],"reliable":[35],"behavior.":[36],"Dual":[37],"Modular":[38],"Redundancy":[39],"(DMR)":[40],"a":[42,105,182],"commonly":[43],"used":[44],"system":[45],"that":[46,204],"compares":[47],"two":[48],"outputs":[49,127],"arraying":[51],"the":[52,56,64,72,90,120,126,129,136,138,161,166,169,175,205,233],"same":[53],"modules.":[54,134],"Although":[55],"DMR":[57,73,97,140,207,235],"offers":[58],"high":[59,238],"reliability,":[60],"it":[61],"doubles":[62],"both":[63],"circuit":[65],"area":[66],"power":[68,191,229],"consumption.":[69],"This":[70,114],"makes":[71],"unsuited":[74],"for":[75],"resource-constrained":[76],"edge":[77],"devices,":[78],"where":[79],"CNNs":[80],"already":[81],"consume":[82],"significant":[83],"hardware":[84],"resources":[85],"energy.":[87],"To":[88],"address":[89],"problem,":[91],"this":[92],"paper":[93],"proposes":[94],"an":[95,100],"approximated":[96,139,206],"composed":[98],"of":[99,128,145,174,199,209],"original":[101,130],"CNN":[102,108],"module":[103,109],"low-bit":[106,132],"quantized":[107,133,213],"generated":[110],"linear":[112],"quantization.":[113],"method":[115],"detects":[116],"faults":[117],"calculating":[119],"mean":[121],"absolute":[122],"difference":[123],"(MAD)":[124],"between":[125],"In":[135],"experiments,":[137],"evaluated":[142,195],"terms":[144],"detection":[147,240],"accuracy":[148,162],"using":[149],"software":[150],"simulation.":[151],"An":[152],"8-bit":[153,210],"ResNet-20":[154],"trained":[155],"with":[156,232],"CIFAR-10":[157],"used,":[159],"measured":[164],"Area":[167],"Under":[168],"Curve":[170],"(AUC).":[171],"The":[172],"circuits":[173],"proposed":[176],"methods":[177],"also":[179],"implemented":[180],"on":[181],"Field":[183],"Programmable":[184],"Gate":[185],"Array":[186],"(FPGA).":[187],"Their":[188],"resource":[189],"reduction":[192,230],"rates":[193],"compared":[196,231],"those":[198],"conventional":[200,234],"DMR.":[201],"We":[202],"demonstrate":[203],"consisting":[208],"3-bit":[212],"modules":[214],"achieves":[215],"35%":[216],"Look-Up":[217],"Tables":[218],"(LUTs)":[219],"reduction,":[220,223,226],"24%":[221],"flip-flop":[222],"30%":[224],"BRAM":[225],"33%":[228],"while":[236],"achieving":[237],"performance.":[241]},"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2026-02-10T00:00:00"}