{"id":"https://openalex.org/W7124895488","doi":"https://doi.org/10.1109/access.2026.3655701","title":"Development of a Realistic Model to Accurately Predict the \u201cMirrored S-Curve\u201d Nature of LED Luminaire Lumen Maintenance for Any Operating Conditions","display_name":"Development of a Realistic Model to Accurately Predict the \u201cMirrored S-Curve\u201d Nature of LED Luminaire Lumen Maintenance for Any Operating Conditions","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7124895488","doi":"https://doi.org/10.1109/access.2026.3655701"},"language":null,"primary_location":{"id":"doi:10.1109/access.2026.3655701","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3655701","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2026.3655701","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035661789","display_name":"Savitha G. Kini","orcid":"https://orcid.org/0000-0002-8427-7669"},"institutions":[{"id":"https://openalex.org/I81433678","display_name":"Sikkim Manipal University","ror":"https://ror.org/010gckf65","country_code":"IN","type":"education","lineage":["https://openalex.org/I81433678"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Savitha G. Kini","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Sikkim Manipal Institute of Technology, Sikkim Manipal University, Sikkim, India"],"raw_orcid":"https://orcid.org/0000-0002-8427-7669","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Sikkim Manipal Institute of Technology, Sikkim Manipal University, Sikkim, India","institution_ids":["https://openalex.org/I81433678"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5123381790","display_name":"J Lokesh","orcid":null},"institutions":[{"id":"https://openalex.org/I164861460","display_name":"Manipal Academy of Higher Education","ror":"https://ror.org/02xzytt36","country_code":"IN","type":"education","lineage":["https://openalex.org/I164861460"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"J. Lokesh","raw_affiliation_strings":["Manipal Institute of Technology, Manipal Academy of Higher Education, Manipal, India"],"raw_orcid":"https://orcid.org/0000-0002-2346-0195","affiliations":[{"raw_affiliation_string":"Manipal Institute of Technology, Manipal Academy of Higher Education, Manipal, India","institution_ids":["https://openalex.org/I164861460"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061534329","display_name":"Anjan N. Padmasali","orcid":null},"institutions":[{"id":"https://openalex.org/I164861460","display_name":"Manipal Academy of Higher Education","ror":"https://ror.org/02xzytt36","country_code":"IN","type":"education","lineage":["https://openalex.org/I164861460"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anjan N. Padmasali","raw_affiliation_strings":["Manipal Institute of Technology, Manipal Academy of Higher Education, Manipal, India"],"raw_orcid":"https://orcid.org/0000-0003-0117-841X","affiliations":[{"raw_affiliation_string":"Manipal Institute of Technology, Manipal Academy of Higher Education, Manipal, India","institution_ids":["https://openalex.org/I164861460"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5035661789"],"corresponding_institution_ids":["https://openalex.org/I81433678"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16011505,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"10860","last_page":"10870"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.1907999962568283,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.1907999962568283,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12897","display_name":"Structural Analysis of Composite Materials","score":0.18719999492168427,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.052799999713897705,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7829999923706055},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6234999895095825},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.5044999718666077},{"id":"https://openalex.org/keywords/exponential-function","display_name":"Exponential function","score":0.45820000767707825},{"id":"https://openalex.org/keywords/lumen","display_name":"Lumen (anatomy)","score":0.451200008392334},{"id":"https://openalex.org/keywords/gompertz-function","display_name":"Gompertz function","score":0.38679999113082886},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.36500000953674316},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.3555999994277954}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7829999923706055},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6625000238418579},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6234999895095825},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5835999846458435},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.5044999718666077},{"id":"https://openalex.org/C151376022","wikidata":"https://www.wikidata.org/wiki/Q168698","display_name":"Exponential function","level":2,"score":0.45820000767707825},{"id":"https://openalex.org/C131631996","wikidata":"https://www.wikidata.org/wiki/Q1141325","display_name":"Lumen (anatomy)","level":2,"score":0.451200008392334},{"id":"https://openalex.org/C134463574","wikidata":"https://www.wikidata.org/wiki/Q1011785","display_name":"Gompertz function","level":2,"score":0.38679999113082886},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.36500000953674316},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.3555999994277954},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.34940001368522644},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.3407000005245209},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.32829999923706055},{"id":"https://openalex.org/C45804977","wikidata":"https://www.wikidata.org/wiki/Q7239673","display_name":"Predictive modelling","level":2,"score":0.32510000467300415},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.30390000343322754},{"id":"https://openalex.org/C2781345722","wikidata":"https://www.wikidata.org/wiki/Q5308388","display_name":"Drop (telecommunication)","level":2,"score":0.287200003862381},{"id":"https://openalex.org/C108882727","wikidata":"https://www.wikidata.org/wiki/Q2991685","display_name":"Solid modeling","level":2,"score":0.28029999136924744},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.27480000257492065},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.26809999346733093},{"id":"https://openalex.org/C75235859","wikidata":"https://www.wikidata.org/wiki/Q582659","display_name":"Exponential growth","level":2,"score":0.26170000433921814},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2581999897956848},{"id":"https://openalex.org/C70452415","wikidata":"https://www.wikidata.org/wiki/Q3182448","display_name":"Predictive maintenance","level":2,"score":0.2581000030040741},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.2565999925136566},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.25279998779296875},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.25060001015663147}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/access.2026.3655701","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3655701","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/access.2026.3655701","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2026.3655701","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5193658471107483,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1598156656","https://openalex.org/W1920073829","https://openalex.org/W2242945176","https://openalex.org/W2296321240","https://openalex.org/W2301902474","https://openalex.org/W2473178793","https://openalex.org/W2564202326","https://openalex.org/W2594580367","https://openalex.org/W2607869084","https://openalex.org/W2626964509","https://openalex.org/W2734564503","https://openalex.org/W2894782227","https://openalex.org/W2945515448","https://openalex.org/W2965478631","https://openalex.org/W2990951000","https://openalex.org/W3180628084","https://openalex.org/W3203577349","https://openalex.org/W4205238901","https://openalex.org/W4206384996","https://openalex.org/W4310013150","https://openalex.org/W4312626434","https://openalex.org/W4399939316","https://openalex.org/W4402988063","https://openalex.org/W4405613828","https://openalex.org/W4412718781"],"related_works":[],"abstract_inverted_index":{"In":[0],"the":[1,8,40,52,71,110,129,144,177],"current":[2],"era,":[3],"LED":[4,57,82,104,195],"lighting":[5],"technology":[6],"is":[7,143],"most":[9],"widely":[10],"used":[11,107],"illumination":[12],"source":[13],"in":[14,77],"all":[15],"applications":[16],"worldwide.":[17],"Accurately":[18],"predicting":[19,194],"lumen":[20,53,132,168],"degradation":[21,46,54,79,96,123,161],"and":[22,32,190,204],"lifetime":[23],"performance":[24,170],"has":[25],"become":[26],"critical":[27],"for":[28,179,193],"ensuring":[29],"long-term":[30,78],"reliability":[31],"cost-effectiveness.":[33],"Traditional":[34],"models":[35,51,87],"often":[36],"fail":[37,88],"to":[38,89,108,201],"capture":[39],"complex,":[41],"non-linear":[42],"nature":[43],"of":[44,56,81,140,146,167],"real-world":[45],"behavior.":[47],"The":[48,66,112,183],"work":[49,142],"systematically":[50],"behavior":[55,75],"luminaires":[58,105],"using":[59,157],"a":[60,120,147,187],"four-parameter":[61],"double":[62],"exponential":[63,86],"Gompertz":[64],"function.":[65],"proposed":[67,152,184],"model":[68,153],"effectively":[69],"captures":[70],"asymmetric,":[72],"mirrored":[73],"S-curve":[74],"observed":[76,130],"profiles":[80],"luminaires,":[83],"which":[84],"traditional":[85],"represent":[90],"accurately.":[91],"Experimental":[92],"data":[93],"from":[94],"accelerated":[95,160],"tests":[97],"conducted":[98],"on":[99],"three":[100,159],"different":[101],"commercial":[102],"16W":[103],"were":[106],"develop":[109],"model.":[111],"SEM-EDS":[113],"analysis":[114],"identified":[115],"silver":[116],"mirror":[117],"tarnishing":[118],"as":[119],"dominant":[121],"physical":[122,181],"mechanism,":[124],"providing":[125],"material-level":[126],"insight":[127],"into":[128],"steep":[131],"drop":[133],"during":[134],"mid-life":[135],"operation.":[136],"A":[137],"key":[138],"contribution":[139],"this":[141],"development":[145],"predictive":[148],"framework":[149],"that":[150],"correlates":[151],"coefficients":[154],"with":[155],"temperature":[156],"only":[158],"tests.":[162],"This":[163],"enables":[164],"accurate":[165],"estimation":[166],"maintenance":[169],"at":[171],"untested":[172],"operating":[173],"conditions,":[174],"significantly":[175],"reducing":[176],"need":[178],"exhaustive":[180],"testing.":[182],"methodology":[185],"provides":[186],"practical,":[188],"scalable,":[189],"cost-effective":[191],"solution":[192],"lifetime,":[196],"making":[197],"it":[198],"highly":[199],"applicable":[200],"both":[202],"research":[203],"industry.":[205]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2026-01-21T00:00:00"}